Granted Patent B2

US 8,410,806 · App. 12/592,186 · Granted Apr 2, 2013

Abstract

Claims (25)

1. A coupon for a probing apparatus including a dielectric support having a support surface including surface portions exposing a support conductor, said coupon comprising:

(a) a first coupon surface detachably adhered to said support surface;

(b) a second coupon surface elastically separated from said first coupon surface;

(c) a contact including a contact tip arranged to engage a device surface, said device surface located nearer said second coupon surface than said first coupon surface; and

(d) a post having a first end substantially flush with said second coupon surface and a second end substantially flush with said first coupon surface.

2. The coupon of claim 1 wherein said contact further comprises a rigid, elongate contact beam affixed to said second coupon surface, said contact tip affixed to said contact beam nearer a first end of said contact beam than a second end of said contact beam.

3. The coupon of claim 2 wherein said contact further comprises said post, wherein said post is affixed to said contact beam nearer said second end of said contact beam than said first end of said contact beam, said post having an end portion arranged to contact said support conductor at a location nearer said first coupon surface than said second coupon surface.

4. The coupon of claim 1 wherein said coupon is detachably adhered to said support surface by an adhesive.

5. A probing apparatus comprising:

(a) a support conductor;

(b) a dielectric support including a support surface having surface portions exposing said support conductor;

(c) a coupon having a first coupon surface detachably adhered to said support surface and a second coupon surface elastically separated from said first coupon surface;

(d) a contact including a contact tip arranged to engage a device surface, said device surface located nearer said second coupon surface than said first coupon surface; and

(e) a post having a first end substantially flush with said second coupon surface and a second end substantially flush with said first coupon surface.

6. The probing apparatus of claim 5 wherein said contact further comprises a rigid, elongate contact beam affixed to said second coupon surface, said contact tip affixed to said contact beam nearer a first end of said contact beam than a second end of said contact beam.

7. The probing apparatus of claim 6 wherein said contact further comprises said post, wherein said post is affixed to said contact beam nearer said second end of said contact beam than said first end of said contact beam, said post having an end portion arranged to contact said support conductor at a location nearer said first coupon surface than said second coupon surface.

8. The probing apparatus of claim 5 wherein said coupon is detachably adhered to said support surface by an adhesive.

9. The probing apparatus of claim 5 wherein said dielectric support comprises a flexible membrane including a membrane surface supported by a substantially rigid membrane support.

10. The probing apparatus of claim 9 wherein said contact further comprises a rigid, elongate contact beam affixed to said second coupon surface, said contact tip affixed to said contact beam nearer a first end of said contact beam than a second end of said contact beam.

11. The probing apparatus of claim 10 wherein said contact further comprises said post, wherein said post is affixed to said contact beam nearer said second end of said contact beam than said first end of said contact beam, said post having an end portion arranged to contact said support conductor at a location nearer said first coupon surface than said second coupon surface.

12. The probing apparatus of claim 9 wherein said coupon is detachably adhered to said support surface by an adhesive.

13. The probing apparatus of claim 5 wherein said dielectric support comprises a space transformer.

14. The probing apparatus of claim 13 wherein said contact further comprises a rigid, elongate contact beam affixed to said second coupon surface, said contact tip affixed to said contact beam nearer a first end of said contact beam than a second end of said contact beam.

15. The probing apparatus of claim 14 wherein said contact further comprises said post, wherein said post is affixed to said contact beam nearer said second end of said contact beam than said first end of said contact beam, said post having an end portion arranged to contact said support conductor at a location nearer said first coupon surface than said second coupon surface.

16. The probing apparatus of claim 14 wherein said coupon is detachably adhered to said support surface by an adhesive.

Assignments (6)