IP Library Granted Patent US 8,536,933
Granted Patent B2
US 8,536,933 · App. 13/426,322 · Granted Sep 17, 2013

Method and circuit for an operating area limiter

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Quick Facts
Patent No.
US 8,536,933
App. No.
13/426,322
Granted
Sep 17, 2013
Kind
B2
Abstract

The present invention relates to circuits and methods for limiting the operating area of a transistor in a constant current source. The circuits and methods use a detector and a driver to limit the operating area of a transistor. The detector and driver have parameters selected so that, when the voltage at the drain of the transistor satisfies a reference condition, the driver causes drain current of the transistor to decrease. The reference condition is determined relative to the maximum safe drain-to-source voltage at the design drain current of the constant current source.

Claims (39)

1. A circuit for limiting the operating area of a transistor in a constant current source, comprising:

a detector having a single input that is coupled to the constant current source, wherein the single input of the detector that is coupled to the constant current source is directly connected to the drain of the transistor included in the constant current source, the detector including an output; and

a driver configured for controlling a drain current of the transistor included in the constant current source, wherein the driver has an input connected to the output of the detector and an output connected to the constant current source, the driver comprising a multiplexer and a digital-to-analog converter,

wherein the detector and driver are configured such that when a voltage at the drain of the transistor included in the constant current source satisfies a reference condition, the driver causes the drain current of the transistor to decrease, the reference condition determined relative to a maximum safe drain-to-source voltage at a design drain current of the constant current source.

2. The circuit of claim 1 , wherein the multiplexer includes a first input, a second input, a third input and an output, the first input configured for receiving information associated with a normal condition, the second input configured for receiving information associated with a fault condition, and the third input is coupled to the output of the detector.

3. The circuit of claim 2 , wherein the digital-to-analog converter includes an input and an output, the input of the digital-to-analog converter coupled to the output of the multiplexer and the output of the digital-to-analog converter coupled to a reference voltage input of the constant current source.

4. The circuit of claim 3 , wherein the multiplexer is configured such that when a voltage at the drain of the transistor fails to satisfy the reference condition, the multiplexer transmits the information associated with the normal condition received at its first input to the digital-to-analog converter.

5. The circuit of claim 3 , wherein the multiplexer is configured such that when a voltage at the drain of the transistor satisfies the reference condition, the multiplexer passes the information associated with the fault condition received at its second input to the digital-to-analog controller, and

wherein the digital-to-analog controller is configured to reduce a voltage at the output of the digital-to-analog controller upon receiving from the multiplexer the information associated with the fault condition.

6. The circuit of claim 5 , wherein reducing the voltage at the output of the digital-to-analog controller reduces the reference voltage of the constant current source.

7. The circuit of claim 3 , wherein the constant current source includes a comparator, the output of the digital-to-analog converter is coupled to a first input of the comparator that includes a second input and an output, the second input directly coupled to a source of the transistor in the constant current source and the output of the comparator is coupled to a gate of the transistor.

8. The circuit of claim 1 , wherein the reference condition includes a duration limit such that the reference condition is not satisfied unless the voltage at the drain of the transistor achieves a certain value for a certain amount of time.

9. The circuit of claim 1 , wherein the reference condition is based on a safe operating area of the transistor included in the constant current source.

10. The circuit of claim 1 , wherein the detector comprises a signal processor.

11. The circuit of claim 10 , wherein the signal processor includes at least one of latch and hold, de-bounce or de-glitch functions, noise reduction and misfire detection.

12. The circuit of claim 10 , wherein the signal processor includes means to hold the output of the detector at a set value irrespective of fluctuations in the voltage at the drain of the transistor.

13. The circuit of claim 10 , wherein the signal processor is configured for maintaining the drain current of the transistor, irrespective of the voltage at the drain of the transistor, until a reset signal is received by the signal processor.

14. The circuit of claim 1 , wherein the driver is configured to decrease the drain current of the transistor by increasing the resistance of a sensing resistor included in the constant current source or the circuit.

15. The circuit of claim 14 , wherein the sensing resistor is one of a variable resistor or a potentiometer with a resistance that is configurable based on the output of the detector.

16. The circuit of claim 14 , wherein the sensing resistor includes a plurality of resistors, one or more of which are engaged based on the output of the detector.

17. The circuit of claim 1 , wherein the circuit is configured for controlling the constant current source that is operable for providing a stable current to a light emitting diode (LED) array.

18. A method comprising:

determining a safe operating area of a transistor included in a constant current source;

configuring a detector for providing a set voltage based on determining the safe operating area of the transistor, the detector including an input that is coupled to an output of the constant current source;

detecting a voltage at a drain of the transistor;

determining whether the voltage at the drain of the transistor exceeds the set voltage;

responsive to determining that the voltage at the drain of the transistor exceeds the set voltage, controlling a driver comprising a multiplexer and a digital-to-analog converter for reducing a reference voltage provided by the driver to a comparator included in the constant current source, the driver coupled to an output of the detector; and

based on reducing the reference voltage provided to the comparator, decreasing the drain current at the transistor and causing the transistor to operate in the safe operating area of the transistor, wherein the drain current of the transistor included in the constant current source is controlled by the comparator, with an input of the comparator directly coupled to a source of the transistor and an output of the comparator directly coupled to a gate of the transistor.

19. The method of claim 18 , comprising:

responsive to determining that the voltage at the drain of the transistor exceeds the set voltage, controlling the driver for decreasing the drain current of the transistor by increasing the resistance of a sensing resistor included in the constant current source or the circuit.

20. The method of claim 18 , wherein determining whether the voltage at the drain of the transistor exceeds the set voltage comprises:

determining whether the voltage at the drain of the transistor exceeds the set voltage for a specified time duration; and

responsive to determining that the voltage at the drain of the transistor exceeds the set voltage for the specified time duration, controlling the driver for reducing the reference voltage provided to the comparator.

21. The method of claim 18 , wherein controlling the driver for reducing the reference voltage provided by the driver to the comparator comprises:

configuring the multiplexer for transmitting information associated with a fault condition to the digital-to-analog controller when the voltage at the drain of the transistor exceeds the set voltage; and

configuring the digital-to-analog controller for reducing a voltage at the output of the digital-to-analog controller upon receiving from the multiplexer the information associated with the fault condition.

22. The method of claim 21 , wherein reducing the voltage at the output of the digital-to-analog controller reduces the reference voltage of the constant current source.

23. The method of claim 18 , comprising:

providing a stable current to a light emitting diode (LED) array coupled to the constant current source.

Assignments (16)
RELEASE OF SECURITY INTEREST Recorded Mar 14, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 060894/0437 →
RELEASE OF SECURITY INTEREST Recorded Mar 11, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059363/0001 →
RELEASE OF SECURITY INTEREST Recorded Mar 10, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059863/0400 →
RELEASE OF SECURITY INTEREST Recorded Mar 9, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059358/0001 →
RELEASE OF SECURITY INTEREST Recorded Feb 28, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: ATMEL CORPORATION
Reel/Frame 059262/0105 →
RELEASE OF SECURITY INTEREST Recorded Feb 25, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059333/0222 →
SECURITY INTEREST Recorded Jun 4, 2021
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 057935/0474 →
SECURITY INTEREST Recorded Dec 24, 2020
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 055671/0612 →
SECURITY INTEREST Recorded Jun 5, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION
Reel/Frame 053468/0705 →
RELEASE OF SECURITY INTEREST Recorded May 30, 2020
From: JPMORGAN CHASE BANK, N.A, AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 053466/0011 →
SECURITY INTEREST Recorded Apr 24, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 053311/0305 →
SECURITY INTEREST Recorded Sep 18, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 047103/0206 →
SECURITY INTEREST Recorded Jun 25, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 046426/0001 →
SECURITY INTEREST Recorded Feb 10, 2017
From: ATMEL CORPORATION
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 041715/0747 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT COLLATERAL Recorded Apr 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: ATMEL CORPORATION
Reel/Frame 038376/0001 →
PATENT SECURITY AGREEMENT Recorded Jan 3, 2014
From: ATMEL CORPORATION
To: MORGAN STANLEY SENIOR FUNDING, INC. AS ADMINISTRATIVE AGENT
Reel/Frame 031912/0173 →