Method for detecting statuses of components of semiconductor equipment and associated apparatus

1. A method for detecting an operational status of a semiconductor equipment, comprising:

receiving an audio frequency signal generated from the semiconductor equipment while the semiconductor equipment is working; and

analyzing the audio frequency signal to determine statuses of components of the semiconductor equipment.

2. The method of claim 1 , wherein the step of analyzing the audio frequency signal comprises:

analyzing the audio frequency signal by utilizing a mel-scale frequency cepstral analysis to determine the statuses of the components of the semiconductor equipment.

3. The method of claim 1 , wherein the step of analyzing the audio frequency signal comprises:

analyzing the audio frequency signal to generate an audio frequency data; and

comparing the audio frequency data with a plurality of reference audio frequency data of an audio frequency characteristics database to determine the statuses of the components of the semiconductor equipment.

4. The method of claim 3 , further comprising:

for one or more component of the semiconductor equipment at a plurality of known states, receiving a plurality of reference audio frequency signals generated from the semiconductor equipment while the semiconductor equipment is working;

analyzing the plurality of reference audio frequency signals to generate a plurality of reference audio frequency data; and

building the audio frequency characteristics database according to the plurality of reference audio frequency data.

5. The method of claim 4 , wherein the step of analyzing the plurality of reference audio frequency signals to generate the plurality of reference audio frequency data comprises:

for each reference audio frequency signal:

performing a syllable segmentation operation upon the reference audio frequency signal to generate a plurality of syllables;

performing a calculation step upon the plurality of syllables by using mel-frequency cepstrum coefficients to generate a plurality of eigen values, where the plurality of eigen values are designated as an eigen vector; and

generating a reference audio frequency data which corresponds to the reference audio frequency signal according to the eigen vector.

6. The method of claim 5 , wherein the step of generating the reference audio frequency data which corresponds to the reference audio frequency signal according to the eigen vector comprises:

utilizing a linear discrimination analysis to separate the eigen vector and other eigen vectors to generate the reference audio frequency data which correspond to the reference audio frequency signal.

7. The method of claim 1 , wherein the step of analyzing the audio frequency signal to determine the statuses of the components of the semiconductor equipment comprises:

determining which component of the semiconductor equipment is in an abnormal state and requires replacing.

8. The method of claim 1 , wherein the step of analyzing the audio frequency signal to determine the statuses of the components of the semiconductor equipment comprises:

determining which component of the semiconductor equipment is in an alarm state and requires maintenance.

9. The method of claim 1 , wherein the semiconductor equipment is a coater and developer.

10. An apparatus for detecting an operational status of a semiconductor equipment, comprising:

an audio frequency signal receiving unit, for receiving an audio frequency signal generated from the semiconductor equipment while the semiconductor equipment is working; and

an analysis and determination unit, for analyzing the audio frequency signal to determine statuses of components of the semiconductor equipment.

11. The apparatus of claim 10 , wherein the analysis and determination unit analyzes the audio frequency signal by utilizing a mel-scale frequency cepstral analysis to determine the statuses of the components of the semiconductor equipment.

12. The apparatus of claim 10 , wherein the audio frequency signal receiving unit further analyzes the audio frequency signal to generate an audio frequency data; and compares the audio frequency data with a plurality of reference audio frequency data of an audio frequency characteristics database to determine the statuses of the components of the semiconductor equipment.

13. The apparatus of claim 12 , wherein the analysis and determination unit receives a plurality of reference audio frequency signals generated from the semiconductor equipment while the semiconductor equipment is working and the components of the semiconductor equipment are at a plurality of states, respectively; and the analysis and determination unit analyzes the plurality of reference audio frequency signals to generate a plurality of reference audio frequency signals, and builds the audio frequency characteristics database according to the reference audio frequency signals.

14. The apparatus of claim 13 , wherein for each reference audio frequency signal, the analysis and determination unit performs a syllable segmentation operation upon the reference audio frequency signal to generate a plurality of syllables, performs a calculation step upon the plurality of syllables by using mel-frequency cepstrum coefficients to generate a plurality of eigen values, where the plurality of eigen values are designated as an eigen vector, and generates a reference audio frequency data which corresponds to the reference audio frequency signal according to the eigen vector.

15. The apparatus of claim 14 , wherein the analysis and determination unit utilizes a linear discrimination analysis to separate the eigen vector and other eigen vectors to generate the reference audio frequency data which correspond to the reference audio frequency signal.

16. The apparatus of claim 10 , wherein the analysis and determination unit determines which component of the semiconductor equipment is in an abnormal state and requires replacing.

17. The apparatus of claim 10 , wherein the analysis and determination unit determines which component of the semiconductor equipment is in an alarm state and requires maintenance.

18. The apparatus of claim 10 , wherein the semiconductor equipment is a coater and developer.