Detection of gate-to-source/drain shorts

1. A semiconductor test structure for detecting raised source/drain regions-gate electrode shorts, comprising:

a semiconductor substrate;

field effect transistors (FETs) formed on said semiconductor substrate;

raised source/drain regions of said FETs formed on said semiconductor substrate;

a gate electrode structure comprising multiple gate electrodes of said FETs arranged in parallel to each other;

a first electrical terminal electrically connected to said gate electrode structure;

dummy gates outside of said gate electrode structure and arranged adjacent to and parallel to outermost gate electrodes of said gate electrode structure;

rectangular contacts formed adjacent said dummy gates and contacting said raised source/drain regions; and

a second electrical terminal electrically connected to said rectangular contacts;

and wherein no electrical contacts to said raised source/drain regions are present between said multiple gate electrodes of said gate electrode structure.

2. The semiconductor test structure of claim 1 , wherein said semiconductor substrate is a Fully Depleted Silicon-on-Insulator (FDSOI) substrate.

3. The semiconductor test structure of claim 1 , wherein said raised source/drain regions are formed on a semiconductor layer of said semiconductor substrate.

4. The semiconductor test structure of claim 1 , wherein said gate electrode structure is fork-shaped.

5. The semiconductor test structure of claim 1 , wherein:

said dummy gates comprise:

a first dummy gate outside of said gate electrode structure and arranged adjacent to and parallel to a first outermost gate electrode of said gate electrode structure; and

a second dummy gate outside of said gate electrode structure and arranged adjacent to and parallel to a second outermost gate electrode of said gate electrode structure;

wherein said rectangular contacts comprise first rectangular contacts formed partially over said first dummy gate and contacting a first subset of said raised source/drain regions, and second rectangular contacts formed partially over said second dummy gate and contacting a second subset of said raised source/drain regions;

wherein said second electrical terminal is electrically connected to said first rectangular contacts; and

the semiconductor test structure further comprises a third electrical terminal electrically connected to said second rectangular contacts.

6. A semiconductor test structure for detecting raised source/drain regions-gate electrode shorts of field effect transistors (FETS) for a Fully Depleted Silicon-on-Insulator (FDSOI) substrate, comprising:

a fork-shaped gate electrode structure comprising fork arms and a fork handle;

raised source/drain regions of said FETs formed on a semiconductor substrate of said FDSOI substrate; and

a first electrical terminal connected to said fork handle;

a first dummy gate outside of said fork-shaped gate electrode structure and arranged adjacent to and parallel to a first outermost fork arm of said fork-shaped gate electrode structure;

a second dummy gate outside of said fork-shaped gate electrode structure and arranged adjacent to and parallel to a second outermost fork arm of said fork-shaped gate electrode structure;

first rectangular contacts formed adjacent said first dummy gate and contacting a first subset of said raised source/drain regions; and

second rectangular contacts formed adjacent said second dummy gate and contacting a second subset of said raised source/drain regions;

and wherein no electrical contacts are formed between said fork arms of said fork-shaped gate electrode structure.

7. The semiconductor test structure of claim 6 , further comprising a second electrical terminal electrically connected to said first and second rectangular contacts.

8. The semiconductor test structure of claim 6 , further comprising a second electrical terminal electrically connected to said first rectangular contacts and a third electrical terminal electrically connected to said second rectangular contacts.

9. A method for detecting failures of field effect transistors (FETs) formed on a semiconductor substrate, said FETs being susceptible to electrical shorts between gate electrodes and raised source/drain regions of said FETs, the method comprising:

providing a semiconductor test structure with FETs formed on a Fully Depleted Silicon-on-Insulator (FDSOI) substrate, raised source/drain regions of said FETs formed on said FDSOI substrate and a gate electrode structure comprising multiple gate electrodes of said FETs arranged in parallel to each other and without electrical contacts to said raised source/drain regions being present between said multiple gate electrodes of said gate electrode structure;

applying one of a power supply voltage and ground to said gate electrode structure and the other of said power supply voltage and said ground to said raised source/drain regions; and

measuring leakage currents at one of a terminal connected to said gate electrode structure and said raised source/drain regions.

10. The method of claim 9 , wherein said gate electrode structure is fork-shaped.

11. The method of claim 9 , wherein said provided test structure comprises rectangular contacts to said source/drain regions positioned outside of said gate electrode structure, and the method further comprises applying one of said power supply voltage and said ground to said rectangular contacts.

12. The method of claim 9 , wherein said provided test structure comprises dummy gates positioned outside of said gate electrode structure and rectangular contacts partially formed over said dummy gates and contacting said raised source/drain regions, and the method further comprises applying one of said power supply voltage and said ground to said rectangular contacts.

13. The semiconductor device test structure of claim 1 , wherein said rectangular contacts at least partially overlap said dummy gates.

14. The semiconductor device test structure of claim 1 , wherein said rectangular contacts do not overlap said dummy gates.

15. The semiconductor device test structure of claim 6 , wherein said first and second rectangular contacts do not overlap said first and second dummy gates, respectively.

16. The semiconductor device test structure of claim 6 , wherein said first and second rectangular contacts at least partially overlap said first and second dummy gates, respectively.