Method for manufacturing semiconductor device
It is an object to provide a highly reliable semiconductor device which includes a thin film transistor having stable electric characteristics. It is another object to manufacture a highly reliable semiconductor device at lower cost with high productivity. In a method for manufacturing a semiconductor device which includes a thin film transistor where a semiconductor layer having a channel formation region, a source region, and a drain region are formed using an oxide semiconductor layer, heat treatment (heat treatment for dehydration or dehydrogenation) is performed so as to improve the purity of the oxide semiconductor layer and reduce impurities such as moisture. Moreover, the oxide semiconductor layer subjected to the heat treatment is slowly cooled under an oxygen atmosphere.
1. A method for manufacturing a semiconductor device comprising:
forming a gate electrode layer over a substrate;
forming a gate insulating layer over the gate electrode layer;
forming a first oxide semiconductor film and a second oxide semiconductor film over the first oxide semiconductor film over the gate insulating layer;
performing first heat treatment on the first oxide semiconductor film and the second oxide semiconductor film in a first chamber in an inert gas atmosphere; and
performing cooling treatment on the first oxide semiconductor film and the second oxide semiconductor film in a second chamber in an oxide atmosphere after the first heat treatment.
2. The method for manufacturing a semiconductor device according to claim 1 ,
wherein transfer from the first chamber to the second chamber is performed in a nitrogen atmosphere or a rare gas atmosphere.
3. The method for manufacturing a semiconductor device according to claim 1 ,
wherein the first heat treatment is performed at a temperature higher than or equal to 400° C. and lower than or equal to 450° C., and
wherein slow cooling in the cooling treatment is performed in a temperature range of a room temperature or higher and lower than 100° C.
4. The method for manufacturing a semiconductor device according to claim 1 ,
wherein the second oxide semiconductor film includes a nanocrystal.
5. A method for manufacturing a semiconductor device comprising:
forming a gate electrode layer over a substrate;
forming a gate insulating layer over the gate electrode layer;
forming a first oxide semiconductor film and a second oxide semiconductor film over the first oxide semiconductor film over the gate insulating layer;
performing first heat treatment on the first oxide semiconductor film and the second oxide semiconductor film in a first chamber in an inert gas atmosphere;
performing cooling treatment on the first oxide semiconductor film and the second oxide semiconductor film in a second chamber in an oxide atmosphere after the first heat treatment;
forming a first oxide semiconductor layer and a second oxide semiconductor layer by etching the first oxide semiconductor film and the second oxide semiconductor film after the cooling treatment;
forming a source electrode layer and a drain electrode layer over the second oxide semiconductor layer;
forming an oxide insulating layer including a region in contact with a top surface of the first oxide semiconductor layer and a region in contact with a side surface of the second oxide semiconductor layer between the source electrode layer and the drain electrode layer; and
performing second heat treatment in a nitrogen atmosphere or an air atmosphere after the oxide insulating layer is formed,
wherein the first oxide semiconductor layer and the second oxide semiconductor layer each include In, Ga, and Zn.
6. The method for manufacturing a semiconductor device according to claim 5 ,
wherein transfer from the first chamber to the second chamber is performed in a nitrogen atmosphere or a rare gas atmosphere.
7. The method for manufacturing a semiconductor device according to claim 5 ,
wherein the first heat treatment is performed at a temperature higher than or equal to 400° C. and lower than or equal to 450° C.,
wherein slow cooling in the cooling treatment is performed in a temperature range of a room temperature or higher and lower than 100° C., and
wherein the second heat treatment is performed at a temperature higher than or equal to 150° C. and lower than 350° C.
8. The method for manufacturing a semiconductor device according to claim 5 ,
wherein the second oxide semiconductor film includes a nanocrystal.
9. A method for manufacturing a semiconductor device comprising:
forming a gate electrode layer over a substrate;
forming a gate insulating layer over the gate electrode layer;
forming a first oxide semiconductor film and a second oxide semiconductor film over the first oxide semiconductor film over the gate insulating layer;
performing first heat treatment on the first oxide semiconductor film and the second oxide semiconductor film in a first chamber in an inert gas atmosphere;
performing cooling treatment on the first oxide semiconductor film and the second oxide semiconductor film in the first chamber in an oxide atmosphere after the first heat treatment;
forming a first oxide semiconductor layer and a second oxide semiconductor layer by etching the first oxide semiconductor film and the second oxide semiconductor film after the cooling treatment;
forming a source electrode layer and a drain electrode layer over the second oxide semiconductor layer;
forming an oxide insulating layer including a region in contact with a top surface of the first oxide semiconductor layer and a region in contact with a side surface of the second oxide semiconductor layer between the source electrode layer and the drain electrode layer; and
performing second heat treatment in a nitrogen atmosphere or an air atmosphere after the oxide insulating layer is formed,
wherein the first oxide semiconductor layer and the second oxide semiconductor layer each include In, Ga, and Zn.
10. The method for manufacturing a semiconductor device according to claim 9 ,
wherein the first heat treatment is performed at a temperature higher than or equal to 400° C. and lower than or equal to 450° C.,
wherein slow cooling in the cooling treatment is performed in a temperature range of a room temperature or higher and lower than 100° C., and
wherein the second heat treatment is performed at a temperature higher than or equal to 150° C. and lower than 350° C.
11. The method for manufacturing a semiconductor device according to claim 9 ,
wherein the second oxide semiconductor film includes a nanocrystal.