IP Library › Granted Patent US 11,984,298
Granted Patent B2
US 11,984,298 · App. 17/756,058 · Granted May 14, 2024

Impedance transformation in radio-frequency-assisted plasma generation

Inventors: Eller Y. Juco (Tualatin, OR); Thomas Lee Frederick (West Linn, OR); Karl Frederick Leeser (West Linn, OR); Paul Konkola (West Linn, OR)
Assignee: Lam Research Corporation
H01J37/32183H01J37/32082H03H7/40
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Quick Facts
Patent No.
US 11,984,298
App. No.
17/756,058
Granted
May 14, 2024
Kind
B2
Abstract

An apparatus for providing signals to a device may include one or more radio frequency signal generators, and electrically-small transmission line, which coupled signals from the one or more RF signal generators to a fabrication chamber. The apparatus may additionally include a reactive circuit to transform impedance of the electrically-small transmission line from a region of relatively high impedance-sensitivity to region of relatively low impedance-sensitivity.

Claims (30)

1. An apparatus for providing signals to a device, comprising:

one or more radiofrequency (RF) signal generators;

one or more electrically-small transmission lines to couple signals from the one or more RF signal generators to a fabrication chamber; and

a reactive circuit to transform impedance of each of the one or more electrically-small transmission lines from a region having a first impedance-sensitivity to a region having a second impedance-sensitivity.

2. The apparatus of claim 1 , wherein the reactive circuit comprises at least series reactance.

3. The apparatus of claim 1 , wherein the reactive circuit comprises at least shunt susceptance.

4. The apparatus of claim 1 , wherein the reactive circuit comprises at least series reactance and shunt susceptance.

5. The apparatus of claim 1 , wherein the region having the first impedance-sensitivity corresponds to a region of relatively high impedance-sensitivity in an impedance space and wherein the real part of the impedance corresponds to a value greater than about 100 ohms.

6. The apparatus of claim 1 , wherein the region having the second impedance-sensitivity corresponds to a region of relatively low impedance-sensitivity in an impedance space and wherein the real part of the impedance corresponds to a value less than about 100 ohms.

7. The apparatus of claim 1 , wherein the reactive circuit to transform the impedance avoids the possibility of a resonant transmission line at any frequency less than the frequency of the signals from the one or more RF signal generators.

8. The apparatus of claim 1 , wherein an electrically-small transmission line of the one or more electrically-small transmission lines corresponds to a transmission line that transforms an impedance from a region of relatively high impedance-sensitivity to a region of relatively low impedance-sensitivity without traversing a transmission line resonance at a frequency less than the frequency of the signal generated by an RF signal generator of the one or more RF signal generators in a medium of the transmission line.

9. The apparatus of claim 1 , wherein a resistive loss of the electrically-small transmission line combined with a loss of the reactive circuit correspond to less than about 20%.

10. The apparatus of claim 1 , wherein a resistive loss of the electrically-small transmission line corresponds to less than 10%.

11. An apparatus, comprising:

an electrically-small transmission line to couple signals from one or more of RF signal generators to a fabrication chamber; and

a reactive circuit to transform impedance of the electrically-small transmission line from a region of relatively high impedance-sensitivity to a region of relatively low impedance-sensitivity, the reactive circuit operating to move an impedance control point in a direction opposite to the direction moved by a length of transmission line.

12. The apparatus of claim 11 , wherein the electrically-small transmission line corresponds to a transmission line that moves the impedance control point from the region of relatively high impedance-sensitivity to the region of relatively low impedance-sensitivity without traversing a transmission line resonance at a frequency less than the frequency of the signal generated by the RF signal generator in a medium of the transmission line.

13. The apparatus of claim 11 , wherein the reactive circuit comprises series capacitive reactance.

14. The apparatus of claim 11 , wherein the reactive circuit comprises at least shunt inductive susceptance.

15. The apparatus of claim 11 , wherein the reactive circuit comprises series capacitive reactance and shunt inductive susceptance.

16. The apparatus of claim 11 , wherein the resistive loss of the electrically-small transmission line combined with the loss of the reactive circuit correspond to less than about 20%.

17. The apparatus of claim 12 , wherein the resistive loss of the electrically-small transmission line corresponds to less than 10%.

18. An integrated circuit fabrication chamber, comprising:

a plurality of integrated circuit fabrication stations;

one or more input ports for coupling a radio frequency (RF) signal to at least one of the plurality of integrated circuit fabrication stations;

an electrically-small transmission line to couple signals from one or more of RF signal generators to the integrated circuit fabrication chamber; and

a reactive circuit to transform impedance of the electrically-small transmission line from a region of relatively high impedance-sensitivity to a region of relatively low impedance-sensitivity.

19. The apparatus of claim 18 , wherein the region of relatively high impedance-sensitivity corresponds to a region in an impedance space and wherein the real part of the impedance corresponds to a value greater than about 100 ohms.

20. The apparatus of claim 18 , wherein the region of relatively low impedance-sensitivity corresponds to a region in an impedance space and wherein the real part of the impedance corresponds to a value less than about 100 ohms.

21. The apparatus of claim 1 , wherein the region having the first impedance-sensitivity corresponds to a region having low impedance-sensitivity and wherein the region having the second impedance-sensitivity corresponds to a region having high impedance-sensitivity.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 14, 2022
From: JUCO, ELLER Y.; FREDERICK, THOMAS LEE; LEESER, KARL FREDERICK; KONKOLA, PAUL
To: LAM RESEARCH CORPORATION
Reel/Frame 060189/0699 →
Continuity (3)
Provisional Application 62705293 · Jun 19, 2020
Provisional Application 62942458 · Dec 2, 2019
Related Publication 20220415616A1 · Dec 29, 2022
Cited By (5)
US 12,205,796 US 12,283,462 US 12,394,601 US 12,626,895 US 12,738,455