IP Library Granted Patent US 10,325,666
Granted Patent B2
US 10,325,666 · App. 16/218,398 · Granted Jun 18, 2019

Flash memory system using negative high voltage level shifter

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Quick Facts
Patent No.
US 10,325,666
App. No.
16/218,398
Granted
Jun 18, 2019
Kind
B2
Abstract

During a program, read, or erase operation of one or more non-volatile flash memory cells in an array of non-volatile flash memory cells, a negative voltage can be applied to the word lines and/or coupling gates of the selected or unselected non-volatile flash memory cells. The negative voltage is generated by a negative high voltage level shifter using one of several embodiments disclosed herein.

Claims (56)

1. A negative high voltage level shifter for receiving an input and generating an output, comprising:

a cascode circuit comprising a first PMOS transistor, a second PMOS transistor, a first NMOS transistor and a second NMOS transistor, the first NMOS transistor comprising a deep N-well and the second NMOS transistor comprising a deep N-well;

wherein a terminal of the first NMOS transistor is coupled to a terminal of the second NMOS transistor and generates a high negative voltage as the output when the input is low.

2. The negative high voltage level shifter of claim 1 , wherein the deep N-well is driven to zero voltage when the output generates a high negative voltage.

3. The negative high voltage level shifter of claim 1 , further comprising a negative medium voltage level shifter circuit.

4. The negative high voltage level shifter of claim 1 , wherein a Vdd high voltage supply switches to ground when an output of the negative high voltage level shifter generates a negative voltage.

5. A negative high voltage level shifter for receiving an input and generating an output, comprising:

a first inverter for receiving the input and generating a first inverter output;

a second inverter for receiving the first inverter output and generating a second inverter output;

a first PMOS transistor comprising a first terminal coupled to a positive voltage supply, a second terminal, and a gate coupled to the second inverter output;

a second PMOS transistor comprising a first terminal coupled to the second terminal of the first PMOS transistor, a second terminal, and a gate coupled to ground;

a first NMOS transistor comprising a first terminal coupled to the second terminal of the second PMOS transistor, a gate, a second terminal, and a deep N-well;

a second NMOS transistor comprising a first terminal coupled to the second terminal of the first NMOS transistor, a gate, a second terminal coupled to a negative voltage supply, and a deep N-well;

a third PMOS transistor comprising a first terminal coupled to the positive voltage supply, a second terminal, and a gate coupled to the first inverter output;

a fourth PMOS transistor comprising a first terminal coupled to the second terminal of the third PMOS transistor, a second terminal providing the output, and a gate coupled to ground;

a third NMOS transistor comprising a first terminal coupled to the second terminal of the fourth PMOS transistor, a gate, a second terminal, and a deep N-well;

a fourth NMOS transistor comprising a first terminal coupled to the second terminal of the third NMOS transistor, a gate, a second terminal coupled to a negative voltage supply, and a deep N-well;

wherein the gate of the first NMOS transistor and the gate of the third NMOS transistor are coupled to a control signal, the gate of the second NMOS transistor is coupled to the second terminal of the fourth PMOS transistor, and the gate of the fourth NMOS transistor is coupled to the second terminal of the second PMOS transistor;

wherein when the input is zero volts, the output is a negative voltage generated by the negative voltage supply.

6. The negative high voltage level shifter of claim 5 , wherein a bulk of the first PMOS transistor, a bulk of the second PMOS transistor, a bulk of the third PMOS transistor, and a bulk of the fourth PMOS transistor are coupled to the positive voltage supply.

7. A negative high voltage level shifter for receiving an input and generating an output, comprising:

a first inverter for receiving the input and generating a first inverter output;

a second inverter for receiving the first inverter output and generating a second inverter output;

a first PMOS transistor comprising a first terminal coupled to a positive voltage supply, a second terminal, and a gate coupled to the second inverter output;

a first NMOS transistor comprising a first terminal coupled to the second terminal of the first PMOS transistor, a gate, a second terminal coupled to a negative voltage supply, and a deep N-well;

a second PMOS transistor comprising a first terminal coupled to the positive voltage supply, a second terminal, and a gate coupled to the first inverter output; and

a second NMOS transistor comprising a first terminal coupled to the second terminal of the second PMOS transistor, a gate, a second terminal coupled to the negative voltage supply, and a deep N-well;

wherein the gate of the first NMOS transistor is coupled to the second terminal of the second PMOS transistor, and the gate of the second NMOS transistor is coupled to the second terminal of the first PMOS transistor;

wherein when the input is zero volts, the output is a negative voltage generated by the negative voltage supply.

8. The negative high voltage level shifter of claim 7 , wherein a bulk of the first PMOS transistor is coupled to the first terminal of the first PMOS transistor and a bulk of the second PMOS transistor is coupled to the first terminal of the second PMOS transistor.

9. A negative high voltage level shifter for receiving an input and generating an output, comprising:

a first inverter for receiving the input and generating a first inverter output;

a second inverter for receiving the first inverter output and generating a second inverter output;

a first voltage level shifter for receiving the first inverter output and the second inverter output and generating an intermediate stage output, wherein when the input is zero volts, the intermediate stage output is a first negative voltage; and

a second voltage level shifter for receiving the intermediate stage output and the first inverter output and generating the output, wherein when the intermediate stage output is a first negative voltage, the output is a second negative voltage of a larger magnitude than the first negative voltage.

10. The negative high voltage level shifter of claim 9 , wherein the first voltage level shifter comprises:

a first PMOS transistor comprising a first terminal coupled to a first positive voltage supply, a second terminal, and a gate coupled to the second inverter output;

a first NMOS transistor comprising a first terminal coupled to the second terminal of the first PMOS transistor, a gate, a second terminal coupled to a first negative voltage supply for generating the first negative voltage, and a deep N-well;

a second PMOS transistor comprising a first terminal coupled to the first positive voltage supply, a second terminal for providing the intermediate stage output, and a gate coupled to the first inverter output; and

a second NMOS transistor comprising a first terminal coupled to the second terminal of the second PMOS transistor, a gate, a second terminal coupled to the first negative voltage supply, and a deep N-well;

wherein the gate of the first NMOS transistor is coupled to the second terminal of the second PMOS transistor and the gate of the second NMOS transistor is coupled to the second terminal of the first PMOS transistor.

11. The negative high voltage level shifter of claim 10 , wherein the second voltage level shifter comprises:

a third PMOS transistor comprising a first terminal coupled to a second positive voltage supply, a second terminal, and a gate coupled to the intermediate stage output;

a fourth PMOS transistor comprising a first terminal coupled to the second terminal of the third PMOS transistor, a second terminal, and a gate coupled to a first control signal;

a third NMOS transistor comprising a first terminal coupled to the second terminal of the fourth PMOS transistor, a gate coupled to a second control signal, a second terminal, and a deep N-well;

a fourth NMOS transistor comprising a first terminal coupled to the second terminal of the third NMOS transistor, a gate, a second terminal coupled to a second negative voltage supply, and a deep N-well;

a fifth PMOS transistor comprising a first terminal coupled to the second positive voltage supply, a second terminal, and a gate coupled to the first inverter output;

a sixth PMOS transistor comprising a first terminal coupled to the second terminal of the fifth PMOS transistor, a second terminal providing the output, and a gate coupled to the first control signal;

a fifth NMOS transistor comprising a first terminal coupled to the second terminal of the sixth PMOS transistor, a gate, a second terminal, and a deep N-well; and

a sixth NMOS transistor comprising a first terminal coupled to the second terminal of the fifth NMOS transistor, a gate, a second terminal coupled to the second negative voltage supply, and a deep N-well;

wherein the gate of the fourth NMOS transistor is coupled to the second terminal of the sixth PMOS transistor, and the gate of the sixth NMOS transistor is coupled to the second terminal of the fourth PMOS transistor.

12. The negative high voltage level shifter of claim 11 , wherein a bulk of the fourth PMOS transistor is coupled to the first terminal of the fourth PMOS transistor and a bulk of the sixth PMOS transistor is coupled to the first terminal of the sixth PMOS transistor.

13. The negative high voltage level shifter of claim 11 , wherein a bulk of the fourth PMOS transistor is coupled to the first inverter output and a bulk of the sixth PMOS transistor is coupled to the second inverter output.

14. The negative high voltage level shifter of claim 11 , wherein a bulk of the third PMOS transistor and a bulk of the fifth PMOS transistor are coupled to the second positive voltage supply.

15. The negative high voltage level shifter of claim 12 , wherein a bulk of the third PMOS transistor and a bulk of the fifth PMOS transistor are coupled to the second positive voltage supply.

16. The negative high voltage level shifter of claim 13 , wherein a bulk of the third PMOS transistor and a bulk of the fifth PMOS transistor are coupled to the second positive voltage supply.

Assignments (12)
RELEASE OF SECURITY INTEREST Recorded Mar 14, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 060894/0437 →
RELEASE OF SECURITY INTEREST Recorded Mar 11, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059363/0001 →
RELEASE OF SECURITY INTEREST Recorded Mar 10, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059863/0400 →
RELEASE OF SECURITY INTEREST Recorded Mar 9, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059358/0335 →
RELEASE OF SECURITY INTEREST Recorded Feb 28, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059263/0001 →
GRANT OF SECURITY INTEREST IN PATENT RIGHTS Recorded Nov 19, 2021
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 058214/0625 →
SECURITY INTEREST Recorded Jun 4, 2021
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 057935/0474 →
SECURITY INTEREST Recorded Dec 24, 2020
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 055671/0612 →
SECURITY INTEREST Recorded Jun 5, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 052856/0909 →
SECURITY INTEREST Recorded Jun 5, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION
Reel/Frame 053468/0705 →
RELEASE OF SECURITY INTEREST Recorded May 30, 2020
From: JPMORGAN CHASE BANK, N.A, AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 053466/0011 →
SECURITY INTEREST Recorded Apr 24, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 053311/0305 →
Cited By (1)
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