Die testing using top surface test pads
Timely testing of die on wafer reduces the cost to manufacture ICs. This disclosure describes a die test structure and process to reduce test time by adding test pads on the top surface of the die. The added test pads allow a tester to probe and test more circuits within the die simultaneously. Also, the added test pads contribute to a reduction in the amount of test wiring overhead traditionally required to access and test circuits within a die, thus reducing die size.
1. An integrated circuit comprising:
(a) die pads;
(b) a first embedded circuit having an input terminal and an output terminal;
(c) a first lead coupling the input terminal of the first embedded circuit only to a first die pad;
(d) a second embedded circuit having an input terminal and an output terminal;
(e) a second lead coupling the output terminal of the second embedded circuit only to a second die pad separate from the first die pad;
(f) a third embedded circuit having an input terminal and an output terminal;
(g) a third lead coupling the output terminal of the first embedded circuit to the input terminal of the third embedded circuit and being unconnected with the die pads;
(h) a fourth lead coupling the output terminal of the third embedded circuit to the input terminal of the second embedded circuit and being unconnected with the die pads; and
(i) test pads coupled to the third and fourth leads.
2. The integrated circuit of claim 1 in which the die pads are input and output pads for connection with external circuitry.
3. The integrated circuit of claim 1 in which the first embedded circuit is one of a digital signal processor core, a microprocessor core, mixed signal circuitry, peripheral circuitry, and memory circuitry.
4. The integrated circuit of claim 1 in which the second embedded circuit is one of a digital signal processor core, a microprocessor core, mixed signal circuitry, peripheral circuitry, and memory circuitry.
5. The integrated circuit of claim 1 in which the third and fourth leads carry internal functional signals between the first embedded circuit, the second embedded circuit, and the third embedded circuit, and the internal functional signals are unavailable at the die pads.
6. The integrated circuit of claim 1 in which the test pads carry only test signals and provide no functional communication to circuits external the integrated circuit.
7. The integrated circuit of claim 1 including additional test pads coupled with the die pads.