Hierarchical common source line structure in NAND flash memory
View Patent ↗Each memory cell string in a generic NAND flash cell block connects to a Common Source Line (CLS). A value for applying to the CSL is centrally generated and distributed to a local switch logic unit corresponding to each NAND flash cell block. For source-line page programming, the distribution line may be called a Global Common Source Line (GCSL). In an array of NAND flash cell blocks, only one NAND flash cell block is selected at a time for programming. To reduce power consumption, only the selected NAND flash cell block receives a value on the CSL that is indicative of the value on the GCSL. Additionally, the CSLs of non-selected NAND flash cell blocks may be disabled through an active connection to ground.
1. A NAND Flash memory device comprising:
a plurality of NAND FLASH cell blocks including a plurality of NAND FLASH memory strings, each NAND FLASH block connected to a local common source line, respectively;
a plurality of local switch logic, each including:
a first semiconductor switch for selectively allowing passage of a signal received on a global common source line to the cell block on the local common source line; and a second semiconductor switch for selectively allowing passage of a predetermined voltage on the local common source line.
2. The memory device as claimed in claim 1 wherein the predetermined voltage is ground.
3. The memory device as claimed in claim 1 wherein the local switch logic further comprises a first input line for receiving a global common source line signal.
4. The memory device as claimed in claim 1 wherein the local switch logic further comprises a second input line for receiving a voltage level indicative of the NAND Flash cell block not having been selected.
5. The memory device as claimed in claim 1 wherein the local switch logic further comprises a third input line for receiving a ground select signal.
6. The memory device as claimed in claim 5 wherein the local switch logic further comprises a third semiconductor switch for selectively allowing a passage of the ground select signal to a ground select line in the NAND Flash cell block.
7. The memory device as claimed in claim 6 wherein the plurality of NAND flash memory strings is connected to the ground select line.
8. The memory device as claimed in claim 5 further comprising a row decoder adapted to receive row pre-decoded signals and based on the row pre-decoded signals, provide, on the third input line, the ground select signal.
9. The memory device as claimed in claim 1 wherein the local switch logic further comprises a fourth input line for receiving a block decode signal from a local charge pump.
10. The memory array of claim 9 wherein the local charge pump is adapted to receive a block decode latch signal and provide the block decode signal to the first and the third semiconductor switches.
11. The memory array of claim 10 wherein the passage of the ground select signal is based on the block decode signal on the fourth input line.
12. A method of source-line page programming in a NAND Flash memory device, the method comprising:
receiving an indication of selection of a block of NAND flash memory strings among a plurality of blocks of NAND FLASH memory strings;
each of the plurality of blocks of NAND FLASH memory strings connected to a local common source line, respectively;
responsive to receiving the indication of selection, permitting passage of a signal received on a global common source line to the block of NAND flash memory strings on the local common source line via a local switch;
receiving an enable indication; and responsive to receiving the enable indication, isolating the local common source line from a predetermined voltage.
13. The method of claim 12 wherein the predetermined voltage is ground.
14. A method of source-line page programming in a NAND Flash memory device, the method comprising:
receiving an indication that a block of NAND flash memory strings, among a plurality of blocks of NAND flash memory strings, has not been selected, wherein each of the plurality of blocks of NAND flash memory strings is connected to a local common source line, respectively;
responsive to receiving the indication, isolating, at a local switch, a global common source line from the local common source line of the block of NAND flash memory strings;
receiving a disable indication; and
responsive to receiving the disable indication, connecting the local common source line to a predetermined voltage.
15. The method of claim 14 wherein the predetermined voltage is ground.