Method of forming a semiconductor die cutting tool
In one embodiment, a method of singulating semiconductor die from a semiconductor wafer includes forming a material on a surface of a semiconductor wafer and reducing a thickness of portions of the material. Preferably, the thickness of the material is reduced near where singulation openings are to be formed in the semiconductor wafer.
1. A method of forming a tool for a semiconductor wafer comprising:
forming the tool to reduce a thickness of a semiconductor material formed on a semiconductor wafer;
forming the tool with a cutting tip and cutting surfaces that are configured to penetrate into the semiconductor material to form reduced thickness regions in the semiconductor material including forming some of the cutting surfaces to intersect and form a cutting volume; and
forming an accumulation region of the tool with a recess having a first volume for accepting portions of the semiconductor material displaced from within the semiconductor material by the penetration wherein the first volume is no less than the cutting volume.
2. The method of claim 1 further including forming the cutting tip and a the cutting surface adjacent to the cutting tip and extending from the cutting tip toward a central support section and terminating in a distal end of the cutting surface wherein the cutting surface is attached to the central support section.
3. The method of claim 2 further including forming a depth stop spaced a first distance from the cutting tip toward the central support section wherein a cutting volume is formed by a portion of the cutting surface extending from the cutting tip to the depth stop and wherein the cutting volume is approximately equal to the first volume.
4. The method of claim 2 including forming the accumulation region as a recess disposed within a central support section, the accumulation region positioned adjacent to an end of a cutting surface of the cutting surfaces and extending from the distal end into the central support section.
5. The method of claim 2 further including forming the cutting tip and cutting surfaces for being rolled along a surface of the semiconductor wafer, and forming the cutting surface attached to a central support section having a surface that forms a depth stop to limit the depth that the cutting tip extends into the semiconductor wafer.