Systems and methods for testing electronic devices that include low power output drivers
View Patent ↗Systems and methods for testing a device under test (DUT) that includes a low power output driver. The methods include providing an input signal to the DUT. The low power output driver is configured to generate a data signal responsive to receipt of the input signal by the DUT and provide the data signal to a signal analyzer via a data signal transmission line. The methods further include determining an expected data signal to be received from the low power output driver and charging at least a portion of the data signal transmission line with a co-drive output signal that is based, at least in part, on the expected data signal. The methods further include receiving a composite data signal with the signal analyzer. The systems include probe heads with a plurality of data signal transmission lines and a plurality of co-drive conductors.
1. A probe head for electrically testing a device under test (DUT) having a plurality of low power output drivers, the probe head comprising:
a plurality of data signal transmission lines configured to convey a plurality of data signals from the plurality of low power output drivers to a signal generation and analysis assembly (SGAA), wherein each of the plurality of data signal transmission lines includes a DUT-proximal end, and a SGAA-proximal end;
an input signal supply structure configured to convey an input signal from the SGAA to the DUT, wherein the plurality of low power output drivers is configured to generate the plurality of data signals responsive to receipt of the input signal by the DUT; and
a plurality of co-drive conductors, wherein each of the plurality of co-drive conductors is in electrical communication with a respective one of the plurality of data signal transmission lines and is configured to provide a respective co-drive output signal to the respective one of the plurality of data signal transmission lines, wherein the respective co-drive output signal is based, at least in part, on an expected value of a respective data signal of the plurality of data signals to be conveyed by the respective one of the plurality of data signal transmission lines.
2. The probe head of claim 1 , wherein each of the plurality of data signal transmission lines includes a signal conductor and a corresponding guard conductor, wherein the signal conductor extends between the DUT-proximal end and the SGAA-proximal end.
3. The probe head of claim 1 , wherein each of the plurality of co-drive conductors is directly attached to and in electrical communication with the DUT-proximal end of the respective one of the plurality of data signal transmission lines.
4. The probe head of claim 3 , wherein each of the plurality of co-drive conductors is directly attached to and in electrical communication with a respective guard conductor of the respective one of the plurality of data signal transmission lines.
5. The probe head of claim 3 , wherein each of the plurality of co-drive conductors is directly attached to and in electrical communication with a respective signal conductor of the respective one of the plurality of data signal transmission lines.
6. The probe head of claim 1 , wherein each of the plurality of co-drive conductors is directly attached to and in electrical communication with the SGAA-proximal end of the respective one of the plurality of data signal transmission lines.
7. The probe head of claim 6 , wherein each of the plurality of co-drive conductors is directly attached to and in electrical communication with a respective guard conductor of the respective one of the plurality of data signal transmission lines.
8. The probe head of claim 6 , wherein each of the plurality of co-drive conductors is directly attached to and in electrical communication with a respective signal conductor of the respective one of the plurality of data signal transmission lines.
9. A test system for electrically testing a device under test (DUT) having a plurality of low power output drivers, the test system comprising:
a signal generation and analysis assembly (SGAA);
the probe head of claim 1 ; and
a co-drive assembly that is configured to provide a plurality of co-drive output signals to the plurality of co-drive conductors.
10. The probe head of claim 1 , wherein a length of each of the plurality of data signal transmission lines is an integer multiple of a wavelength of the co-drive output signal that is conveyed therein plus a threshold fraction of the wavelength of the co-drive output signal.
11. The probe head of claim 10 , wherein the threshold fraction of the wavelength of the co-drive output signal is at least 25% and less than 75% of the wavelength of the co-drive output signal.