Handling thermal shutdown for memory devices
The present disclosure discloses a memory device including a controller for handling thermal shutdown of the memory device. The control system acquires temperatures of a plurality of non-volatile memory elements in the memory device from one or more temperature detectors at a first frequency. Upon determining that the temperature of one of the plurality of non-volatile memory elements is above a threshold, the controller activates thermal throttling for the plurality of non-volatile memory elements and flushes metadata from a volatile memory element in the memory device to the plurality of non-volatile memory elements for future recovery of the memory device.
1. A memory device, comprising:
a plurality of non-volatile memory elements configured to process a plurality of read/write operations;
a volatile memory element configured to store metadata of the memory device;
one or more temperature detectors configured to measure temperatures of the plurality of non-volatile memory elements; and
a controller configured to:
acquire the temperatures of the plurality of non-volatile memory elements from the one or more temperature detectors at a first frequency; and
upon determining that the temperature of a first one of the plurality of non-volatile memory elements is above a first threshold:
activate thermal throttling for the plurality of non-volatile memory elements; and
flush the metadata from the volatile memory element to the plurality of non-volatile memory elements.
2. A memory device, comprising:
a plurality of non-volatile memory elements configured to process a plurality of read/write operations;
a volatile memory element configured to store metadata of the memory device;
one or more temperature detectors configured to measure temperatures of the plurality of non-volatile memory elements; and
a controller configured to:
acquire the temperatures of the plurality of non-volatile memory elements from the one or more temperature detectors at a first frequency; and
upon determining that the temperature of a first one of the plurality of non-volatile memory elements is above a first threshold:
activate thermal throttling for the plurality of non-volatile memory elements; and
flush the metadata from the volatile memory element to the plurality of non-volatile memory elements wherein the metadata comprises one or more of:
Flash Translation Layer (FTL) logical block address (LBA) tables;
cell voltage distribution (CVD) tracking tables;
CVD caches;
XOR parity bins;
boot block updates;
file system block updates; and
block management tables.
3. A memory device, comprising:
a plurality of non-volatile memory elements configured to process a plurality of read/write operations;
a volatile memory element configured to store metadata of the memory device;
one or more temperature detectors configured to measure temperatures of the plurality of non-volatile memory elements; and
a controller configured to:
acquire the temperatures of the plurality of non-volatile memory elements from the one or more temperature detectors at a first frequency; and
upon determining that the temperature of a first one of the plurality of non-volatile memory elements is above a first threshold:
activate thermal throttling for the plurality of non-volatile memory elements; and
flush the metadata from the volatile memory element to the plurality of non-volatile memory elements wherein the controller is configured to flush the metadata from the volatile memory element to a plurality of control blocks in the plurality of non-volatile memory elements.
4. The memory device of claim 3 , wherein the plurality of control blocks comprises single level cell (SLC) control blocks.
5. The memory device of claim 3 , wherein the controller is configured to flush the metadata by writing the metadata to one or more pages in the plurality of control blocks at the first frequency.
6. A controller, comprising:
a processor;
a memory containing a program that, when executed on the processor, performs an operation, the operation comprising:
acquiring temperatures of a plurality of non-volatile memory elements in a memory device from one or more temperature detectors at a first frequency; and
upon determining that the temperature of a first one of the plurality of non-volatile memory elements is above a first threshold:
activating thermal throttling for the plurality of non-volatile memory elements; and
flushing metadata of the memory device from a volatile memory element in the memory device to the plurality of non-volatile memory elements.
7. A controller, comprising:
a processor;
a memory containing a program that, when executed on the processor, performs an operation, the operation comprising:
acquiring temperatures of a plurality of non-volatile memory elements in a memory device from one or more temperature detectors at a first frequency; and
upon determining that the temperature of a first one of the plurality of non-volatile memory elements is above a first threshold:
activating thermal throttling for the plurality of non-volatile memory elements; and
flushing metadata of the memory device from a volatile memory element in the memory device to the plurality of non-volatile memory elements wherein flushing metadata of the memory device comprises flushing the metadata from the volatile memory element to a plurality of control blocks in the plurality of non-volatile memory elements.
8. A controller, comprising:
a processor;
a memory containing a program that, when executed on the processor, performs an operation, the operation comprising:
acquiring temperatures of a plurality of non-volatile memory elements in a memory device from one or more temperature detectors at a first frequency; and
upon determining that the temperature of a first one of the plurality of non- volatile memory elements is above a first threshold:
activating thermal throttling for the plurality of non-volatile memory elements; and
flushing metadata of the memory device from a volatile memory element in the memory device to the plurality of non-volatile memory elements the operation further comprising setting a flag indicating the metadata in the plurality of control blocks.
9. The controller of claim 8 , further comprising setting the flag in a boot block in the plurality of non-volatile memory elements.
10. The controller of claim 8 , further comprising setting the flag after successfully flushing the metadata.
11. A method, comprising:
acquiring temperatures of a plurality of non-volatile memory elements in a memory device from one or more temperature detectors at a first frequency; and
upon determining that the temperature of a first one of the plurality of non-volatile memory elements is above a first threshold:
activating thermal throttling for the plurality of non-volatile memory elements; and
flushing metadata of the memory device from a volatile memory element in the memory device to the plurality of non-volatile memory elements.
12. The method of claim 11 , wherein the first frequency is determined by the memory device.
13. The method of claim 11 , further comprising:
upon determining that the temperature of a second one of the plurality of non-volatile memory elements is above a second threshold:
shutting down the memory device; and
recovering the memory device in a future power cycle issued by a host device based on the metadata in the plurality of non-volatile memory elements.
14. The method of claim 13 , wherein the second threshold is higher than the first threshold.
15. The method of claim 11 , wherein flushing metadata of the memory device comprises flushing the metadata upon determining that the temperature of the first non-volatile memory element is not decreased after activating the thermal throttling.