IP Library Granted Patent US 9,956,722
Granted Patent B2
US 9,956,722 · App. 14/245,566 · Granted May 1, 2018

Method and device for thermocompression bonding

Inventor: Murota Tsukasa (Shizuoka, JP)
Assignee: STRATEC CONSUMABLES GMBH
B29C65/1412B01L3/502707B29C65/18B29C66/026B29C66/028B29C66/0242B29C66/343B29C66/3494B29C66/54B29C66/91411B29C66/91443B29C66/91445B29C66/91935B29C66/91945B29C66/91951B29C66/92443B29C66/92921B81C3/001B01L2300/168B29C65/006B29C65/7841B29C65/8253B29C66/71B29C66/73365B29C66/919B29K2995/0027B29L2031/756B81B2201/058B81C2203/037
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Quick Facts
Patent No.
US 9,956,722
App. No.
14/245,566
Granted
May 1, 2018
Kind
B2
Abstract

There are provided a method and device for thermocompression bonding of possibly preventing any warping of a resin member to be caused by thermocompression bonding, and of possibly reducing the time to be taken for processing. The method for thermocompression bonding, includes: preheating a resin member using an infrared radiation section; and subjecting the resin member to thermocompression bonding using a heating section and a pressurization section.

Claims (14)

1. A device for thermocompression bonding, comprising:

a preheating section including an infrared radiation section, wherein the preheating section is configured to uniformly expose a chip component with micro fluid paths comprising a resin member to radiation having a wavelength at which said resin member has a transmittance of between 80% and 100% for a time sufficient to produce a surface-side temperature of the resin member substantially the same as an undersurface-side temperature of the resin member and thereby limit warping of the resin member;

a thermocompression-bonding section comprising a heating section and a pressurization section, wherein the pressurization section comprises upper and lower compression-bonding heads for pressing two chip components received from said preheating section against one another and wherein the heating section is configured to heat the upper and lower compression-bonding heads not to reach a melting point of a crystalline resin or not to reach to reach a glass transition of a noncrystalline resin; and

a transfer section transferring the resin member to the thermocompression-bonding section from the preheating section while the resin member remains in a preheated state.

2. The device of claim 1 , further comprising a chip component supply and discharge section configured to supply chip components to the preheating section and the thermocompression-bonding section.

3. The device of claim 2 , further comprising a surface treatment section adapted to subject the chip component supplied from the chip component supply and discharge section to a surface treatment.

4. The device of claim 3 , further comprising an inspection section including a fluid path inspection section and a defect inspection section.

5. The device of claim 4 , wherein the fluid path inspection section includes a sensor for sensing a microfluid path within the resin member.

6. The device of claim 4 , wherein the defect inspection section includes an image processing device adapted to identify defects within the resin member.

7. The device of claim 1 , wherein the resin member has an infrared transmittance of 85% or higher but lower than 95% except at the wavelength range where the absorption peak exists.

8. A device for thermocompression bonding, comprising:

a preheating section including an infrared radiation section, wherein the preheating section is configured to uniformly expose a chip component with micro fluid paths comprising a resin member to radiation having a wavelength at which said resin member has a transmittance of between 80% and 100%, excepting at a peak of absorption, for a time sufficient to produce a surface-side temperature of the resin member substantially the same as an undersurface-side temperature of the resin member and thereby limit warping of the resin member, wherein the resin member has an infrared transmittance of 40% or higher but lower than 100% at the wavelength range where the absorption peak exists;

a thermocompression-bonding section comprising a heating section and a pressurization section, wherein the pressurization section comprises upper and lower compression-bonding heads for pressing two chip components received from said preheating section against one another and wherein the heating section is configured to heat the upper and lower compression-bonding heads not to reach a melting point of a crystalline resin or not to reach to reach a glass transition of a noncrystalline resin; and

a transfer section transferring the resin member to the thermocompression-bonding section from the preheating section while the resin member remains in a preheated state.

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 17, 2017
From: SONY CORPORATION
To: SONY DADC BIOSCIENCES GMBH
Reel/Frame 043211/0862 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 17, 2017
From: SONY DADC JAPAN INC
To: SONY CORPORATION
Reel/Frame 043211/0879 →
CHANGE OF NAME Recorded Jul 17, 2017
From: SONY DADC BIOSCIENCES GMBH
To: STRATEC CONSUMABLES GMBH
Reel/Frame 043211/0930 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 1, 2014
From: MUROTA, TSUKASA
To: SONY CORPORATION; SONY DADC CORPORATION
Reel/Frame 033448/0334 →
Priority Claims (1)
JP 2010-233935 · Oct 18, 2010 · national
Continuity (2)
Continuation 13270605 · Oct 11, 2011
Related Publication 20140216659A1 · Aug 7, 2014