IP Library Granted Patent US 10,037,949
Granted Patent B1
US 10,037,949 · App. 15/447,831 · Granted Jul 31, 2018

Semiconductor package and fabricating method thereof

Inventors: Hee Sung Kim (Jeollanam-do, KR); Yeoung Beom Ko (Gwangju, KR); Dae Byoung Kang (Seoul, KR); Jae Jin Lee (Seoul, KR); Joon Dong Kim (Gwang-ju, KR); Dong Jean Kim (Gwangju, KR)
Assignee: Amkor Technology, Inc.
H01L23/552H01L21/561H01L21/6835H01L21/78H01L23/3128H01L24/11H01L24/14H01L25/165H01L2221/68327H01L2221/68345H01L2221/68359H01L2224/0401
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Quick Facts
Patent No.
US 10,037,949
App. No.
15/447,831
Granted
Jul 31, 2018
Kind
B1
Abstract

A semiconductor package that includes EMI shielding and a fabricating method thereof are disclosed. In one embodiment, the fabricating method of a semiconductor package includes forming a substrate, attaching semiconductor devices to a top portion of the substrate, encapsulating the semiconductor devices using an encapsulant, forming a trench in the encapsulant, and forming a shielding layer on a surface of the encapsulant.

Claims (54)

1. A method of fabricating a semiconductor package, comprising:

forming a substrate, comprising:

forming a first substrate part on a support layer, the first substrate part including a first conductive structure and a first dielectric structure;

attaching a first carrier to a top portion of the first substrate part;

removing the support layer; and

forming a second substrate part on the first substrate part, the second substrate part including a second conductive structure and a second dielectric structure;

attaching a first semiconductor device to a top portion of the substrate;

encapsulating the first semiconductor device using an encapsulant;

forming a trench in the encapsulant; and

forming a shielding layer on a surface of the encapsulant.

2. The method according to claim 1 , comprising:

after forming the shielding layer, attaching a second carrier to the shielding layer formed on a top side of the encapsulant;

removing the first carrier; and

forming conductive bumps on the first substrate part.

3. The method according to claim 2 , comprising attaching a second semiconductor device having a smaller height than the conductive bumps to the first substrate part.

4. The method according to claim 1 , wherein the trench is formed to pass through the encapsulant and the substrate.

5. The method according to claim 1 , wherein the shielding layer is formed on a top surface of the encapsulant, side surfaces of the encapsulant, and side surfaces of the substrate.

6. The method according to claim 1 , wherein the shielding layer is electrically connected to a ground of the substrate.

7. The method according to claim 1 , wherein the substrate is a printed circuit board having a core.

8. The method according to claim 1 , comprising, after the encapsulating, forming conductive bumps on the substrate.

9. The method according to claim 8 , comprising:

attaching a carrier to a top portion of the encapsulant; and

forming the trench to pass through the substrate and the encapsulant.

10. The method according to claim 9 , comprising prior to forming the shielding layer:

attaching an adhesion member to the substrate to enclose the conductive bumps; and

removing the carrier.

11. A method of fabricating a semiconductor package, comprising:

forming a first substrate part on a support layer;

attaching a semiconductor device to a top side of the first substrate part;

encapsulating the semiconductor device using an encapsulant;

forming a trench in the encapsulant;

forming a shielding layer on a top surface of the encapsulant; and

forming a second substrate part on the first substrate part, comprising:

attaching a carrier on the shielding layer; and

removing the support layer,

wherein the second substrate part comprises a conductive structure and a dielectric structure.

12. The method according to claim 11 , wherein forming the first substrate part comprises forming the first substrate part including a conductive structure and a dielectric structure.

13. The method according to claim 11 , wherein forming the trench comprises forming the trench to pass through the encapsulant, the first substrate part, and a portion of the support layer.

14. The method according to claim 11 , comprising injecting a photoresist material into the trench.

15. The method according to claim 11 , comprising, after forming the second substrate part, forming conductive bumps on the second substrate part.

16. A method of fabricating a semiconductor package, comprising:

forming a substrate;

attaching a first semiconductor device to a top portion of the substrate;

encapsulating the first semiconductor device using an encapsulant;

after the encapsulating forming conductive bumps on the substrate;

attaching a carrier to a top portion of the encapsulant;

forming a trench to pass through the substrate and the encapsulant; and

forming a shielding layer on a surface of the encapsulant.

17. The method according to claim 16 , wherein the shielding layer is formed on a top surface of the encapsulant, side surfaces of the encapsulant, and side surfaces of the substrate.

18. The method according to claim 16 , wherein the shielding layer is electrically connected to a ground of the substrate.

19. The method according to claim 16 , wherein the substrate is a printed circuit board having a core.

20. The method according to claim 16 , comprising prior to forming the shielding layer:

attaching an adhesion member to the substrate to enclose the conductive bumps; and

removing the carrier.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 12, 2020
From: AMKOR TECHNOLOGY, INC.
To: AMKOR TECHNOLOGY SINGAPORE HOLDING PTE.LTD.
Reel/Frame 054046/0673 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 25, 2018
From: KIM, HEE SUNG; KO, YEOUNG BEOM; KANG, DAE BYOUNG; LEE, JAE JIN; KIM, JOON DONG; KIM, DONG JEAN
To: AMKOR TECHNOLOGY, INC.
Reel/Frame 046189/0615 →
Cited By (3)
US 12,249,586 US 12,315,742 US 12,635,470