IP Library Granted Patent US 8,115,553
Granted Patent B1
US 8,115,553 · App. 12/883,051 · Granted Feb 14, 2012

High linearity, low noise, wide bandwidth amplifier/buffer

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,115,553
App. No.
12/883,051
Granted
Feb 14, 2012
Kind
B1
Abstract

A radio frequency wide band amplifier having a noise that does not exceed a threshold value, and a linearity better than a threshold value. The radio frequency wide band amplifier architecture includes a first stage amplifier and a second stage amplifier. The second stage amplifier includes an input source resistor (R in ) that receives an input voltage signal, a feedback resistor (R fb ) directly connected to the input source resistor, a p-type metal-oxide-semiconductor (PMOS) transistor directly connected to the input source resistor. The PMOS transistor receives an output from the input source resistor. A n-type metal-oxide-semiconductor (NMOS) transistor directly connected to the input source resistor. The NMOS transistor receives an output from the input source resistor. A lumped output resistor (R out ) that receives an output from the feedback resistor, the PMOS transistor, and the NMOS transistor. A terminal of the lumped output impedance is connected to ground.

Claims (280)

1. A radio frequency wide band amplifier architecture having a noise that does not exceed a threshold value, and a linearity better than a threshold value, said radio frequency wide band amplifier architecture comprising a first stage amplifier and a second stage amplifier, said second stage amplifier comprising:

an input source resistor (R in ) that receives an input voltage signal;

a feedback resistor (R fb ) directly connected to said input source resistor;

a p-type metal-oxide-semiconductor (PMOS) transistor directly connected to said input source resistor, wherein said PMOS transistor receives an output from said input source resistor;

a n-type metal-oxide-semiconductor (NMOS) transistor directly connected to said input source resistor, wherein said NMOS transistor receives an output from said input source resistor; and

a lumped output resistor (R out ) that receives an output from said feedback resistor, said PMOS transistor, and said NMOS transistor, wherein a terminal of said lumped output resistor is connected to ground,

wherein g m equals a trans-conductance of said PMOS transistor (g mp ) plus a trans-conductance of said NMOS transistor (g mn ), and wherein said g m is determined in accordance with equation: g m =g mp +g mn .

2. The architecture of claim 1 , wherein a gain of said second stage of said radio frequency wide band amplifier architecture is determined in accordance with equation:

Gain

=

(

g

m

-

1

R

fb

)

(

R

fb

//

R

out

)

,

and wherein said g m is a trans-conductance of a MOS transistor of said radio frequency wide band amplifier architecture.

3. The architecture of claim 1 , wherein said threshold value equals 3 dB.

4. The architecture of claim 2 , wherein an input impedance (Z in ) equals R fb divided by (1+Gain) and is determined in accordance with equation:

Z

in

=

R

fb

1

+

Gain

.

5. The architecture of claim 1 , wherein an output impedance (Z out ) is determined in accordance with equation:

Z

out

=

R

out

//

(

R

fb

+

R

in

)

//

(

R

fb

+

R

in

g

m

R

in

)

.

6. The architecture of claim 2 , wherein a square of noise input referred voltage (V 2 noise_input_referred) is determined in accordance with equation:

V

noise_input

_referred

2

=

4

kT

Gain

2

(

1

(

1

+

g

m

R

in

)

+

R

in

+

Rfb

R

out

)

2

[

R

fb

(

1

+

g

m

R

in

)

2

+

γ

g

m

(

R

in

+

R

fb

)

2

]

.

7. The architecture of claim 1 , wherein said lumped output resistor (R out ) receives said output from a drain terminal of said PMOS transistor, and a drain terminal of said NMOS transistor.

8. The architecture of claim 1 , wherein said first stage amplifier achieves a low noise with a high transconductance, and wherein said second stage amplifier provides a noiseless low impedance to limit the swing of the first stage amplifier to achieve high linearity.

9. The architecture of claim 8 , wherein said first stage amplifier comprises any of a n-type metal-oxide semiconductor (NMOS) transistor, a p-type metal-oxide-semiconductor (PMOS) transistor or both that provides high transconductance for low input referred noise.

10. The architecture of claim 9 , wherein said second stage amplifier contributes very little noise compared with the noise of the first stage amplifier and provides a low impedance to the first stage amplifier to limit the swing of the output of the first stage amplifier for the benefit of linearity.

11. A two stage radio frequency wide band amplifier architecture comprising:

a first stage amplifier having a noise that does not exceed a threshold value; and

a second stage amplifier that limits a swing of an output of said first stage amplifier, said second stage amplifier comprising:

a first n-type metal-oxide-semiconductor (NMOS) transistor that receives an input voltage signal from said first stage amplifier;

a p-type metal-oxide-semiconductor (PMOS) transistor directly connected to said first NMOS transistor;

a feedback resistor directly connected to said first NMOS transistor; and

a load resistor that receives an output from said feedback resistor, said first PMOS transistor, and said second NMOS transistor,

wherein a trans-conductance of said PMOS transistor (g mp ) plus a trans-conductance of said NMOS transistor (g mn ) equals g m such that said g m is determined in accordance with equation: g m =g mp +g mn , and

wherein said g m is a trans-conductance of a MOS transistor of said radio frequency wide band amplifier architecture.

12. A method of using a radio frequency wide band amplifier architecture having a noise that does not exceed a threshold value, and a linearity better than a threshold value, said radio frequency wide band amplifier architecture comprising a first stage amplifier and a second stage amplifier, wherein said method comprises:

receiving an input voltage signal in an input source resistor (R in );

directly connecting a feedback resistor (R fb ) to said input source resistor;

receiving an output from said input source resistor into a p-type metal-oxide-semiconductor (PMOS) transistor that is directly connected to said input source resistor;

receiving an output from said input source resistor into a n-type metal-oxide-semiconductor (NMOS) transistor that is directly connected to said input source resistor; and

receiving an output from said feedback resistor, said PMOS transistor, and said NMOS transistor into a lumped output resistor (R out ), wherein a terminal of said lumped output resistor is connected to ground,

wherein g m equals a trans-conductance of said PMOS transistor (g mp ) plus a trans-conductance of said NMOS transistor (g mn ), and wherein said g m is determined in accordance with equation: g m =g mp +g mn .

13. The method of claim 12 , wherein a gain of said second stage of said radio frequency wide band amplifier architecture is determined in accordance with equation:

Gain

=

(

g

m

-

1

R

fb

)

(

R

fb

//

R

out

)

,

and wherein said g m is a trans-conductance of a MOS transistor of said radio frequency wide band amplifier architecture.

14. The method of claim 12 , wherein said threshold value equals 3 dB.

15. The method of claim 13 , wherein an input impedance (Z in ) equals R fb divided by (1+Gain) and is determined in accordance with equation:

Z

in

=

R

fb

1

+

Gain

.

16. The method of claim 12 , wherein an output impedance (Z out ) is determined in accordance with equation:

Z

out

=

R

out

//

(

R

fb

+

R

in

)

//

(

R

fb

+

R

in

g

m

R

in

)

.

17. The method of claim 13 , wherein a square of noise input referred voltage (V 2 noise_input_referred) is determined in accordance with equation:

V

noise_input

_referred

2

=

4

kT

Gain

2

(

1

(

1

+

g

m

R

in

)

+

R

in

+

Rfb

R

out

)

2

[

R

fb

(

1

+

g

m

R

in

)

2

+

γ

g

m

(

R

in

+

R

fb

)

2

]

.

18. The method of claim 12 , wherein said lumped output resistor (R out ) receives said output from a drain terminal of said PMOS transistor, and a drain terminal of said NMOS transistor.

19. The method of claim 12 , wherein said first stage amplifier achieves a low noise with a high transconductance, wherein said second stage amplifier provides a noiseless low impedance to limit the swing of the first stage amplifier to achieve high linearity, wherein said first stage amplifier comprises any of a n-type metal-oxide semiconductor (NMOS) transistor, a p-type metal-oxide-semiconductor (PMOS) transistor or both that provides high transconductance for low input referred noise.

20. The method of claim 19 , wherein said second stage amplifier contributes very little noise compared with the noise of the first stage amplifier and provides a low impedance to the first stage amplifier to limit the swing of the output of the first stage amplifier for the benefit of linearity.

Assignments (31)
RELEASE OF SECURITY INTEREST Recorded Mar 14, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 060894/0437 →
RELEASE OF SECURITY INTEREST Recorded Mar 11, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059363/0001 →
RELEASE OF SECURITY INTEREST Recorded Mar 10, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059863/0400 →
RELEASE OF SECURITY INTEREST Recorded Mar 9, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059358/0001 →
RELEASE OF SECURITY INTEREST Recorded Feb 28, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: ATMEL CORPORATION
Reel/Frame 059262/0105 →
RELEASE OF SECURITY INTEREST Recorded Feb 25, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059333/0222 →
SECURITY INTEREST Recorded Jun 4, 2021
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 057935/0474 →
SECURITY INTEREST Recorded Dec 24, 2020
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 055671/0612 →
SECURITY INTEREST Recorded Jun 5, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION
Reel/Frame 053468/0705 →
RELEASE OF SECURITY INTEREST Recorded May 30, 2020
From: JPMORGAN CHASE BANK, N.A, AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 053466/0011 →
SECURITY INTEREST Recorded Apr 24, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 053311/0305 →
SECURITY INTEREST Recorded Sep 18, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 047103/0206 →
SECURITY INTEREST Recorded Jun 25, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 046426/0001 →
SECURITY INTEREST Recorded Feb 10, 2017
From: ATMEL CORPORATION
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 041715/0747 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT COLLATERAL Recorded Apr 6, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: ATMEL WIRELESS MCU TECHNOLOGIES CORPORATION
Reel/Frame 038364/0615 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT COLLATERAL Recorded Apr 6, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NEWPORT MEDIA, INC.
Reel/Frame 038364/0659 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 24, 2014
From: NEWPORT MEDIA, INC.
To: ATMEL CORPORATION
Reel/Frame 034705/0090 →
TERMINATION OF SECURITY Recorded Oct 7, 2014
From: BRIDGE BANK, NATIONAL ASSOCIATION
To: ATMEL CORPORATION
Reel/Frame 033907/0517 →
TERMINATION OF SECURITY Recorded Oct 7, 2014
From: PINNACLE VENTURES, L.L.C.
To: ATMEL CORPORATION
Reel/Frame 033908/0435 →
TERMINATION OF SECURITY Recorded Oct 7, 2014
From: PINNACLE VENTURES, L.L.C.
To: ATMEL CORPORATION
Reel/Frame 033908/0379 →
TERMINATION OF SECURITY Recorded Oct 7, 2014
From: NEWPORT MEDIA, INC.
To: ATMEL CORPORATION
Reel/Frame 033908/0242 →
TERMINATION OF SECURITY Recorded Oct 7, 2014
From: NEWPORT MEDIA, INC.
To: ATMEL CORPORATION
Reel/Frame 033907/0775 →
TERMINATION OF SECURITY Recorded Oct 7, 2014
From: NEWPORT MEDIA, INC.
To: ATMEL CORPORATION
Reel/Frame 033907/0748 →
TERMINATION OF SECURITY Recorded Oct 7, 2014
From: HORIZON TECHNOLOGY FINANCE CORPORATION
To: ATMEL CORPORATION
Reel/Frame 033907/0702 →
PATENT SECURITY AGREEMENT Recorded Sep 5, 2014
From: NEWPORT MEDIA, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 033689/0195 →
PATENT SECURITY AGREEMENT Recorded Sep 5, 2014
From: ATMEL WIRELESS MCU TECHNOLOGIES CORPORATION
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 033689/0214 →
SECURITY AGREEMENT Recorded Mar 1, 2013
From: NEWPORT MEDIA, INC.
To: HORIZON TECHNOLOGY FINANCE CORPORATION, AS COLLATERAL AGENT
Reel/Frame 029956/0891 →
SECURITY AGREEMENT Recorded Feb 15, 2013
From: NEWPORT MEDIA, INC., A DELAWARE CORPORATION; NEWPORT MEDIA, INC., A CALIFORNIA CORPORATION
To: PINNACLE VENTURES, L.L.C.
Reel/Frame 029818/0138 →
SECURITY AGREEMENT Recorded Dec 31, 2012
From: NEWPORT MEDIA, INC.
To: BRIDGE BANK, NATIONAL ASSOCIATION
Reel/Frame 029554/0118 →
SECURITY AGREEMENT Recorded May 31, 2012
From: NEWPORT MEDIA, INC.
To: PINNACLE VENTURES, L.L.C.
Reel/Frame 028299/0903 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 15, 2010
From: WANG, DEJUN
To: NEWPORT MEDIA, INC.
Reel/Frame 024994/0993 →