Methods for increased array feature density
View Patent ↗The embodiments generally relate to methods of making semiconductor devices, and more particularly, to methods for making semiconductor pillar structures and increasing array feature pattern density using selective or directional gap fill. The technique has application to a variety of materials and can be applied to making monolithic two or three-dimensional memory arrays.
1. A method of making a semiconductor device, the method comprising:
providing first features on a substrate, wherein the first features comprise a plurality of completely distinct features;
forming sidewall spacers and spacer regions on the first features;
filling the spacer regions with a selective material to form filler features; and
removing the sidewall spacers to form second features.
2. A method as recited in claim 1 , wherein the second features have at least twice the density of the first features.
3. A method as recited in claim 1 , wherein the first features comprise a pillar structure.
4. A method as recited in claim 1 , wherein the second features comprise a two-dimensional structure.
5. A method as recited in claim 1 , wherein the second features comprise a three-dimensional structure.
6. A method as recited in claim 1 , wherein the substrate comprises a material selected from the group consisting of metal, a dielectric material, and silicon.
7. A method as recited in claim 1 , wherein the second features are patterned using a surface activation technique.
8. A method as recited in claim 1 , wherein the second features are patterned using plasma enhanced chemical vapor deposition (PECVD).
9. A method as recited in claim 1 , wherein the selective material is applied using a directional gap fill technique.
10. A method as recited in claim 1 , wherein the second features comprise a carbon material.
11. A method as recited in claim 1 , wherein forming sidewall spacers comprises depositing a first layer on the first features.
12. A method as recited in claim 11 , wherein the first layer comprises a nitride material.
13. A method as recited in claim 1 , wherein an optional carrier gas can be applied to the spacer and spacer regions prior to applying the selective material.
14. A method as recited in claim 13 , wherein the optional carrier gas is selected from the group consisting of He, Ar, H 2 , Kr, Xe, and N 2 .
15. A method as recited in claim 1 , wherein an optional etchant gas can be applied to the spacer and spacer regions prior to applying the selective material.
16. A method as recited in claim 15 , wherein the optional etchant gas comprises a gas selected from the group consisting of H 2 , F, Cl, and Br.
17. A method as recited in claim 1 , wherein the selective material comprises a carbon material of the form C x H y , wherein x is an odd or even number greater than 1, and y is 2x.
18. A method as recited in claim 1 , wherein the selective material comprises a material selected from the group consisting of carbon, tungsten, and silicon, and their associated isotopes.