IP Library Granted Patent US 9,507,369
Granted Patent B2
US 9,507,369 · App. 14/040,431 · Granted Nov 29, 2016

Dynamically adjusting supply voltage based on monitored chip temperature

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,507,369
App. No.
14/040,431
Granted
Nov 29, 2016
Kind
B2
Abstract

In an embodiment, a method includes monitoring a temperature of a semiconductor chip and adjusting a supply voltage to the semiconductor chip based on the monitored temperature. The temperature may be monitored by a temperature sensor located on-chip or off-chip. Adjusting the supply voltage includes increasing the supply voltage as a function of the monitored temperature decreasing. The increase to the supply voltage occurs only if the monitored temperature is below a threshold temperature. The supply voltage adjustment is determined by a linear relationship having a negative slope with temperature.

Claims (20)

1. A method comprising:

monitoring a temperature of a semiconductor chip;

adjusting a supply voltage to the semiconductor chip by increasing the supply voltage as a continuous function of the monitored temperature decreasing, wherein adjusting the supply voltage occurs only if the monitored temperature is below a threshold temperature and the supply voltage adjusted is determined based on a linear relationship having a negative slope between the supply voltage and the monitored temperature as defined by the continuous function.

2. The method of claim 1 wherein the temperature is monitored by an on-chip temperature sensor.

3. The method of claim 1 wherein the temperature is monitored by an off-chip temperature sensor.

4. The method of claim 1 wherein the negative slope is a programmable value and the method further comprises controlling the linear relationship having the negative slope by writing to a register to change the programmable value.

5. Apparatus comprising:

a temperature sensor for monitoring a temperature of a semiconductor chip;

a controller configured to adjust a supply voltage to the semiconductor chip by increasing the supply voltage as a continuous function of the monitored temperature decreasing, wherein the controller is configured to adjust the supply voltage only if the monitored temperature is below a threshold temperature and the supply voltage adjusted is determined based on a linear relationship having a negative slope between the supply voltage and the monitored temperature as defined by the continuous function.

6. The apparatus of claim 5 wherein the temperature sensor and the controller are located on the semiconductor chip.

7. The apparatus of claim 5 wherein the temperature sensor and the controller are located off the semiconductor chip.

8. The apparatus of claim 5 wherein the controller is configured to send a control signal to a voltage regulator module (VRM) to cause the VRM to adjust the supply voltage.

9. The apparatus of claim 5 further comprising an on-chip thermal diode coupled to the temperature sensor that monitors a junction temperature on the chip.

10. The apparatus of claim 5 wherein the negative slope is a programmable value, the apparatus further comprises a register, and the controller is further configured to control the linear relationship having the negative slope by writing to a register to change the programmable value.

11. Apparatus comprising:

means for monitoring a temperature of a semiconductor chip;

means for adjusting a supply voltage to the semiconductor chip including means for increasing the supply voltage as a continuous function of the monitored temperature decreasing, wherein the means for increasing the supply voltage operates to adjust only if the monitored temperature is below a threshold temperature and the supply voltage adjusted is determined based on a linear relationship having a negative slope between the supply voltage and the monitored temperature as defined by the continuous function.

12. The apparatus of claim 11 wherein the means for monitoring is an on-chip temperature sensor.

13. The apparatus of claim 11 wherein the means for monitoring is an off-chip temperature sensor.

14. The apparatus of claim 11 wherein the negative slope is a programmable value and the apparatus further comprises a means for controlling the linear relationship having the negative slope by writing to a register to change the programmable value.

Assignments (6)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 15, 2020
From: CAVIUM INTERNATIONAL
To: MARVELL ASIA PTE, LTD.
Reel/Frame 053179/0320 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 17, 2020
From: CAVIUM, LLC
To: CAVIUM INTERNATIONAL
Reel/Frame 051948/0807 →
CERTIFICATE OF CONVERSION AND CERTIFICATE OF FORMATION Recorded Oct 2, 2018
From: CAVIUM, INC.
To: CAVIUM, LLC
Reel/Frame 047185/0422 →
RELEASE OF SECURITY INTEREST Recorded Jul 6, 2018
From: JP MORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: CAVIUM, INC; CAVIUM NETWORKS LLC; QLOGIC CORPORATION
Reel/Frame 046496/0001 →
SECURITY AGREEMENT Recorded Aug 17, 2016
From: CAVIUM, INC.; CAVIUM NETWORKS LLC
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 039715/0449 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 15, 2013
From: CARLSON, DAVID A.; SALVI, MANAN; MILLER, CURTIS
To: CAVIUM, INC.
Reel/Frame 031611/0722 →