IP Library Granted Patent US 10,527,902
Granted Patent B2
US 10,527,902 · App. 16/100,261 · Granted Jan 7, 2020

Display device and electronic device

Inventors: Atsushi Umezaki (Kanagawa, JP); Hiroyuki Miyake (Kanagawa, JP)
Assignee: Semiconductor Energy Laboratory Co., Ltd.
G02F1/1368G02F1/136286G09G3/3233G09G3/3266G09G3/3677H01L27/1214H01L27/1251H01L27/3276G09G3/20G09G3/2022G09G3/3275G09G3/342G09G3/3426G09G3/3685G09G2300/043G09G2300/0852G09G2310/027G09G2310/0248G09G2310/0262G09G2310/0275G09G2310/0286G09G2310/0297G09G2320/0233G09G2320/043G09G2330/021G09G2340/02G09G2352/00H01L27/12H01L27/124H01L27/1222H01L27/1255H01L27/156H01L27/3232H01L29/42384H01L2924/0002
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Quick Facts
Patent No.
US 10,527,902
App. No.
16/100,261
Granted
Jan 7, 2020
Kind
B2
Abstract

An object of the invention is to provide a circuit technique which enables reduction in power consumption and high definition of a display device. A switch controlled by a start signal is provided to a gate electrode of a transistor, which is connected to a gate electrode of a bootstrap transistor. When the start signal is input, a potential is supplied to the gate electrode of the transistor through the switch, and the transistor is turned off. The transistor is turned off, so that leakage of a charge from the gate electrode of the bootstrap transistor can be prevented. Accordingly, time for storing a charge in the gate electrode of the bootstrap transistor can be shortened, and high-speed operation can be performed.

Claims (40)

1. A semiconductor device comprising:

a first circuit configured to output a first selection signal to a first scan line;

a second circuit configured to output a second selection signal to a second scan line; and

a third circuit configured to output a third selection signal to a third scan line,

wherein the second circuit comprises a first transistor, a second transistor, and a third transistor,

wherein one of a source and a drain of the first transistor is electrically connected to the second scan line,

wherein one of a source and a drain of the second transistor and one of a source and a drain of the third transistor are electrically connected to a gate of the first transistor,

wherein a gate of the second transistor is electrically connected to the first scan line through a first wiring,

wherein a gate of the third transistor is electrically connected to the third scan line through a second wiring,

wherein a ratio of a channel width W to a channel length L of the first transistor is larger than a ratio of a channel width W to a channel length L of the second transistor,

wherein the ratio of the channel width W to the channel length L of the first transistor is larger than a ratio of a channel width W to a channel length L of the third transistor, and

wherein each of the first transistor, the second transistor, and the third transistor comprises an oxide semiconductor.

2. The semiconductor device according to claim 1 , wherein each of the second transistor and the third transistor is configured to control a potential of the gate of the first transistor.

3. The semiconductor device according to claim 1 ,

wherein a length of a first portion of the first wiring is longer than a second portion of the second wiring,

wherein the first portion of the first wiring is positioned between the first scan line and the gate of the second transistor, and

wherein the second portion of the second wiring is positioned between the third scan line and the gate of the third transistor.

4. A liquid crystal display device comprising the semiconductor device according to claim 1 .

5. A semiconductor device comprising:

a first circuit configured to output a first selection signal to a first scan line;

a second circuit configured to output a second selection signal to a second scan line; and

a third circuit configured to output a third selection signal to a third scan line,

wherein the second circuit comprises a first transistor, a second transistor, and a third transistor,

wherein one of a source and a drain of the first transistor is electrically connected to the second scan line,

wherein one of a source and a drain of the second transistor and one of a source and a drain of the third transistor are electrically connected to a gate of the first transistor,

wherein a gate of the second transistor is electrically connected to the first scan line through a first wiring,

wherein a gate of the third transistor is electrically connected to the third scan line through a second wiring,

wherein a ratio of a channel width W to a channel length L of the first transistor is larger than a ratio of a channel width W to a channel length L of the second transistor,

wherein the ratio of the channel width W to the channel length L of the first transistor is larger than a ratio of a channel width W to a channel length L of the third transistor,

wherein the first circuit is electrically connected to a third wiring which a first clock signal is input,

wherein the second circuit is electrically connected to a fourth wiring which a second clock signal is input,

wherein the third circuit is electrically connected to a fifth wiring which a third clock signal is input, and

wherein the other of the source and the drain of the first transistor is electrically connected to the fourth wiring.

6. The semiconductor device according to claim 5 , wherein each of the second transistor and the third transistor is configured to control a potential of the gate of the first transistor.

7. The semiconductor device according to claim 5 ,

wherein a length of a first portion of the first wiring is longer than a second portion of the second wiring,

wherein the first portion of the first wiring is positioned between the first scan line and the gate of the second transistor, and

wherein the second portion of the second wiring is positioned between the third scan line and the gate of the third transistor.

8. The semiconductor device according to claim 5 , wherein each of the first transistor, the second transistor, and the third transistor comprises an oxide semiconductor.

9. A liquid crystal display device comprising the semiconductor device according to claim 5 .

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 10, 2018
From: UMEZAKI, ATSUSHI; MIYAKE, HIROYUKI
To: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Reel/Frame 046615/0672 →
Priority Claims (1)
JP 2006-269905 · Sep 29, 2006 · national
Continuity (7)
Continuation 15450099 · Mar 6, 2017
Continuation 15001325 · Jan 20, 2016
Continuation 14554216 · Nov 26, 2014
Continuation 13974328 · Aug 23, 2013
Continuation 13174895 · Jul 1, 2011
Continuation 11853215 · Sep 11, 2007
Related Publication 20180348561A1 · Dec 6, 2018
Cited By (10)
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