IP Library Granted Patent US 10,483,481
Granted Patent B2
US 10,483,481 · App. 15/298,131 · Granted Nov 19, 2019

Solid state optoelectronic device with plated support substrate

Inventors: Vladimir Odnoblyudov (Danville, CA); Scott D. Schellhammer (Meridian, ID)
Assignee: Micron Technology, Inc.
H01L51/52H01L25/0753H01L33/0075H01L33/0095H01L33/06H01L33/46H01L33/62H01L51/5218H01L33/382H01L2224/32225H01L2224/48091H01L2224/48227H01L2224/73265H01L2933/0016
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Quick Facts
Patent No.
US 10,483,481
App. No.
15/298,131
Granted
Nov 19, 2019
Kind
B2
Abstract

A vertical solid state lighting (SSL) device is disclosed. In one embodiment, the SSL device includes a light emitting structure formed on a growth substrate. Individual SSL devices can include a embedded contact formed on the light emitting structure and a metal substrate plated at a side at least proximate to the embedded contact. The plated substrate has a sufficient thickness to support the light emitting structure without bowing.

Claims (23)

1. A wafer having a plurality of individual solid state lighting devices, comprising:

a light emitting structure having a first side and a second side opposite the first side, the light emitting structure comprising a first semiconductor material on the first side, a second semiconductor material on the second side, and an active region between the first and second semiconductor materials;

an embedded contact at the second side;

a plated substrate formed on the embedded contact, wherein the plated substrate has a thickness sufficient to inhibit bowing of the light emitting structure; and

a plurality of exterior contacts formed on the first side of the light emitting structure, wherein the wafer is at least approximately 150 millimeters in diameter.

2. The wafer of claim 1 wherein the wafer is between approximately 150-300 millimeters in diameter.

3. The wafer of claim 1 wherein the wafer has trenches in the light emitting structure and the plated substrate comprises a plurality of projections protruding from the plated substrate into the trenches.

4. The wafer of claim 1 , further comprising at least one of a barrier material and a reflective material between the plated substrate and the embedded contact.

5. The wafer of claim 1 wherein the plated substrate has a thickness of about 50-300 μm.

6. The wafer of claim 1 wherein the plated substrate has a thickness of about 100-150 μm.

7. The wafer of claim 1 wherein the plated substrate has a thickness greater than a thickness of the light emitting structure.

8. A solid state lighting device, comprising:

a light emitting structure having a first side and a second side opposite the first side, the light emitting structure comprising a first semiconductor material on the first side, a second semiconductor material on the second side, and an active region between the first and second semiconductor materials;

an embedded contact layer at the second side; and

a thick metal backside support member formed on the embedded contact layer directly connected to an external device, wherein the thick metal backside support member has a thickness sufficient to inhibit bowing of the light emitting structure.

9. The solid state lighting device of claim 8 wherein the embedded contact layer is silver (Ag).

10. The solid state lighting device of claim 8 , further comprising a plurality of exterior contacts formed on the first side of the light emitting structure.

11. The solid state lighting device of claim 8 wherein:

the first semiconductor material comprises a p-type gallium nitride (“p-GaN”) material;

the second semiconductor material comprises a n-type gallium nitride (“n-GaN”) material; and

the active region comprises an indium gallium nitride (“InGaN”) material.

12. The solid state lighting device of claim 8 wherein the thick metal backside support member has a thickness of about 50-300 μm.

13. The solid state lighting device of claim 8 wherein the thick metal backside support member has a thickness of about 100-150 μm.

Assignments (5)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050695/0825 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 16, 2018
From: ODNOBLYUDOV, VLADIMIR; SCHELLHAMMER, SCOTT D.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 045551/0615 →
SUPPLEMENT NO. 3 TO PATENT SECURITY AGREEMENT Recorded Feb 10, 2017
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041675/0105 →
Continuity (2)
Continuation 13069162 · Mar 22, 2011
Related Publication 20170040563A1 · Feb 9, 2017
Cited By (1)
US 12,557,434