Semiconductor device and method of confining conductive bump material with solder mask patch
View Patent ↗A semiconductor device has a semiconductor die having a plurality of die bump pad and substrate having a plurality of conductive trace with an interconnect site. A solder mask patch is formed interstitially between the die bump pads or interconnect sites. A conductive bump material is deposited on the interconnect sites or die bump pads. The semiconductor die is mounted to the substrate so that the conductive bump material is disposed between the die bump pads and interconnect sites. The conductive bump material is reflowed without a solder mask around the die bump pad or interconnect site to form an interconnect structure between the semiconductor die and substrate. The solder mask patch confines the conductive bump material within the die bump pad or interconnect site. The interconnect structure can include a fusible portion and non-fusible portion. An encapsulant is deposited between the semiconductor die and substrate.
1. A semiconductor device, comprising:
a substrate including a plurality of first interconnect sites;
a semiconductor die including a plurality of second interconnect sites;
a plurality of solder mask patches formed between the first interconnect sites or second interconnect sites;
an interconnect structure disposed between the substrate and semiconductor die, wherein the solder mask patches confine the interconnect structure within the first interconnect sites or second interconnect sites; and
an encapsulant deposited between the substrate and semiconductor die.
2. The semiconductor device of claim 1 , wherein the solder mask patch includes non-wettable material.
3. The semiconductor device of claim 1 , wherein the interconnect structure covers a top surface and side surface of the first interconnect site or second interconnect site.
4. The semiconductor device of claim 1 , wherein the interconnect structure includes a fusible portion and non-fusible portion.
5. The semiconductor device of claim 1 , wherein the interconnect structure includes a conductive pillar and bump formed over the conductive pillar.
6. A semiconductor device, comprising:
a substrate including first and second interconnect sites;
a solder mask patch disposed between the first and second interconnect sites; and
an interconnect structure disposed over the first interconnect site and confined within the first interconnect site by the solder mask patch.
7. The semiconductor device of claim 6 , wherein the solder mask patch includes non-wettable material.
8. The semiconductor device of claim 6 , further including a semiconductor die disposed over the substrate, the semiconductor die including a third interconnect site disposed over the first interconnect site.
9. The semiconductor device of claim 8 , wherein the interconnect structure includes a volume of conductive bump material deposited between the first and third interconnect sites so that a surface tension maintains confinement of the volume of conductive bump material substantially within a footprint of the first interconnect site or third interconnect site.
10. The semiconductor device of claim 6 , wherein the interconnect structure covers a top surface and side surface of the first interconnect site.
11. The semiconductor device of claim 6 , wherein the interconnect structure includes a fusible portion and non-fusible portion.
12. The semiconductor device of claim 6 , wherein the interconnect structure includes a conductive pillar and bump formed over the conductive pillar.
13. A semiconductor device, comprising:
a substrate including a first interconnect site;
a solder mask patch disposed over the substrate; and
an interconnect structure disposed over the first interconnect site and confined within the first interconnect site by the solder mask patch.
14. The semiconductor device of claim 13 , further including a semiconductor die disposed over the substrate, the semiconductor die including a second interconnect site disposed over the first interconnect site.
15. The semiconductor device of claim 14 , wherein the interconnect structure covers a top surface and side surface of the first interconnect site or second interconnect site.
16. The semiconductor device of claim 13 , wherein the interconnect structure includes a fusible portion and non-fusible portion.
17. The semiconductor device of claim 13 , wherein the interconnect structure includes a conductive pillar and bump formed over the conductive pillar.