IP Library Granted Patent US 9,825,000
Granted Patent B1
US 9,825,000 · App. 15/495,873 · Granted Nov 21, 2017

Semiconductor wire bonding machine cleaning device and method

Inventors: Alan E. Humphrey (Reno, NV); Wayne C. Smith (Reno, NV); Janakraj Shivlal (Singapore, SG); Bret A. Humphrey (Reno, NV)
Assignee: International Test Solutions, Inc.
H01L24/85B23K20/005B23K20/26H01L24/78B23K2201/40H01L2224/7801H01L2224/78101H01L2224/78611H01L2224/851H01L2224/85075H01L2224/85203
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Quick Facts
Patent No.
US 9,825,000
App. No.
15/495,873
Granted
Nov 21, 2017
Kind
B1
Abstract

A methodology and medium for regular and predictable cleaning the support hardware such as capillary tube in semiconductor assembly equipment components, while it is still in manual, semi-automated, and automated assembly are disclosed. The cleaning material may include a cleaning pad layer and one or more intermediate layers that have predetermined characteristics.

Claims (36)

1. A method for cleaning a wire bonding machine, comprising:

positioning a capillary tube that is connected to a wire bonding machine near an elastomeric cleaning material; and

inserting, while the capillary tube remains attached to the wire bonding machine, the capillary tube into the elastomeric cleaning material so that an end of the capillary tube penetrates the elastomeric cleaning material that removes debris from the capillary tube.

2. The method of claim 1 further comprising causing an inert gas to pass through the capillary tube to push debris inside of the capillary tube into the elastomeric cleaning material.

3. The method of claim 1 further comprising moving the elastomeric cleaning material adjacent to the capillary tube of the wire bonding machine.

4. The method of claim 1 further comprising trapping the debris within the elastomeric cleaning material.

5. The method of claim 1 , wherein positioning the elastomeric cleaning material further comprises positioning an elastomeric cleaning device having a cross linked polymer layer.

6. The method of claim 1 , wherein positioning the elastomeric cleaning material further comprises positioning an elastomeric cleaning device having a cross linked polymer layer and one or more intermediate layers having predetermined characteristics.

7. The method of claim 1 , wherein positioning the elastomeric cleaning material further comprises using a handler to position the elastomeric cleaning material when removing debris from the capillary tube and further comprising using the handler to move a plurality of semiconductor devices during a wire bonding process.

8. The method claim 1 further comprising attaching the elastomeric cleaning material to a carrier.

9. The method of claim 8 , wherein the carrier is one of a wire bonding machine cleaning block and a wire bonding machine cleaning pad and wherein positioning the capillary tube further comprises moving a head of the wire bonding machine having the capillary tube into proximity of one of the wire bonding machine cleaning block and the wire bonding machine cleaning pad.

10. A method for operating a wire bonding machine, comprising:

performing a plurality of wire bonding operations using a capillary tube and a wire that passes through the capillary tube; and

periodically inserting, while the capillary tube remains attached to the wire bonding machine, the capillary tube into an elastomeric cleaning material so that an end of the capillary tube penetrates the elastomeric cleaning material that removes debris from the capillary tube.

11. The method of claim 10 further comprising causing an inert gas to pass through the capillary tube to push debris inside of the capillary tube into the elastomeric cleaning material.

12. The method of claim 10 further comprising moving the elastomeric cleaning material adjacent to the capillary tube of the wire bonding machine.

13. The method of claim 10 further comprising trapping the debris within the elastomeric cleaning material.

14. The method of claim 10 , wherein positioning the elastomeric cleaning material further comprises positioning an elastomeric cleaning device having a cross linked polymer layer.

15. The method of claim 10 , wherein positioning the elastomeric cleaning material further comprises positioning an elastomeric cleaning device having a cross linked polymer layer and one or more intermediate layers having predetermined characteristics.

16. The method of claim 10 , wherein positioning the elastomeric cleaning material further comprises using a handler to position the elastomeric cleaning material when removing debris from the capillary tube and further comprising using the handler to move a plurality of semiconductor devices during a wire bonding process.

17. The method claim 10 further comprising attaching the elastomeric cleaning material to a carrier.

18. The method of claim 17 , wherein the carrier is one of a wire bonding machine cleaning block and a wire bonding machine cleaning pad and the method further comprising moving a head of the wire bonding machine having the capillary tube into proximity of one of the wire bonding machine cleaning block and the wire bonding machine cleaning pad.

19. A wire bonding apparatus, comprising:

a wire bonding machine having a capillary tube through which a wire is threaded for creating wire bonds for semiconductor devices; and

an elastomeric cleaning material associated with the wire bonding machine into which an end of the capillary tube penetrates while still attached to the wire bonding machine to refurbish the capillary tube and remove debris from in and around the capillary tube.

20. The apparatus of claim 19 , wherein the wire bonding machine further comprises a wire bonding machine having ultrasonic assist.

21. The apparatus of claim 19 further comprising an inert gas source that passes through the capillary tube to push debris inside of the capillary tube into the elastomeric cleaning material.

22. The apparatus of claim 19 , wherein the elastomeric cleaning material further comprises a cross linked polymer layer.

23. The apparatus of claim 19 , wherein the elastomeric cleaning material further comprises an elastomeric cleaning device having a cleaning layer and one or more intermediate layers underneath the cleaning layer, wherein the one or more intermediate layers having predetermined characteristics.

24. The apparatus of claim 19 , wherein the elastomeric cleaning material further comprises one of a carrier, a substrate and a frame having an elastomeric cleaning layer.

25. The apparatus of claim 24 further comprising a handler that handles a plurality of semiconductor devices being wire bonded by the wire bonding machine and that handles the elastomeric cleaning device when the capillary tube is being cleaned.

26. The apparatus of claim 19 , wherein the elastomeric cleaning material further comprises a carrier and an elastomeric cleaning layer wherein the capillary tube is inserted into the elastomeric cleaning layer.

27. The apparatus of claim 26 , wherein the carrier is one of a wire bonding machine cleaning block and a wire bonding machine cleaning pad and further comprising a machine that moves the capillary tube into proximity of one of the wire bonding machine cleaning block and the wire bonding machine cleaning pad.

28. The apparatus of claim 19 , wherein the elastomeric cleaning material has a specific gravity, an elasticity, a tackiness, a thickness and a porosity.

29. The apparatus of claim 28 , wherein the specific gravity is in a range of 0.75 to 2.27, the elasticity is in a range of 40-MPa to 600-MPa, the tackiness is in a range of 20 to 800 grams, the thickness is in a range between 25-um and 500-um and the porosity is in a range of 10 to 150 micropores per inch.

30. The apparatus of claim 19 , wherein the elastomeric cleaning material is one of a rubber, a natural polymer and a synthetic polymer.

Assignments (7)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 5, 2023
From: INTERNATIONAL TEST SOLUTIONS, LLC
To: ENTEGRIS, INC.
Reel/Frame 065764/0493 →
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
SECURITY INTEREST Recorded Jul 8, 2022
From: CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 060615/0001 →
RELEASE OF SECURITY INTEREST Recorded Jul 6, 2022
From: JPMORGAN CHASE BANK, N.A.
To: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; KMG-BERNUTH, INC.; MPOWER SPECIALTY CHEMICALS LLC; SEALWELD (USA), INC.; INTERNATIONAL TEST SOLUTIONS, LLC; CMC MATERIALS, INC.
Reel/Frame 060592/0260 →
CHANGE OF NAME Recorded May 3, 2021
From: INTERNATIONAL TEST SOLUTIONS, INC.
To: INTERNATIONAL TEST SOLUTIONS, LLC
Reel/Frame 056121/0757 →
SECURITY AGREEMENT Recorded Apr 30, 2021
From: INTERNATIONAL TEST SOLUTIONS, LLC
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 056104/0979 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 16, 2017
From: HUMPHREY, ALAN E.; SMITH, WAYNE C.; SHIVLAL, JANAKRAJ; HUMPHREY, BRET A.
To: INTERNATIONAL TEST SOLUTIONS, INC.
Reel/Frame 043310/0450 →