Methods for operating a memory interface circuit including calibration for CAS latency compensation in a plurality of byte lanes
View Patent ↗A method for quickly calibrating a memory interface circuit from time to time in conjunction with operation of a functional circuit is described. The method uses controlling the memory interface circuit with respect to read data capture for byte lanes, including controlling CAS latency compensation for the byte lanes. In the method control settings for controlling CAS latency compensation are determined and set according to a dynamic calibration procedure performed from time to time in conjunction with functional operation of a circuit system containing one or more memory devices connected to the memory interface circuit. In the method, determining and setting the control settings for controlling CAS latency compensation is performed independently and parallely in each of the byte lanes.
1. A method for quickly calibrating a memory interface circuit from time to time in conjunction with operation of a functional circuit, comprising:
controlling the memory interface circuit with respect to read data capture for a plurality of byte lanes, including controlling CAS latency compensation for the plurality of byte lanes;
wherein control settings for controlling CAS latency compensation are determined and set according to a dynamic calibration procedure performed from time to time in conjunction with functional operation of a circuit system containing one or more memory devices connected to the memory interface circuit; and
wherein determining and setting the control settings for controlling CAS latency compensation is performed independently and parallely in each of the plurality of byte lanes.
2. The method of claim 1 , wherein the memory interface circuit includes one or more read data delay circuits for implementing CAS latency compensation; and
the one or more read data delay circuits comprise at least two or more clocked storage elements.
3. The method of claim 2 , wherein a plurality of clocked storage elements among the at least two or more clocked storage elements are in series.
4. The method of claim 3 , wherein the one or more read data delay circuits for controlling CAS latency compensation delay read data by variable numbers of clock edges according to the control settings.
5. The method of claim 1 , further comprising:
storing, in one or more expected read data memories separate from the one or more memory devices connected to the memory interface circuit, data values corresponding to expected values for read data at one or more specific CAS latency compensation delay settings.
6. The method of claim 5 , wherein the one or more expected read data memories are located within a host device containing the memory interface circuit.
7. The method of claim 5 wherein determining and setting CAS latency compensation independently and parallely in each of the plurality of byte lanes further comprises for each of the plurality of byte lanes independently and in parallel:
reading a known data pattern previously saved or located in the one or more memory devices connected to the memory interface circuit;
iteratively capturing read data from the one or more memory devices at different CAS latency compensation control settings;
when for one of the plurality of byte lanes, the captured read data matches an expected read data value at a specific CAS latency compensation control setting, recording the specific CAS latency compensation control setting as an optimum CAS latency compensation control setting for that byte lane; and
programming control settings to produce the optimum CAS latency compensation for the byte lane into one or more control registers in the memory interface circuit.
8. The method of claim 7 , wherein iteratively capturing read data from the one or more memory devices at different pre-determined CAS latency compensation control settings is performed by varying CAS latency compensation delay settings from a minimum to a maximum CAS latency compensation delay setting.
9. The method of claim 7 , wherein determining CAS latency compensation independently and parallely in each of the plurality of byte lanes further comprises for each of the plurality of byte lanes independently and in parallel:
delaying a captured read data bit by enabling different ones of a plurality of flip-flops at different points in time according to at least one cycle counter; and
comparing outputs of the plurality of flip-flops with expected read data values provided by the one or more expected read data memories.
10. The method of claim 7 , wherein when the known data pattern is previously saved or located in the one or more memory devices connected to the memory interface circuit, application data contained in the one or more memory devices is temporarily moved to one or more different locations.
11. The method of claim 10 , wherein said one or more different locations includes at least one location contained within a host device containing the memory interface circuit.
12. The method of claim 1 , wherein one or more capture clocks capture read data received from one or more memory devices connected to the memory interface circuit.
13. The method of claim 12 , wherein the one or more capture clocks are derived from one or more core clocks originating within a host device containing the memory interface circuit.
14. A method for operating one or more controller circuits for a memory interface circuit, comprising:
controlling, by the one or more controller circuits, one or more read data delay circuits for controlling CAS latency compensation for a plurality of byte lanes; and
wherein control settings for the one or more read data delay circuits for controlling CAS latency compensation are determined and set independently and parallely in each of a plurality of byte lanes during a calibration procedure performed from time to time in conjunction with functional operation of a circuit containing one or more memory devices connected to the memory interface circuit.
15. The method of claim 14 wherein determining control settings for the one or more read data delay circuits for controlling CAS latency compensation, includes:
storing a test data pattern in the one or more memory devices;
iteratively capturing read data comprising at least part of the test data pattern from the one or more memory devices connected to the memory interface circuit, wherein the iteratively capturing is performed at different CAS latency compensation control settings; and
comparing the iteratively captured read data with expected read data values previously stored in an expected read data memory, wherein the expected read data memory is separate from the one or more memory devices.
16. The method of claim 15 , further comprising:
for a particular byte lane, when the captured read data matches an expected read data value at a specific CAS latency compensation control setting, recording the specific CAS latency compensation control setting as an optimum CAS latency compensation control setting for that byte lane.
17. The method of claim 16 , wherein the one or more read data delay circuits for controlling CAS latency compensation delay read data by variable numbers of clock edges according to the optimum CAS latency compensation control setting for that byte lane.
18. The method of claim 15 , wherein the expected read data memory for storing expected read data values is located within a host device containing the memory interface circuit.
19. The method of claim 15 , wherein the one or more read data delay circuits for controlling CAS latency compensation comprise at least two or more clocked storage elements.
20. The method of claim 19 , wherein a plurality of clocked storage elements among the at least two or more clocked storage elements are in series.