IP Library Granted Patent US 9,098,155
Granted Patent B2
US 9,098,155 · App. 13/651,194 · Granted Aug 4, 2015

Self-capacitance measurement using compensation capacitor

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Quick Facts
Patent No.
US 9,098,155
App. No.
13/651,194
Granted
Aug 4, 2015
Kind
B2
Abstract

In one embodiment, a method includes dividing a first amount of charge between a measurement capacitance and a sample-and-hold capacitor resulting in a voltage at the measurement capacitance being a first voltage. The division of the first amount of charge is based at least in part on a configuration of a compensation capacitor relative to the measurement capacitance and the sample-and-hold capacitor. The configuration being determined based at least in part on an output without the compensation capacitor. The method also includes determining a first difference between the first voltage at the capacitance and a reference voltage; and determining whether a touch input to the touch sensor has occurred based at least in part on the first difference.

Claims (33)

1. A method comprising:

configuring a compensation capacitor relative to a measurement capacitance based at least in part on a value of a calibration voltage relative to a reference value, wherein configuring the compensation capacitor comprises coupling the compensation capacitor in parallel with the measurement capacitance in response to the calibration voltage being lower than the reference value;

dividing an amount of charge between the measurement capacitance, a sampling capacitor, and the compensation capacitor resulting in a voltage at the measurement capacitance being a measurement voltage, the division of the amount of charge being based at least in part on the configuration of the compensation capacitor relative to the measurement capacitance;

determining a measurement difference between the measurement voltage at the measurement capacitance and a reference value; and

determining whether a touch input to a touch sensor has occurred based at least in part on the measurement difference.

2. The method of claim 1 , further comprising determining the configuration at least in part by a value of a calibration voltage relative to the reference value, the calibration voltage being measured without the touch input and the compensation capacitance.

3. The method of claim 2 , further comprising reconfiguring the compensation capacitor relative to the measurement capacitance, wherein reconfiguring the compensation capacitor comprises coupling the compensation capacitor in series with the measurement capacitance in response to the calibration voltage becoming higher than the reference value by least a pre-determined value.

4. The method of claim 1 , wherein the determination of whether a touch input has occurred comprises comparing the measurement difference to a measurement difference without the touch input.

5. The method of claim 1 , further comprising sampling the measurement voltage through an analog-to-digital converter (ADC).

6. The method of claim 1 , further comprising pre-charging the measurement capacitance based at least in part on the configuration of the compensation capacitor relative to the measurement capacitance.

7. A computer-readable non-transitory storage medium embodying logic configured when executed to:

configure a compensation capacitor relative to a measurement capacitance based at least in part on a value of a calibration voltage relative to a reference value, wherein configuring the compensation capacitor comprises coupling the compensation capacitor in parallel with the measurement capacitance in response to the calibration voltage being lower than the reference value;

divide an amount of charge between the measurement capacitance, a sampling capacitor, and the compensation capacitor resulting in a voltage at the measurement capacitance being a measurement voltage, the division of the amount of charge being based at least in part on the configuration of the compensation capacitor relative to the measurement capacitance;

determine a measurement difference between the measurement voltage at the measurement capacitance and a reference value; and

determine whether a touch input to a touch sensor has occurred based at least in part on the measurement difference.

8. The medium of claim 7 , wherein the logic is further configured to

determine the configuration at least in part by a value of a calibration voltage relative to the reference value, the calibration voltage being measured without the touch input and the compensation capacitance.

9. The medium of claim 8 , wherein the logic is further configured to reconfigure the compensation capacitor relative to the measurement capacitance, wherein reconfiguring the compensation capacitor comprises coupling the compensation capacitor in series with the measurement capacitance in response to the calibration voltage becoming higher than the reference value by least a pre-determined value.

10. The medium of claim 7 , wherein the logic is further configured to compare the measurement difference to a measurement difference without the touch input.

11. The medium of claim 7 , wherein the logic is further configured to sample the measurement voltage through an analog-to-digital converter (ADC).

12. The medium of claim 7 , wherein the logic is further configured to pre-charge the measurement capacitance based at least in part on the configuration of the compensation capacitor relative to the measurement capacitance.

13. A device comprising:

a measurement circuit; and

a computer-readable non-transitory storage medium coupled to the measurement circuit and embodying logic configured when executed to:

configure a compensation capacitor relative to a measurement capacitance based at least in part on a value of a calibration voltage relative to a reference value, wherein configuring the compensation capacitor comprises coupling the compensation capacitor in parallel with the measurement capacitance in response to the calibration voltage being lower than the reference value;

divide an amount of charge between the measurement capacitance, a sampling capacitor, and the compensation capacitor resulting in a voltage at the measurement capacitance being a measurement voltage, the division of the amount of charge being based at least in part on the configuration of the compensation capacitor relative to the measurement capacitance;

determine a measurement difference between the measurement voltage at the measurement capacitance and a reference value; and

determine whether a touch input to a the touch sensor has occurred based at least in part on the measurement difference.

14. The device of claim 13 , wherein the logic is further configured to

determine the configuration at least in part by a value of a calibration voltage relative to the reference value, the calibration voltage being measured without the touch input and the compensation capacitance.

15. The device of claim 14 , wherein the logic is further configured to reconfigure the compensation capacitor relative to the measurement capacitance, wherein reconfiguring the compensation capacitor comprises coupling the compensation capacitor in series with the measurement capacitance in response to the calibration voltage becoming higher than the reference value by least a pre-determined value.

16. The device of claim 13 , wherein the logic is further configured to compare the measurement difference to a measurement difference without the touch input.

17. The device of claim 13 , wherein the logic is further configured to pre-charge the measurement capacitance based at least in part on the configuration of the compensation capacitor relative to the measurement capacitance.

Assignments (19)
RELEASE OF SECURITY INTEREST Recorded Mar 14, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 060894/0437 →
RELEASE OF SECURITY INTEREST Recorded Mar 11, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059363/0001 →
RELEASE OF SECURITY INTEREST Recorded Mar 10, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059863/0400 →
RELEASE OF SECURITY INTEREST Recorded Mar 9, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059358/0001 →
RELEASE OF SECURITY INTEREST Recorded Feb 28, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: ATMEL CORPORATION
Reel/Frame 059262/0105 →
RELEASE OF SECURITY INTEREST Recorded Feb 25, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059333/0222 →
SECURITY INTEREST Recorded Jun 4, 2021
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 057935/0474 →
SECURITY INTEREST Recorded Dec 24, 2020
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 055671/0612 →
SECURITY INTEREST Recorded Jun 5, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION
Reel/Frame 053468/0705 →
RELEASE OF SECURITY INTEREST Recorded May 30, 2020
From: JPMORGAN CHASE BANK, N.A, AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 053466/0011 →
SECURITY INTEREST Recorded Apr 24, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 053311/0305 →
SECURITY INTEREST Recorded Sep 18, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 047103/0206 →
SECURITY INTEREST Recorded Jun 25, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 046426/0001 →
SECURITY INTEREST Recorded Feb 10, 2017
From: ATMEL CORPORATION
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 041715/0747 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT COLLATERAL Recorded Apr 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: ATMEL CORPORATION
Reel/Frame 038376/0001 →
PATENT SECURITY AGREEMENT Recorded Jan 3, 2014
From: ATMEL CORPORATION
To: MORGAN STANLEY SENIOR FUNDING, INC. AS ADMINISTRATIVE AGENT
Reel/Frame 031912/0173 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 17, 2013
From: ATMEL TECHNOLOGIES IRELAND LIMITED
To: ATMEL CORPORATION
Reel/Frame 030436/0467 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 12, 2012
From: WHELAN, RIAN
To: ATMEL TECHNOLOGIES IRELAND LIMITED
Reel/Frame 029123/0764 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 12, 2012
From: HANSSEN, INGAR
To: ATMEL CORPORATION
Reel/Frame 029123/0746 →