Integrated circuit system having different-size solder bumps and different-size bonding pads
View Patent ↗An integrated circuit solder bumping system provides a substrate and forms a redistribution layer on the substrate. An insulation layer is formed on the redistribution layer. The insulation layer has a plurality of openings therethrough. A first UBM layer of titanium is deposited on the insulation layer and in the openings therethrough. A second UBM layer of chromium/copper alloy is deposited on the first UBM layer. A third UBM layer of copper is deposited on the second UBM layer. UBM pads of at least two different sizes are formed from the UBM layers. Solder paste is printed over at least some of the UBM pads. The solder paste is reflowed to form at least smaller solder bumps on at least some of the UBM pads. Bigger solder bumps are formed on at least some of the UBM pads.
1. An integrated circuit solder bumping system, comprising:
a redistribution substrate;
a first redistribution layer on the redistribution substrate;
a first insulation layer on the first redistribution layer;
a second redistribution layer on the first insulation layer;
a second insulation layer on the second redistribution layer, the second insulation layer having a plurality of openings of at least two different sizes therethrough;
a first UBM layer of titanium on at least portions of the second insulation layer and in the openings therethrough;
a second UBM layer of chromium/copper alloy on the first UBM layer;
a third UBM layer of copper on the second UBM layer;
UBM pads formed over the openings and being formed from the UBM layers, the UBM pads being formed of at least two different sizes according to the sizes of the openings;
smaller solder bumps on at least some of the UBM pads; and
bigger solder bumps on at least some of the UBM pads, the bigger solder bumps having at least 100 μm of bump height difference greater than the smaller solder bumps.
2. The system of claim 1 wherein;
the redistribution layers further comprise redistribution layers of aluminum, aluminum alloy, copper, an alloy thereof, a compound thereof, or a combination thereof; and
the insulation layers further comprise insulation layers of polyimide, benzocyclobutene, or polybenzoxazole, a compound thereof, or a combination thereof.
3. The system of claim 1 wherein;
the redistribution layers further comprise redistribution layers having a thickness in the range from 1 μm to 9 μm; and
the insulation layers further comprise insulation layers having a thickness in the range from 4 μm to 12 μm.
4. The system of claim 1 wherein;
the first UBM layer further comprises a layer having a thickness in the range from 500 Å to 1500 Å, and preferably 800 Å;
the second UBM layer further comprises a chromium/copper alloy layer of 40-60% chromium to copper, and preferably 50% chromium, and having a thickness in the range from 2500 Å to 5000 Å, and preferably 3500 Å; and
the third UBM layer further comprises a layer having a thickness in the range from 5000 Å to 2 μm, and preferably 8000 Å.