Multi-chip packaging
An electronic device may include a first die that may include a first set of die contacts. The electronic device may include a second die that may include a second set of die contacts. The electronic device may include a bridge interconnect that may include a first set of bridge contacts and may include a second set of bridge contacts. The first set of bridge contacts may be directly coupled to the first set of die contacts (e.g., with an interconnecting material, such as solder). The second set of bridge contacts may be directly coupled to the second set of die contacts (e.g., with solder). The bridge interconnect may help facilitate electrical communication between the first die and the second die.
1. A multi-chip package, comprising:
a bridge interconnect in a molding material, the bridge interconnect comprising a first plurality of bridge contacts and a second plurality of bridge contacts, and the bridge interconnect having a bottommost surface;
a first die via and a second die via in the molding material, the first die via and the second die via laterally adjacent to a first side of the bridge interconnect, and the first die via and the second die via each having a bottommost surface co-planar with the bottommost surface of the bridge interconnect;
a third die via and a fourth die via in the molding material, the third die via and the fourth die via laterally adjacent to a second side of the bridge interconnect, the second side opposite the first side, and the third die via and the fourth die via each having a bottommost surface co-planar with the bottommost surface of the bridge interconnect;
a first die electrically coupled to the first plurality of bridge contacts of the bridge interconnect, and the first die electrically coupled to the first die via and to the second die via;
a second die electrically coupled to the second plurality of bridge contacts of the bridge interconnect, and the second die electrically coupled to the third die via and to the fourth die via;
a plurality of solder balls below molding material;
an underfill material laterally surrounding the plurality of solder balls and along sides of the molding material, wherein the underfill material has an uppermost surface below a bottommost surface of a semiconductor material of the first die or the second die;
a substrate having a top surface opposite a bottom surface, the top surface coupled to the plurality of solder balls; and
a plurality of interconnects coupled to the bottom of the substrate.
2. The multi-chip package of claim 1 , wherein the bridge interconnect is in direct contact with the molding material.
3. The multi-chip package of claim 1 , wherein the first die via, the second die via, the third die via, and the fourth die via are in direct contact with the molding material.
4. The multi-chip package of claim 1 , wherein the bridge interconnect is in direct contact with the molding material, and wherein the first die via, the second die via, the third die via, and the fourth die via are in direct contact with the molding material.
5. The multi-chip package of claim 1 , wherein the molding material has a bottommost surface co-planar with the bottommost surface of the bridge interconnect.
6. The multi-chip package of claim 1 , further comprising:
a second bridge interconnect in the molding material, wherein one of the first die or the second die is coupled to the second bridge interconnect; and
a third die electrically coupled to the second bridge interconnect.
7. The multi-chip package of claim 1 , further comprising:
a substrate beneath the molding material; and
the underfill material between the molding material and the substrate.
8. The multi-chip package of claim 1 , wherein the underfill material is further along a side of the molding material.
9. The multi-chip package of claim 1 , wherein the bridge interconnect further comprises a bridge via.
10. The multi-chip package of claim 9 , wherein the bridge via is a through silicon via.
11. The multi-chip package of claim 1 , wherein the first die via, the second die via, the third die via, and the fourth die via extend above the bridge interconnect.
12. The multi-chip package of claim 1 , wherein the molding material is further laterally between the first die and the second die.
13. A multi-chip package, comprising:
a bridge interconnect in a molding material, the bridge interconnect comprising a first plurality of bridge contacts and a second plurality of bridge contacts on an uppermost surface, and the bridge interconnect having a third plurality of bridge contacts on a bottommost surface;
a first die via and a second die via in the molding material, the first die via and the second die via laterally adjacent to a first side of the bridge interconnect;
a third die via and a fourth die via in the molding material, the third die via and the fourth die via laterally adjacent to a second side of the bridge interconnect, the second side opposite the first side;
a first die electrically coupled to the first plurality of bridge contacts of the bridge interconnect, and the first die electrically coupled to the first die via and to the second die via;
a second die electrically coupled to the second plurality of bridge contacts of the bridge interconnect, and the second die electrically coupled to the third die via and to the fourth die via;
a plurality of solder balls below molding material;
an underfill material laterally surrounding the plurality of solder balls and along sides of the molding material, wherein the underfill material has an uppermost surface below a bottommost surface of a semiconductor material of the first die or the second die;
a substrate having a top surface opposite a bottom surface, the top surface coupled to the plurality of solder balls; and
a plurality of interconnects coupled to the bottom of the substrate.
14. The multi-chip package of claim 13 , wherein the bridge interconnect is in direct contact with the molding material.
15. The multi-chip package of claim 13 , wherein the first die via, the second die via, the third die via, and the fourth die via are in direct contact with the molding material.
16. The multi-chip package of claim 13 , wherein the bridge interconnect is in direct contact with the molding material, and wherein the first die via, the second die via, the third die via, and the fourth die via are in direct contact with the molding material.
17. The multi-chip package of claim 13 , further comprising:
a second bridge interconnect in the molding material, wherein one of the first die or the second die is coupled to the second bridge interconnect; and
a third die electrically coupled to the second bridge interconnect.
18. The multi-chip package of claim 13 , further comprising:
a substrate beneath the molding material; and
the underfill material between the molding material and the substrate.
19. The multi-chip package of claim 13 , wherein the underfill material is further along a side of the molding material.
20. The multi-chip package of claim 13 , wherein the bridge interconnect further comprises a bridge via.
21. The multi-chip package of claim 20 , wherein the bridge via is a through silicon via.
22. The multi-chip package of claim 13 , wherein the first die via, the second die via, the third die via, and the fourth die via extend above the bridge interconnect.
23. The multi-chip package of claim 13 , wherein the molding material is further laterally between the first die and the second die.