Table lookup method for physics based models for SPICE-like simulators

1. A computer-implemented method for electronic circuit design simulation, comprising the steps of:

creating a model of the circuit design;

creating error tables containing physics-based numerical solver-simulated data based on physical drift-diffusion or hydrodynamic transports of one or more regions of error of the circuit design, wherein the physics-based numerical solver-simulated data comprises at least one of gate-source voltage (V GS ), drain-source voltage (V DS ) and drain-source current (I DS ) data, and wherein the one or more regions of error are defined from a derivative of I Ds with respect to V Gs at device ON and OFF states;

modifying the model with the data of the one or more regions of error of the circuit design from the error tables; and

using the modified model to simulate the circuit design, wherein at least one of the steps is carried out using a computer device.

2. The method of claim 1 , further comprising the step of:

obtaining data related to the circuit design.

3. The method of claim 1 , wherein the model is a physics-based model.

4. The method of claim 1 , wherein the model is a simulation program with integrated circuit emphasis (SPICE) model.

5. The method of claim 1 , further comprising the step of:

using the model to predict attributes of the circuit design.

6. The method of claim 5 , wherein the attributes of the circuit design comprise one or more of performance, stability and power.

7. The method of claim 5 , further comprising the step of:

comparing the model predictions with the data in the error tables.

8. The method of claim 1 , further comprising the step of:

identifying the one or more regions of the circuit design for which the error tables are created.

9. The method of claim 1 , further comprising the step of:

creating error tables relating to one or more regions of the circuit design that correspond to regions of error in the model.

10. The method of claim 1 , wherein not all regions of the circuit design are the regions of error.

11. A non-transitory article of manufacture for electronic circuit design simulation, comprising a machine-readable medium containing one or more programs which when executed implement the steps of:

creating a model of the circuit design;

creating error tables containing physics-based numerical solver-simulated data based on physical drift-diffusion or hydrodynamic transports of one or more regions of error of the circuit design, wherein the physics-based numerical solver-simulated data comprises at least one of gate-source voltage (V GS ), drain-source voltage (V DS ) and drain-source current (I DS ) data, and wherein the one or more regions of error are defined from a derivative of I DS with respect to V GS at device ON and OFF states;

modifying the model with the data of the one or more regions of error of the circuit design from the error tables; and

using the modified model to simulate the circuit design.

12. The article of manufacture of claim 11 , wherein the one or more programs which when executed further implement the step of:

obtaining data related to the circuit design.

13. The article of manufacture of claim 11 , wherein the one or more programs which when executed further implement the step of:

using the model to predict attributes of the circuit design.

14. The article of manufacture of claim 13 , wherein the one or more programs which when executed further implement the step of:

comparing the model predictions with the data in the error tables.

15. An apparatus for electronic circuit design simulation, the apparatus comprising:

a memory; and

at least one processor device, coupled to the memory, operative to:

create a model of the circuit design;

create error tables containing physics-based numerical solver-simulated data based on physical drift-diffusion or hydrodynamic transports of one or more regions of error of the circuit design, wherein the physics-based numerical solver-simulated data comprises at least one of gate-source voltage (V GS ), drain-source voltage (V DS ) and drain-source current (I DS ) data, and wherein the one or more regions of error are defined from a derivative of I DS with respect to V GS at device ON and OFF states;

modify the model with the data of the one or more regions of error of the circuit design from the error tables; and

use the modified model to simulate the circuit design.

16. The apparatus of claim 15 , wherein the at least one processor device is further operative to:

obtain data related to the circuit design.

17. The apparatus of claim 15 , wherein the at least one processor device is further operative to:

use the model to predict attributes of the circuit design.

18. The apparatus of claim 17 , wherein the at least one processor device is further operative to:

compare the model predictions with the data in the error tables.