IP Library Granted Patent US 8,319,509
Granted Patent B1
US 8,319,509 · App. 13/460,006 · Granted Nov 27, 2012

Testing circuit for an analog to digital converter

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Quick Facts
Patent No.
US 8,319,509
App. No.
13/460,006
Granted
Nov 27, 2012
Kind
B1
Abstract

A testing circuit configures an analog to digital converter (ADC) to receive a test signal instead of a live input signal. The testing circuit compares an output test value from the ADC to an expected test value for the test signal. The testing circuit provides an expected live output value to a digital circuit instead of the output test value, thereby preventing the ADC from providing a value to the digital circuit not based on the live input signal.

Claims (49)

1. A method performed by a testing circuit for testing an analog to digital converter (ADC), the method comprising:

configuring the ADC to receive a live input signal and provide one or more output digital values to a digital circuit;

determining an expected live output value of the ADC for a testing time period for the live input signal;

during the testing time period:

configuring the ADC to receive a test signal instead of the live input signal;

providing the test signal to the ADC;

receiving an output test value from an output of the ADC;

comparing the output test value to an expected test value for the test signal; and

providing the expected live output value to the digital circuit instead of the output test value.

2. The method of claim 1 , further comprising, after the testing time period, reconfiguring the ADC to receive the live input signal.

3. The method of claim 1 , wherein the live input signal varies at a live frequency, and wherein determining the expected live output value for the testing time period comprises determining the expected live output value assuming that the live input signal will continue varying at the live frequency through the testing time period.

4. The method of claim 3 , wherein determining the expected live output value comprises determining that the expected live output is zero at a time when the amplitude of the live input signal will be crossing zero if the live input signal continues varying at the live frequency.

5. The method of claim 3 , wherein determining the expected live output value comprises applying an interpolation filter to the live input signal.

6. The method of claim 5 , wherein the live input signal is substantially band-limited to a maximum frequency, and wherein the ADC is configured to sample the live input signal at a sampling frequency greater than or equal to twice the maximum frequency of the live input signal.

7. The method of claim 1 , wherein the live input signal is based on a power signal at a utility frequency from an electric power grid, and wherein determining the expected live output value for the testing time period comprises:

determining based on the utility frequency a time when the amplitude of the power signal will be equal to zero as the amplitude of the power signal crosses from a positive value to a negative value or as the amplitude of the power signal crosses from a negative value to a positive value;

determining the time period as encompassing the time when the amplitude of the power signal will be equal to zero; and

determining that the expected live output value is zero.

8. A testing circuit for testing an analog to digital converter (ADC), the testing circuit comprising:

a test signal generator configured to generate a test signal, the test signal generator being coupled to an input of the ADC;

a test signal comparator configured to compare an output value of the ADC to an expected test output value for the test signal the test signal comparator being coupled to an output of the ADC; and

an expected value predictor configured to determine an expected live output value of the ADC for a testing time period;

wherein the testing circuit is configured to perform operations comprising:

during the testing time period, configuring the ADC to receive the test signal instead of a live input signal;

providing the test signal to the ADC;

receiving an output test value from an output of the ADC;

comparing the output test value to the expected test value for the test signal; and

providing the expected live output value to a digital circuit instead of the output test value.

9. The testing circuit of claim 7 , further comprising an input circuit configured to select between the live input signal and the test signal and an output circuit configured to select between the output of the ADC and an expected live output of the testing circuit.

10. The testing circuit of claim 7 , wherein determining the expected live output value for the testing time period comprises determining the expected live output value assuming that the live input signal will continue varying at a live frequency through the testing time period.

11. The testing circuit of claim 10 , wherein determining the expected live output value comprises determining that the expected live output is zero at a time when the amplitude of the live input signal will be crossing zero if the live input signal continues varying at the live frequency.

12. The testing circuit of claim 10 , wherein determining the expected live output value comprises applying interpolation to the live input signal.

13. The testing circuit of claim 12 , wherein the live input signal is substantially band-limited to a maximum frequency, and wherein the ADC is configured to sample the live input signal at a sampling frequency greater than or equal to twice the maximum frequency of the live input signal.

14. An electricity meter comprising:

a live signal input;

a digital signal processor (DSP);

an analog to digital converter (ADC);

an input circuit coupled to the live signal input;

an output circuit coupled to an ADC output and the DSP; and

a test management circuit coupled to the input circuit and the output circuit, wherein the test management circuit is configured to perform operations comprising:

determining an expected live output value of the ADC for a testing time period for a live input signal on the live signal input;

during the testing time period, configuring the input circuit so that the ADC receives the test signal instead of a live input signal and configuring the output circuit so that the DSP receives the expected live output value instead of an output test value from the ADC;

providing the test signal to the ADC;

receiving an output test value from an output of the ADC; and

comparing the output test value to the expected test value for the test signal.

15. The electricity meter of claim 14 , wherein determining the expected live output value for the testing time period comprises determining the expected live output value assuming that the live input signal will continue varying at a live frequency through the testing time period.

16. The electricity meter of claim 15 , wherein determining the expected live output value comprises determining that the expected live output is zero at a time when the amplitude of the live input signal will be crossing zero if the live input signal continues varying at the live frequency.

17. The electricity meter of claim 15 , wherein determining the expected live output value comprises applying an interpolation filter to the live input signal.

18. The electricity meter of claim 15 , wherein the live frequency is a utility frequency for an electric power grid.

Assignments (18)
RELEASE OF SECURITY INTEREST Recorded Mar 14, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 060894/0437 →
RELEASE OF SECURITY INTEREST Recorded Mar 11, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059363/0001 →
RELEASE OF SECURITY INTEREST Recorded Mar 10, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059863/0400 →
RELEASE OF SECURITY INTEREST Recorded Mar 9, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059358/0001 →
RELEASE OF SECURITY INTEREST Recorded Feb 28, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: ATMEL CORPORATION
Reel/Frame 059262/0105 →
RELEASE OF SECURITY INTEREST Recorded Feb 25, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059333/0222 →
SECURITY INTEREST Recorded Dec 24, 2020
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 055671/0612 →
SECURITY INTEREST Recorded Jun 5, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION
Reel/Frame 053468/0705 →
RELEASE OF SECURITY INTEREST Recorded May 30, 2020
From: JPMORGAN CHASE BANK, N.A, AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 053466/0011 →
SECURITY INTEREST Recorded Apr 24, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 053311/0305 →
SECURITY INTEREST Recorded Sep 18, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 047103/0206 →
SECURITY INTEREST Recorded Jun 25, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 046426/0001 →
SECURITY INTEREST Recorded Feb 10, 2017
From: ATMEL CORPORATION
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 041715/0747 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT COLLATERAL Recorded Apr 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: ATMEL CORPORATION
Reel/Frame 038376/0001 →
PATENT SECURITY AGREEMENT Recorded Jan 3, 2014
From: ATMEL CORPORATION
To: MORGAN STANLEY SENIOR FUNDING, INC. AS ADMINISTRATIVE AGENT
Reel/Frame 031912/0173 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 9, 2013
From: ATMEL ROUSSET S.A.S
To: ATMEL CORPORATION
Reel/Frame 030181/0642 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 8, 2012
From: KAZAZIAN, JEAN-JACQUES
To: ATMEL ROUSSET S.A.S.
Reel/Frame 028341/0115 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 8, 2012
From: STAVER, DANIEL ARTHUR
To: ATMEL CORPORATION
Reel/Frame 028341/0010 →