IP Library Granted Patent US 9,496,495
Granted Patent B2
US 9,496,495 · App. 15/176,609 · Granted Nov 15, 2016

Memory cells and methods of forming memory cells

Inventors: Martin Schubert (Sunnyvale, CA); Shu Qin (Boise, ID); Scott E. Sills (Boise, ID); Durai Vishak Nirmal Ramaswamy (Boise, ID); Allen McTeer (Eagle, ID); Yongjun Jeff Hu (Boise, ID)
Assignee: Micron Technology, Inc.
H01L45/1608H01L45/085H01L45/1233H01L45/1266H01L45/141H01L45/146
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Quick Facts
Patent No.
US 9,496,495
App. No.
15/176,609
Granted
Nov 15, 2016
Kind
B2
Abstract

Some embodiments include a memory cell having a first electrode, and an intermediate material over and directly against the first electrode. The intermediate material includes stabilizing species corresponding to one or both of carbon and boron. The memory cell also has a switching material over and directly against the intermediate material, an ion reservoir material over the switching material, and a second electrode over the ion reservoir material. Some embodiments include methods of forming memory cells.

Claims (23)

1. A method of forming a memory cell, comprising:

forming a first electrode material within an opening in an electrically insulative material and over the electrically insulative material;

removing the first electrode material from over the electrically insulative material with a planarization process; the planarization process forming a first electrode from the first electrode material and forming a planarized surface extending across the first electrode and the electrically insulative material;

forming an intermediate material across the planarized surface, the intermediate material comprising stabilizing species corresponding to one or both of carbon and boron;

forming a switching material over and directly against the intermediate material;

forming an ion reservoir material over the switching material;

forming a second electrode over the ion reservoir material; and

wherein the intermediate material comprise a bottom surface directly against the first electrode, and an upper surface above the bottom surface; and wherein the upper surface comprises a total concentration of said stabilizing species of from about 15 atomic percent to about 100 atomic percent.

2. The method of claim 1 wherein the upper surface comprises a total concentration of said stabilizing species of from about 90 atomic percent to about 100 atomic percent.

3. A method of forming a memory cell, comprising:

forming a first electrode material within an opening in an electrically insulative material and over the electrically insulative material;

removing the first electrode material from over the electrically insulative material with a planarization process; the planarization process forming a first electrode from the first electrode material and forming a planarized surface extending across the first electrode and the electrically insulative material;

forming an intermediate material along the planarized surface, the intermediate material comprising stabilizing species corresponding to one or both of carbon and boron;

forming a switching material over and directly against the intermediate material;

forming an ion reservoir material over the switching material;

forming a second electrode over the ion reservoir material; and

wherein the intermediate material is formed utilizing plasma doping of the stabilizing species.

4. The method of claim 3 wherein the intermediate material comprises a gradient of stabilizing species concentration, with said concentration being lowest at a bottom surface of the intermediate material along the planarized surface, and highest at an upper surface of the intermediate material.

5. The method of claim 4 wherein the upper surface of the intermediate material comprises a total concentration of said stabilizing species of from about 15 atomic percent to about 100 atomic percent.

6. The method of claim 4 wherein the upper surface of the intermediate material comprises a total concentration of said stabilizing species of from about 90 atomic percent to about 100 atomic percent.

7. The method of claim 3 wherein the stabilizing species includes carbon.

8. The method of claim 3 wherein the stabilizing species includes boron.

9. The method of claim 3 wherein the stabilizing species includes carbon and boron.

Assignments (6)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050676/0782 →
RELEASE OF SECURITY INTEREST Recorded Jul 20, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 046635/0634 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
SUPPLEMENT NO. 1 TO PATENT SECURITY AGREEMENT Recorded Aug 26, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 039841/0207 →
SUPPLEMENT NO. 1 TO PATENT SECURITY AGREEMENT Recorded Aug 25, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 039824/0681 →
Continuity (4)
Division 14884035 · Oct 15, 2015
Continuation 14618936 · Feb 10, 2015
Division 14070407 · Nov 1, 2013
Related Publication 20160284996A1 · Sep 29, 2016