Systems, methods and devices for programming a multilevel resistive memory cell
Embodiments disclosed herein may relate to programming a multi-level memory cell with programming pulse sequences that comprise forward-biased and reverse-biased programming pulses.
1. A method, comprising:
applying one or more first reverse-biased electrical pulses to a memory cell;
programming the memory cell from a first programming state to a reset programming state based at least in part on applying the one or more first reverse-biased electrical pulses;
applying one or more second reverse-biased electrical pulses to the memory cell; and
programming the memory cell from the reset programming state to the first programming state based at least in part on applying the one or more second reverse-biased electrical pulses.
2. The method of claim 1 , wherein the one or more first reverse-biased electrical pulses ramp in a first sequence and the one or more second reverse-biased electrical pulses ramp in a second sequence that is different from the second sequence.
3. The method of claim 2 , wherein the first sequence comprises a rising staircase sequence and the second sequence comprises a falling staircase sequence.
4. The method of claim 1 , further comprising:
modulating an edge of at least some of the one or more first reverse-biased electrical pulses,
wherein programming the memory cell from the reset programming state to the first programming state is based at least in part on the modulating.
5. The method of claim 1 , further comprising:
applying one or more forward-biased electrical pulses to the memory cell; and
programming the memory cell from the first programming state to the reset programming state based at least in part on applying the one or more forward-biased electrical pulses, wherein the one or more forward-biased electrical pulses ramp in a rising staircase sequence.
6. The method of claim 5 , further comprising:
modulating an edge of at least some of the one or more forward-biased electrical pulses,
wherein programming the memory cell from the first programming state to the reset programming state is based at least in part on the modulating.
7. The method of claim 1 , wherein applying the one or more first reverse-biased electrical pulses comprises:
applying a voltage across a storage component such that a current flows from a first electrode to a second electrode of the storage component.
8. A method, comprising:
applying one or more first reverse-biased electrical pulses to a memory cell;
programming the memory cell from a first programming state to a reset programming state based at least in part on applying the one or more first reverse-biased electrical pulses;
applying one or more first forward-biased electrical pulses to the memory cell; and
programming the memory cell from the reset programming state to a set programming state based at least in part on applying the one or more first forward-biased electrical pulses, wherein the one or more first forward-biased electrical pulses sequentially ramp in a falling staircase sequence.
9. The method of claim 8 , further comprising:
applying one or more second forward-biased electrical pulses to the memory cell; and
programming the memory cell from the set programming state to the reset programming state based at least in part on applying the one or more second forward-biased electrical pulses, wherein the one or more second forward-biased electrical pulses ramp in a rising staircase sequence.
10. The method of claim 9 , wherein the memory cell comprises a chalcogenide material.
11. The method of claim 10 , wherein the set programming state comprises a crystalline state having a first threshold voltage characteristic, and wherein the reset programming state comprises an amorphous state having a second threshold voltage characteristic.
12. A memory device, comprising:
a memory array comprising a plurality of memory cells; and
a control unit configured to:
program one or more memory cells of the plurality of memory cells from a first programming state to a reset programming state based at least in part on applying one or more first reverse-biased electrical pulses; and
program the one or more memory cells from the reset programming state to the first programming state based at least in part on applying one or more second reverse-biased electrical pulses.
13. The memory device of claim 12 , wherein the one or more first reverse-biased electrical pulses ramp in a first sequence and the one or more second reverse-biased electrical pulses ramp in a second sequence, and wherein the first sequence is different than the second sequence.
14. The memory device of claim 13 , wherein the first sequence comprises an increasing sequence and the second sequence comprises a decreasing sequence.
15. The memory device of claim 12 , the control unit configured to:
modulate an edge of at least some of the one or more first reverse-biased electrical pulses,
wherein programming the one or more memory cells from the reset programming state to the first programming state is based at least in part on the modulating.
16. The memory device of claim 12 , the control unit configured to:
program the one or more memory cells from the first programming state to the reset programming state based at least in part on applying one or more forward-biased electrical pulses, wherein the one or more forward-biased electrical pulses ramp in a rising staircase sequence.
17. The memory device of claim 16 , the control unit configured to:
modulate an edge of at least some of the one or more forward-biased electrical pulses,
wherein programming the one or more memory cells from the first programming state to the reset programming state is based at least in part on the modulating.
18. The memory device of claim 12 , wherein each memory cell of the one or more memory cells comprises a chalcogenide material.
19. A memory device, comprising
a memory array comprising a plurality of memory cells; and
a control unit configured to:
program one or more memory cells of the plurality of memory cells from a first programming state to a reset programming state based at least in part on applying one or more first reverse-biased electrical pulses; and
program the one or more memory cells from the reset programming state to a set programming state based at least in part on applying one or more first forward-biased electrical pulses that sequentially ramp in a decreasing sequence to the one or more memory cells.
20. The memory device of claim 19 , the control unit configured to:
program the one or more memory cells from the set programming state to the reset programming state based at least in part on applying one or more second forward-biased electrical pulses that sequentially ramp in an increasing sequence to the one or more memory cells.