Semiconductor device package for debugging and related fabrication methods
View Patent ↗Electronic device packages and related fabrication methods are provided. An exemplary electronic device includes a semiconductor die having debug circuitry fabricated thereon, a framing structure including an interior portion having the semiconductor die mounted thereto, and a conductive element providing an electrical connection between the interior portion and a contact pad on the semiconductor die that corresponds or is otherwise coupled to an interface of the debug circuitry.
1. An electronic device comprising:
a semiconductor die having debug circuitry fabricated thereon, the semiconductor die comprising a contact pad coupled to the debug circuitry;
a framing structure including a package interface portion and an interior portion, the interior portion having an edge inwardly offset from the package interface portion and the interior portion having the semiconductor die mounted thereto, wherein an edge of the semiconductor die is inwardly offset from the edge of the interior portion; and
a conductive element providing an electrical connection between the contact pad and an accessible portion of the interior portion between the edge of the semiconductor die and the edge of the interior portion.
2. The electronic device of claim 1 , wherein a lateral area of the semiconductor die is less than a lateral area of the interior portion.
3. The electronic device of claim 1 , wherein the edge of the interior portion is inwardly offset from a periphery of the framing structure.
4. The electronic device of claim 1 , further comprising an electrically-insulating adhesive material joining the semiconductor die to the interior portion.
5. The electronic device of claim 1 , wherein:
the semiconductor die exposes a bonding portion of the interior portion; and
the conductive element comprises a wire bond between the bonding portion and the contact pad.
6. The electronic device of claim 1 , further comprising a second conductive element, wherein:
the semiconductor die includes a second contact pad coupled to the debug circuitry;
the framing structure includes a second mounting portion having the semiconductor die mounted thereto; and
the second conductive element provides a second electrical connection between the second contact pad and the second mounting portion.
7. The electronic device of claim 6 , wherein the contact pad receives a clock signal from the debug circuitry and the second contact pad receives a data signal from the debug circuitry.
8. The electronic device of claim 1 , further comprising functional circuitry fabricated on the semiconductor die, wherein the debug circuitry is coupled to the functional circuitry to provide an output signal at the contact pad that is influenced by operation of the functional circuitry.
9. The electronic device of claim 8 , wherein the framing structure includes one or more package interface elements electrically connected to the functional circuitry fabricated on the semiconductor die and electrically isolated from the debug circuitry.
10. A semiconductor device package comprising:
a semiconductor die having functional circuitry and debug circuitry fabricated thereon, the debug circuitry being coupled to the functional circuitry, and configured to debug the functional circuitry, wherein the semiconductor die comprises a contact pad coupled to the debug circuitry;
a lead frame structure comprising one or more leads coupled to the functional circuitry and a pad portion having the semiconductor die mounted thereto, wherein the one or more leads are disposed about a perimeter of the lead frame structure and the pad portion is inwardly offset from the one or more leads of the lead frame structure; and
a conductive element configured to provide an electrical connection between the contact pad and the pad portion.
11. The semiconductor device package of claim 10 , wherein a lateral area of the semiconductor die is less than a lateral area of the pad portion.
12. The semiconductor device package of claim 10 further comprising an electrically-insulating adhesive material affixing the semiconductor die to the pad portion.
13. The semiconductor device package of claim 10 , further comprising a second conductive element providing a second electrical connection between a ground contact pad for the functional circuitry and the pad portion.
14. The semiconductor device package of claim 10 , further comprising a second conductive element, wherein the lead frame structure includes a second pad portion having the semiconductor die mounted thereto and the second conductive element provides a second electrical connection between a second contact pad coupled to the debug circuitry and the second pad portion.
15. The semiconductor device package of claim 10 , further comprising an encapsulating material overlying the semiconductor die and the conductive element, the encapsulating material electrically isolating the conductive element from the one or more leads.
16. A method of fabricating an electronic device, the method comprising:
mounting a semiconductor die to an interior mounting portion of a framing structure inwardly offset from a package interface portion of the framing structure using an electrically-insulating adhesive material, wherein:
the semiconductor die comprises functional circuitry and debug circuitry fabricated thereon, and
the debug circuitry is coupled to the functional circuitry and configured to debug the functional circuitry; and
providing a wire bond between a contact pad on the semiconductor die coupled to the debug circuitry and the interior mounting portion.
17. The method of claim 16 , further comprising forming an encapsulating material overlying the semiconductor die and electrically isolating one or more package interfaces for the electronic device from the debug circuitry.