Working surface cleaning system and method
View Patent ↗A cleaning film designed to remove foreign matter and particulates from working surfaces of cleaning wafers used in semiconductor processes. These processes include wafer sort test for cleaning of probe card pins and FEOL tooling for cleaning during wafer handling equipment and wafer chucks. The debris collected on the cleaning wafer working surfaces is removed by the particle removal film allowing the debris and foreign matter to be discarded. The use of the cleaning film allows the operator to refresh the cleaning wafer without use of an outside vendor and eliminates wet washing and the use of solvents in the cleaning process.
1. A method for cleaning a cleaning wafer, the method comprising:
securing a cleaning wafer having a working surface that has debris embedded in a top surface of the working surface from cleaning of one of a probe card machine and a front end of line (FEOL) device, said top surface of the working surface having a surface energy level of 10 to 30 dyne/cm; and
removing debris from the top surface of the cleaning wafer by applying a cleaning film having a surface energy level of 40 to 60 dyne/cm to the top surface of the working surface of the cleaning wafer, wherein a difference in the surface energy level between the cleaning film and the working surface of the cleaning wafer causes the debris to release from the top surface of the working surface of the cleaning wafer onto the cleaning film without using a solvent.
2. The method of claim 1 , wherein securing the cleaning wafer further comprises placing the cleaning wafer on a vacuum chuck.
3. The method of claim 1 , wherein applying the cleaning film further comprises removing a protective liner that covers the cleaning film before applying the cleaning film to the top surface of the working surface of the cleaning wafer.
4. The method of claim 1 , wherein applying the cleaning film further comprises using a manual roller to apply the cleaning film to the top surface of the working surface of the cleaning wafer.
5. The method of claim 1 further comprising discarding the cleaning film with the embedded debris.
6. The method of claim 5 further comprising returning the cleaning wafer to service after it has been cleaned using the cleaning film.
7. The method of claim 6 , wherein returning the cleaning wafer to service further comprises installing the cleaning wafer back into the front end of line (FEOL) device.
8. The method of claim 5 , wherein returning the cleaning wafer to service further comprises installing the cleaning wafer back into the probe card machine.