Low power sense amplifier for a flash memory system
Multiple embodiments of a low power sense amplifier for use in a flash memory system are disclosed. In some embodiments, the loading on a sense amplifier can be adjusted by selectively attaching one or more bit lines to the sense amplifier, where the one or more bit lines each is coupled to an extraneous memory cell.
1. A flash memory system, comprising:
a first circuit comprising a selected flash memory cell coupled to a first bit line and a first output circuit, wherein during a read operation the first bit line is discharged through the selected flash memory cell and an output of the first output circuit changes when a voltage of the first bit line turns on a PMOS transistor in the first output circuit;
a second circuit comprising a reference flash memory cell coupled to a second bit line and a second output circuit, wherein during the read operation the second bit line is discharged through the reference flash memory cell and an output of the second output circuit changes when a voltage of the second bit line turns on a PMOS transistor in the second output circuit;
a timing comparison circuit for outputting a first value when the output of the first output circuit changes before the output of the second output circuit changes during the read operation and for outputting a second value when the output of the second output circuit changes before the output of the first output circuit changes during the read operation, wherein the first value and second value each indicate a value stored in the selected flash memory cell.
2. The flash memory system of claim 1 , wherein the timing comparison circuit comprises a flip-flop.
3. The flash memory system of claim 1 , wherein the timing comparison circuit comprises two inverters and two NAND gates.
4. The flash memory system of claim 1 , wherein the first bit line and second bit line are charged prior to the read operation.
5. The flash memory system of claim 1 , wherein the selected flash memory cell is coupled to the timing comparison circuit during the read operation by a multiplexor.
6. The flash memory system of claim 5 , wherein the reference flash memory cell is coupled to the timing comparison circuit during the read operation by a multiplexor.