IP Library Granted Patent US 8,780,651
Granted Patent B2
US 8,780,651 · App. 13/537,029 · Granted Jul 15, 2014

Continuous programming of non-volatile memory

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Quick Facts
Patent No.
US 8,780,651
App. No.
13/537,029
Granted
Jul 15, 2014
Kind
B2
Abstract

A system connects a signal driver to a first control line that is connected to a first non-volatile storage element, charges the first control line while the signal driver is connected to the first control line, disconnects the signal driver from the first control line while the first control line remains charged from the signal driver, connects the signal driver to a second control line that is connected to a second non-volatile storage element, charges the second control line using the signal driver while the signal driver is connected to the second control line, and disconnects the signal driver from the second control line. The disconnecting of the signal driver from the first control line, the connecting the signal driver to the second control line and the charging of the second control line are performed without waiting for the first non-volatile storage element's program operation to complete.

Claims (56)

1. A non-volatile storage apparatus, comprising:

a monolithic three-dimensional memory array including a first non-volatile storage element and a second non-volatile storage element; and

one or more control circuits in communication with the first non-volatile storage element and the second non-volatile storage element, the one or more control circuits perform and complete a program operation for the first non-volatile storage element using a first source of charge by connecting a control line for the first non-volatile storage element to the first source of charge at a first time, the one or more control circuits perform and complete a program operation for the second non-volatile storage element using the first source of charge by connecting a control line for the second non-volatile storage element to the first source of charge at a second time that is subsequent to the first time, the program operation for the first non-volatile storage element of the monolithic three-dimensional memory array is performed concurrently with the program operation for the second non-volatile storage element of the monolithic three-dimensional memory array.

2. The non-volatile storage apparatus of claim 1 , wherein:

the first non-volatile storage element includes a first reversible resistance-switching memory element; and

the second non-volatile storage element includes a second reversible resistance-switching memory element.

3. The non-volatile storage apparatus of claim 1 , wherein:

the program operation for the first non-volatile storage element and the program operation for the second non-volatile storage element both include discharging to a common control line.

4. The non-volatile storage apparatus of claim 1 , wherein:

the one or more control circuits start the program operation for the first non-volatile storage element by applying a charge on the control line for the first non-volatile storage element; and

the one or more control circuits unselect the first non-volatile storage element, select the second non-volatile storage element and start the program operation for the second non-volatile storage element while the first control line still holds at least a portion of the charge.

5. The non-volatile storage apparatus of claim 1 , wherein:

the one or more control circuits start the program operation for the first non-volatile storage element by applying a charge on the control line for the first non-volatile storage element for a period of time that is insufficient to change the first non-volatile storage element from a first predetermined state to a second predetermined state;

the one or more control circuits start the program operation for the second non-volatile storage element by applying a charge on the second control line for a period of time that is insufficient to change the second non-volatile storage element from the first predetermined state to the second predetermined state; and

the one or more control circuits allow the first control line to discharge through the first non-volatile storage element in order to change the first non-volatile storage element from the first predetermined state to the second predetermined state and the one or more control circuits allow the second control line to discharge through the second non-volatile storage element in order to change the second non-volatile storage element from the first predetermined state to the second predetermined state.

6. A process for programming non-volatile storage, comprising:

performing and completing a program operation for a first non-volatile storage element of a monolithic three-dimensional memory using a first source of charge by connecting a control line for the first non-volatile storage element to the first source of charge at a first time;

performing and completing a program operation for a second non-volatile storage element of the monolithic three-dimensional memory using the first source of charge by connecting a control line for the second non-volatile storage element to the first source of charge at a second time that is subsequent to the first time, the program operation for the first non-volatile storage element of the monolithic three-dimensional memory is performed concurrently with the program operation for the second non-volatile storage element of the monolithic three-dimensional memory.

7. The method of claim 6 , wherein:

the first non-volatile storage element includes a first reversible resistance-switching memory element; and

the second non-volatile storage element includes a second reversible resistance-switching memory element.

8. The method of claim 6 , wherein:

the program operation for the first non-volatile storage element and the program operation for the second non-volatile storage element both include discharging to a common control line.

9. The method of claim 6 , wherein:

the program operation for the first non-volatile storage element is started by applying a charge on the control line for the first non-volatile storage element; and

one or more control circuits for the monolithic three-dimensional memory unselect the first non-volatile storage element, select the second non-volatile storage element and start the program operation for the second non-volatile storage element while the first control line still holds at least a portion of the charge.

10. The method of claim 6 , wherein:

one or more control circuits for the monolithic three-dimensional memory start the program operation for the first non-volatile storage element by applying a charge on the control line for the first non-volatile storage element for a period of time that is insufficient to change the first non-volatile storage element from a first predetermined state to a second predetermined state;

the one or more control circuits start the program operation for the second non-volatile storage element by applying a charge on the second control line for a period of time that is insufficient to change the second non-volatile storage element from the first predetermined state to the second predetermined state; and

the one or more control circuits allow the first control line to discharge through the first non-volatile storage element in order to change the first non-volatile storage element from the first predetermined state to the second predetermined state and the one or more control circuits allow the second control line to discharge through the second non-volatile storage element in order to change the second non-volatile storage element from the first predetermined state to the second predetermined state.

11. The method of claim 6 , wherein:

the program operation for the first non-volatile storage element includes changing a resistance of the first non-volatile storage element while the first non-volatile storage element is not in communication with the first source of charge; and

the program operation for the second non-volatile storage element includes changing a resistance of the second non-volatile storage element while the second non-volatile storage element is not in communication with the first source of charge.

12. A method of programming non-volatile storage, comprising:

connecting control lines for a first set of non-volatile storage elements to a set of charge sources;

performing a program operation for the first set of non-volatile storage elements in response to the charge sources;

connecting control lines for a second set of non-volatile storage elements to the set of charge sources; and

performing a program operation for the second set of non-volatile storage elements in response to the charge sources, the program operation for the first set of non-volatile storage elements is performed concurrently with the program operation for the second set of non-volatile storage elements, the number of non-volatile storage elements of the first set and the second set that concurrently experience programming in response to the set of charge sources is greater than the number of the charge sources.

13. The method of claim 12 , wherein:

the control lines for the second set of non-volatile storage elements are connected to the set of charge sources while the control lines for the first set of non-volatile storage elements are not connected to the charge sources.

14. The method of claim 12 , wherein:

the first set of non-volatile storage elements include reversible resistance-switching memory elements; and

the second set of non-volatile storage elements include reversible resistance-switching memory elements.

15. The method of claim 12 , wherein:

the performing the program operation for the first set of non-volatile storage elements includes applying charges on the control lines for the first set of non-volatile storage elements and allowing the charges to dissipate though the first set of non-volatile storage elements; and

the performing the program operation for the second set of non-volatile storage elements includes applying charges on the control line for the second set of non-volatile storage elements and allowing the charges to dissipate though the second set of non-volatile storage elements.

16. The method of claim 12 , wherein:

the performing the program operation for the first set of non-volatile storage elements includes applying charges on the control lines for the first set of non-volatile storage elements and allowing the charges to dissipate though the first set of non-volatile storage elements; and

the performing the program operation for the second set of non-volatile storage elements is commenced while the control lines for the first set of non-volatile storage elements still hold at least a portion of the charges.

17. The method of claim 12 , wherein:

the performing the program operation for the first set of non-volatile storage elements includes applying charges on the control lines for the first set of non-volatile storage elements for a period of time that is insufficient to change the first set of non-volatile storage elements from a first predetermined state to a second predetermined state;

the performing the program operation for the second set of non-volatile storage elements includes applying charges on the control lines for the second set of non-volatile storage elements for a period of time that is insufficient to change the second set of non-volatile storage elements from the first predetermined state to the second predetermined state; and

the method further includes allowing the control lines for the first set of non-volatile storage elements to discharge through the first set of non-volatile storage elements in order to change the first set of non-volatile storage element from the first predetermined state to the second predetermined state and allowing the control lines for the second set of non-volatile storage elements to discharge through the second set of non-volatile storage elements in order to change the second set of non-volatile storage element from the first predetermined state to the second predetermined state.

18. The method of claim 17 , wherein:

the control lines for the first set of non-volatile storage elements discharge through the first set of non-volatile storage elements to a word line; and

the control lines for the second set of non-volatile storage elements discharge through the second set of non-volatile storage elements to the word line.

Assignments (9)
PARTIAL RELEASE OF SECURITY INTERESTS Recorded Apr 25, 2025
From: JPMORGAN CHASE BANK, N.A., AS AGENT
To: SANDISK TECHNOLOGIES, INC.
Reel/Frame 071382/0001 →
SECURITY AGREEMENT Recorded Apr 25, 2025
From: SANDISK TECHNOLOGIES, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 071050/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 31, 2024
From: SANDISK TECHNOLOGIES LLC
To: SANDISK TECHNOLOGIES, INC.
Reel/Frame 069796/0423 →
CHANGE OF NAME Recorded May 25, 2016
From: SANDISK TECHNOLOGIES INC
To: SANDISK TECHNOLOGIES LLC
Reel/Frame 038807/0898 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT LISTED PATENT NUMBER 8853569 TO THE CORRECT PATENT NUMBER 8883569 PREVIOUSLY RECORDED ON REEL 038300 FRAME 0665. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Apr 25, 2016
From: SANDISK 3D LLC
To: SANDISK TECHNOLOGIES INC.
Reel/Frame 038520/0552 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 30, 2016
From: SANDISK 3D LLC.
To: SANDISK TECHNOLOGIES INC.
Reel/Frame 038300/0665 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNMENT DOCUMENT THAT WAS RECORDED ON 6/29/2012. THE DOCUMENT SHOULD BE REMOVED FROM APPLICATION NO. 13/129,050 PREVIOUSLY RECORDED ON REEL 028468 FRAME 0696. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT DOCUMENT SHOULD BE RECORDED IN PROPERTY 13/537,029. Recorded Jul 10, 2013
From: YAN, TIANHONG; FASOLI, LUCA
To: SANDISK 3D LLC
Reel/Frame 030792/0590 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 9, 2013
From: YAN, TIANHONG; FASOLI, LUCA
To: SANDISK 3D LLC
Reel/Frame 030759/0402 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 29, 2012
From: YAN, TIANHONG; FASOLI, LUCA
To: SANDISK 3D LLC
Reel/Frame 028468/0696 →