IP Library Granted Patent US 10,446,103
Granted Patent B2
US 10,446,103 · App. 16/245,324 · Granted Oct 15, 2019

Semiconductor device and electronic appliance

Inventors: Jun Koyama (Kanagawa, JP); Atsushi Umezaki (Kanagawa, JP)
Assignee: Semiconductor Energy Laboratory Co., Ltd.
G09G3/3677G11C19/00H01L27/0207H01L27/124H01L27/1225H01L29/7869H03K17/687H03K19/0013H03K19/018557H03K19/018571G09G2310/0251G09G2310/0286G09G2310/0289G09G2330/021
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Quick Facts
Patent No.
US 10,446,103
App. No.
16/245,324
Granted
Oct 15, 2019
Kind
B2
Abstract

The amplitude voltage of a signal input to a level shifter can be increased and then output by the level shifter circuit. Specifically, the amplitude voltage of the signal input to the level shifter can be increased to be output. This decreases the amplitude voltage of a circuit (a shift register circuit, a decoder circuit, or the like) which outputs the signal input to the level shifter. Consequently, power consumption of the circuit can be reduced. Alternatively, a voltage applied to a transistor included in the circuit can be reduced. This can suppress degradation of the transistor or damage to the transistor.

Claims (46)

1. A semiconductor device comprising:

a first transistor, a second transistor, a third transistor, a fourth transistor, a fifth transistor, and a sixth transistor,

wherein the first transistor, the second transistor, the third transistor, the fourth transistor, the fifth transistor, and the sixth transistor have the same conductivity,

wherein one of a source and a drain of the first transistor is electrically connected to a first wiring,

wherein the other of the source and the drain of the first transistor is electrically connected to a second wiring,

wherein one of a source and a drain of the second transistor is electrically connected to a third wiring,

wherein the other of the source and the drain of the second transistor is electrically connected to the second wiring,

wherein one of a source and a drain of the third transistor is electrically connected to a fourth wiring,

wherein the other of the source and the drain of the third transistor is electrically connected to a gate of the first transistor,

wherein a gate of the third transistor is electrically connected to a fifth wiring,

wherein one of a source and a drain of the fourth transistor is electrically connected to the third wiring,

wherein the other of the source and the drain of the fourth transistor is electrically connected to the gate of the first transistor,

wherein a gate of the fourth transistor is electrically connected to a gate of the second transistor,

wherein one of a source and a drain of the fifth transistor is electrically connected to a sixth wiring,

wherein other of the source and the drain of the fifth transistor is electrically connected to the gate of the second transistor,

wherein a gate of the fifth transistor is electrically connected to the sixth wiring,

wherein one of a source and a drain of the sixth transistor is electrically connected to the third wiring,

wherein the other of the source and the drain of the sixth transistor is electrically connected to the gate of the second transistor,

wherein the second wiring is configured to output a signal, and

wherein the sixth wiring is configured to supply a clock signal.

2. The semiconductor device according to claim 1 , wherein a potential supplied to the fifth wiring and a potential supplied to the sixth wiring are inverted.

3. An electronic appliance comprising the semiconductor device according to claim 1 .

4. A semiconductor device comprising:

a first transistor, a second transistor, a third transistor, a fourth transistor, a fifth transistor, a sixth transistor, and a capacitor,

wherein the first transistor, the second transistor, the third transistor, the fourth transistor, the fifth transistor, and the sixth transistor have the same conductivity,

wherein one of a source and a drain of the first transistor is electrically connected to a first wiring,

wherein the other of the source and the drain of the first transistor is electrically connected to a second wiring,

wherein one of a source and a drain of the second transistor is electrically connected to a third wiring,

wherein the other of the source and the drain of the second transistor is electrically connected to the second wiring,

wherein one of a source and a drain of the third transistor is electrically connected to a fourth wiring,

wherein the other of the source and the drain of the third transistor is electrically connected to a gate of the first transistor,

wherein a gate of the third transistor is electrically connected to a fifth wiring,

wherein one of a source and a drain of the fourth transistor is electrically connected to the third wiring,

wherein the other of the source and the drain of the fourth transistor is electrically connected to the gate of the first transistor,

wherein a gate of the fourth transistor is electrically connected to a gate of the second transistor,

wherein one of a source and a drain of the fifth transistor is electrically connected to a sixth wiring,

wherein other of the source and the drain of the fifth transistor is electrically connected to the gate of the second transistor,

wherein a gate of the fifth transistor is electrically connected to the sixth wiring,

wherein one of a source and a drain of the sixth transistor is electrically connected to the third wiring,

wherein the other of the source and the drain of the sixth transistor is electrically connected to the gate of the second transistor,

wherein the second wiring is configured to output a signal,

wherein the sixth wiring is configured to supply a clock signal,

wherein a first electrode of the capacitor is electrically connected to the gate of the second transistor, and

wherein a second electrode of the capacitor is electrically connected to the third wiring.

5. The semiconductor device according to claim 4 , wherein a potential supplied to the fifth wiring and a potential supplied to the sixth wiring are inverted.

6. An electronic appliance comprising the semiconductor device according to claim 4 .

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 11, 2019
From: KOYAMA, JUN; UMEZAKI, ATSUSHI
To: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Reel/Frame 047969/0743 →
Priority Claims (1)
JP 2009-214848 · Sep 16, 2009 · national
Continuity (8)
Continuation 15935150 · Mar 26, 2018
Continuation 15496061 · Apr 25, 2017
Continuation 15175189 · Jun 7, 2016
Continuation 14522817 · Oct 24, 2014
Continuation 14147647 · Jan 6, 2014
Continuation 13921401 · Jun 19, 2013
Continuation 12879610 · Sep 10, 2010
Related Publication 20190237035A1 · Aug 1, 2019
Cited By (3)
US 12,199,106 US 12,406,605 US 12,718,901