Integrated circuit package with open substrate
View Patent ↗A method of manufacturing an integrated circuit package includes: forming a substrate that includes: forming a core layer, forming vias in the core layer, and forming a conductive layer having a predetermined thickness on the core layer and having substantially twice the predetermined thickness in the vias; and forming connections between an integrated circuit die and the conductive layer.
1. A method of manufacturing an integrated circuit package comprising:
forming a substrate including:
forming a core layer, and
forming vias in the core layer;
forming a conductive layer having a predetermined thickness on the core layer and having substantially twice the predetermined thickness in the vias;
forming connections between an integrated circuit die and the conductive layer; and
forming a solder mask over the core layer having openings therein to the conductive layer.
2. The method as claimed in claim 1 wherein:
forming the solder mask includes forming the solder mask to extend into the vias.
3. The method as claimed in claim 1 further comprising:
forming terminals on the conductive layer of the predetermined thickness in the vias, the terminals having a shape of at least one of square, rectangular, and round; and
forming a further solder mask over the core layer having openings therein to the terminals.
4. The method as claimed in claim 1 further comprising:
forming terminals on the conductive layer of the predetermined thickness in the vias;
forming a further solder mask over the core layer having openings therein to the terminals; and
forming solder balls connected to the terminals through the further solder mask.
5. The method as claimed in claim 1 further comprising:
forming solder balls through the solder mask on the conductive layer on the core layer; and
forming the substrate includes forming an opening through the substrate.
6. An integrated circuit package comprising:
a substrate including a core layer having vias provided therein;
a conductive layer having a predetermined thickness on the core layer and having substantially twice the predetermined thickness in the vias;
an integrated circuit over the substrate;
connections between the integrated circuit die and the conductive layer; and
a solder mask formed over the core layer having openings therein to the conductive layer.
7. The package as claimed in claim 6 further comprising:
an encapsulant encapsulating the integrated circuit die with the encapsulant extending into the vias.
8. The package as claimed in claim 6 further comprising:
terminals on the conductive layer of the predetermined thickness in the vias, the terminals having a shape of at least one of square, rectangular, and round.
9. The package as claimed in claim 6 further comprising:
terminals on the conductive layer of the predetermined thickness in the vias; and
solder balls connected to the terminals.
10. The package as claimed in claim 6 further comprising:
solder balls on the conductive layer on the core layer.
11. The package as claimed in claim 6 wherein:
the solder mask extends into the vias.
12. The package as claimed in claim 6 further comprising:
terminals on the conductive layer of the predetermined thickness in the vias, the terminals having a shape of at least one of square, rectangular, and round; and
a further solder mask over the core layer having openings therein to the terminals.
13. The package as claimed in claim 6 further comprising:
terminals on the conductive layer of the predetermined thickness in the vias;
a further solder mask over the core layer having openings therein to the terminals; and
solder balls connected to the terminals through the further solder mask.
14. The package as claimed in claim 6 further comprising:
solder balls through the solder mask on the conductive layer on the core layer; and
the substrate having an opening therethrough.