IP Library Granted Patent US 10,170,448
Granted Patent B2
US 10,170,448 · App. 15/372,246 · Granted Jan 1, 2019

Apparatus and method of power transmission sensing for stacked devices

Inventors: Adam S. El-Mansouri (Boise, ID); Fuad Badrieh (Boise, ID); Brent Keeth (Boise, ID)
Assignee: Micron Technology, Inc.
H01L25/0657G05F1/10H01L2225/06513H01L2225/06517H01L2225/06524H01L2225/06541
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Quick Facts
Patent No.
US 10,170,448
App. No.
15/372,246
Granted
Jan 1, 2019
Kind
B2
Abstract

Apparatuses for supplying power supply voltage in a plurality of dies are described. An example apparatus includes: a circuit board; a regulator on the circuit board that regulates a first voltage; a semiconductor device on the circuit board that receives the first voltage through a power line in the circuit board. The semiconductor device includes: a substrate on the circuit board, stacked via conductive balls, that receives the first voltage from the power line via the conductive balls; a plurality of dies on the semiconductor device, stacked via bumps, each die including a first conductive via that receives the first voltage via the bumps; a plurality of pillars between adjacent dies and couple the first conductive vias of the adjacent dies; and a sense node switch circuit that selectively couples one first conductive via of one die among the plurality of dies to the regulator.

Claims (71)

1. An apparatus comprising:

a substrate;

a plurality of dies, each die of the plurality of dies comprising:

a circuit;

a first conductive via through each die, configured to provide a power supply voltage;

an on-die bus coupled to the first conductive via and configured to provide the power supply voltage from the first conductive via to the circuit;

a second conductive via through each die; and

a switch disposed between the on-die bus and the second conductive via, configured to selectively couple the on-die bus to the second conductive via,

a first conductive path across the substrate and the plurality of dies, configured to provide the power supply voltage to the first conductive via, the first conductive path comprising:

a first bump between the substrate and the plurality of dies, coupled to a corresponding first conductive via of a die of the plurality of dies adjacent to the substrate and the first bump configured to provide the power supply voltage to the corresponding first conductive via;

a plurality of the first pillars configured to couple the first conductive vias of adjacent dies of the plurality of dies to each other; and

the plurality of first conductive vias; and

a second conductive path across the substrate and the plurality of dies, the second conductive path comprising:

a second bump between the substrate and the plurality of dies, coupled to a corresponding second conductive via of the die of the plurality of dies adjacent to the substrate;

a plurality of second pillars configured to couple the second conductive vias of adjacent dies of the plurality of dies to each other; and

the plurality of the second conductive vias.

2. The apparatus of claim 1 , wherein the on-die bus on each die of the plurality of dies comprises a sensing node, and

wherein the second bump is configured to receive a sensed voltage at the sensing node.

3. The apparatus of claim 2 , wherein the sensing node is located between the switch and the first conductive via.

4. The apparatus of claim 1 , further comprising:

a third conductive via in each die of the plurality of dies; and

a third conductive path across the substrate and the plurality of dies, comprising the third conductive via,

wherein the third conductive via is coupled to the switch and configured to provide a control signal to the switch, and

wherein the switch is configured to couple the on-die bus to the second conductive via or decouple the on-die bus from the second conductive via, responsive to the control signal.

5. The apparatus of claim 4 , wherein the third conductive path comprises:

a third bump between the substrate and the plurality of dies, coupled to the third conductive via of the die of the plurality of dies adjacent to the substrate, and configured to provide the control signal; and

a plurality of third pillars configured to couple the third conductive vias of adjacent dies of the plurality of dies to each other.

6. An apparatus, comprising:

an operational amplifier configured to provide a first voltage;

a plurality of resistance components coupled in series and configured to receive the first voltage from the operational amplifier;

a plurality of sensing nodes between adjacent resistance components;

a sense line circuit configured to provide a second voltage from a sensing node of the plurality of sensing nodes; and

a plurality of switches, each switch of the plurality of switches being disposed between the sense line circuit and each of the plurality of sensing nodes,

wherein each switch of the plurality of switches is configured to be selectively activated to selectively couple the corresponding sensing node to the sense line circuit, and

wherein the sense line circuit comprises a plurality of conductive vias and a plurality of pillars coupling adjacent conductive vias to each other.

7. The apparatus of claim 6 , wherein the operational amplifier is configured to receive the second voltage and further configured to adjust the first voltage responsive to the second voltage.

8. The apparatus of claim 7 , further comprising:

a controller configured to provide a control signal; and

a control line circuit coupled to the plurality of switches and configured to provide the control signal from the controller to the plurality of switches,

wherein each switch of the plurality of switches is configured to be selectively activated to selectively couple the corresponding sensing node to the sense line circuit responsive to the control signal.

9. The apparatus of claim 8 , further comprising a semiconductor device and a circuit board,

wherein the controller and the operational amplifier are disposed on the circuit board,

wherein the semiconductor device comprises a plurality of dies,

wherein the control line circuit and the sense line circuit are shared by the plurality of dies, and

wherein each die of the plurality of dies includes each corresponding conductive via, each corresponding switch and the corresponding sensing node.

10. The apparatus of claim 9 ,

wherein each die includes a conductive via coupled to the sensing node, and

wherein each resistance component of the plurality of resistance components includes at least partly a resistance of the conductive via.

11. The apparatus of claim 9 , wherein the semiconductor device further comprises a substrate on the circuit board,

wherein the plurality of dies are stacked to each other on the substrate.

12. An apparatus comprising:

a circuit board;

a regulator on the circuit board, configured to regulate a first voltage; and

a semiconductor device on the circuit board, configured to receive the first voltage from the regulator through a power line in the circuit board, the semiconductor device comprising:

a substrate on the circuit board, stacked via conductive balls, and configured to receive the first voltage from the power line via the conductive balls;

a plurality of dies on the semiconductor device, stacked via bumps, each die of the plurality of dies comprising a first conductive via configured to receive the first voltage from the regulator via the bumps;

a plurality of pillars between adjacent dies of the plurality of dies and configured to couple the first conductive vias of the adjacent dies of the plurality of dies; and

a sense node switch circuit configured to selectively couple a first conductive via of a die among the plurality of dies to the regulator.

13. The apparatus of claim 12 , wherein the sense node switch circuit comprises:

a sense line circuit configured to provide a second voltage to the regulator through a sense line in the circuit board; and

a plurality of switches corresponding to a plurality of dies, each switch of the plurality of switches being disposed on the corresponding die of the plurality of dies, between a corresponding first conductive via on the corresponding die and the sense line circuit,

wherein at least one switch of the plurality of switches is configured to selectively couple the first conductive via of the die among the plurality of dies to the regulator.

14. The apparatus of claim 13 , wherein the sense line circuit comprises a plurality of second conductive vias in the corresponding plurality of dies and a plurality of second pillars coupling second conductive vias of adjacent dies of the plurality of dies.

15. The apparatus of claim 13 , further comprising:

a controller on the circuit board, configured to provide a control signal to the sense node switch circuit signal through a control line in the circuit board, the control signal indicative of the one die among the plurality of dies,

wherein the sense node switch circuit is configured to selectively couple the first conductive via of the die among the plurality of dies to the regulator responsive to the control signal.

16. The apparatus of claim 15 , wherein the sense node switch circuit comprises:

a control line circuit coupled to the plurality of switches and configured to provide the control signal from the controller to the plurality of switches,

wherein the sense node switch circuit is configured to selectively activate a switch of the plurality of switches responsive to the control signal.

17. The apparatus of claim 12 , wherein the plurality of dies are stacked to each other on the substrate.

18. The apparatus of claim 13 , wherein the regulator is an operational amplifier, configured to regulate the first voltage responsive to the second voltage.

Assignments (5)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050695/0825 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
SUPPLEMENT NO. 3 TO PATENT SECURITY AGREEMENT Recorded Feb 10, 2017
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041675/0105 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 7, 2016
From: EL-MANSOURI, ADAM S.; BADRIEH, FUAD; KEETH, BRENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 040594/0607 →
Continuity (1)
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