Method and device for a high temperature vacuum-safe solder resist utilizing laser ablation of solderable surfaces for an electronic module assembly
A process for manufacturing an electronic component having attaches includes providing a first component having a first attach, forming trenches on a portion of the first attach with a laser to form a solder stop, and providing a second component comprising a second attach. The process further includes providing solder between the first attach and the second attach to form a connection between the first component and the second component, where the trenches contain the solder to a usable area. A device produced by the process is disclosed as well.
1. An electronic component having attaches comprising:
a first component comprising a surface that comprises a first attach;
a second component comprising a second attach;
solder arranged between the first attach and the second attach to connect the first component to the second component; and
a plurality of trenches arranged on the surface of the first component, the plurality of trenches being configured to form a barrier region that inhibits a flow of the solder across the surface of the first component, at least one of the plurality of trenches comprises a boundary trench, and the plurality of trenches comprise a plurality of trench portions that extend in a direction to intersect the boundary trench,
wherein the plurality of trenches are configured such that the solder is contained between the plurality of trenches on the first attach; and
wherein the plurality of trenches are configured such that the solder forms a solder fillet between the first component and the second component.
2. The electronic component of claim 1
wherein at least one of the plurality of trenches comprises an oxidized portion of the surface of the first component to limit solder wetting; and
wherein the oxidized portion is configured to form a barrier region that inhibits a flow of the solder.
3. The electronic component of claim 1
wherein at least one of the plurality of trenches comprises a removed portion of the surface of the first component to limit solder wetting; and
wherein the removed portion is configured to form a barrier region that inhibits a flow of the solder.
4. The electronic component of claim 1
wherein at least one of the plurality of trenches forms a continuous closed-loop structure;
wherein the first component further comprises a plated surface and at least a portion of the plated surface is configured as the first attach;
wherein the first component comprises a metallic construction;
wherein the metallic construction further comprises at least one of the following: aluminum and copper; and
wherein the plated surface comprises at least one of the following: nickel, silver, palladium, and gold.
5. The electronic component of claim 1
wherein the first component comprises one of the following: a substrate of a power electronic module, a semiconductor device, and a base plate of a power electronic module.
6. The electronic component of claim 1 wherein the plurality of trenches comprise at least one additional trench arranged parallel to the boundary trench.
7. An electronic component having attaches comprising:
a first component comprising a surface that comprises a first attach;
a second component comprising a second attach;
solder arranged between the first attach and the second attach to connect the first component to the second component; and
a plurality of trenches arranged on the surface of the first component, the plurality of trenches being configured to form a barrier region that inhibits a flow of the solder across the surface of the first component, and at least one of the plurality of trenches comprises an inside boundary trench and an outside boundary trench,
wherein the plurality of trenches are configured such that the solder is contained between the plurality of trenches on the first attach; and
wherein the plurality of trenches comprise a plurality of trench portions arranged between the inside boundary trench and the outside boundary trench, and the plurality of trench portions extend in a direction to intersect the inside boundary trench and the outside boundary trench.
8. The electronic component of claim 7
wherein at least one of the trenches comprises an oxidized portion of the surface of the first component; and
wherein the oxidized portion is configured to limit solder wetting and to form a barrier region that inhibits a flow of the solder.
9. The electronic component of claim 7
wherein at least one of the trenches comprises a removed portion of the surface of the first component; and
wherein the removed portion is configured to limit solder wetting and to form a barrier region that inhibits a flow of the solder.
10. The electronic component of claim 7
wherein the first component further comprises a plated surface and at least a portion of the plated surface is configured as the first attach;
wherein the first component comprises a metallic construction;
wherein the metallic construction further comprises at least one of the following: aluminum and copper; and
wherein the plated surface comprises at least one of the following: nickel, silver, palladium, and gold.
11. The electronic component of claim 7 wherein;
the first component comprises one of the following: a substrate of a power electronic module, a semiconductor device, and a base plate of a power electronic module; and
wherein at least one of the trenches forms a continuous closed-loop structure.
12. An electronic component having attaches comprising:
a first component comprising a surface that comprises a first attach;
a second component comprising a second attach;
solder arranged between the first attach and the second attach to connect the first component to the second component; and
trenches arranged on the surface of the first component, the trenches being configured to form a barrier region that inhibits a flow of the solder across the surface of the first component,
wherein the trenches comprise at least two boundary trenches and at least one additional trench arranged between the at least two boundary trenches; and
wherein the at least two boundary trenches comprise a plurality of parallel boundary trenches and the at least one additional trench further comprises a plurality of trench portions arranged between the plurality of parallel boundary trenches, and the plurality of trench portions extend in a direction to intersect the plurality of parallel boundary trenches.
13. The electronic component of claim 12 wherein the trenches comprise at least one of the following to limit solder wetting: an oxidized portion of the surface of the first component or a removed portion of the surface of the first component.
14. The electronic component of claim 12
wherein the first component further comprises a plated surface and at least a portion of the plated surface is configured as the first attach;
wherein the first component comprises a metallic construction;
wherein the metallic construction further comprises at least one of the following: aluminum and copper; and
wherein the plated surface comprises at least one of the following: nickel, silver, palladium, and gold.
15. The electronic component of claim 12 wherein:
the first component comprises one of the following: a substrate of a power electronic module, a semiconductor device, and a base plate of a power electronic module; and
at least one of the trenches forms a continuous closed-loop structure.
16. An electronic component having attaches comprising:
a first component comprising a surface that comprises a first attach;
a second component comprising a second attach;
solder arranged between the first attach and the second attach to connect the first component to the second component; and
trenches arranged on the surface of the first component, the trenches being configured to form a barrier region that inhibits a flow of the solder across the surface of the first component, and at least one of the trenches comprises an inside boundary trench and an outside boundary trench,
wherein at least one of the trenches forms a continuous closed-loop structure and wherein the trenches are configured such that the solder is contained between the trenches on the first attach; and
wherein at least one of the trenches comprises a plurality of trench portions arranged between the inside boundary trench and the outside boundary trench, and the plurality of trench portions extend in a direction to intersect the inside boundary trench and the outside boundary trench.