Continuous scanning optical assembly and method of use thereof
The present disclosure provides an automated sample analyzer having a continuous scanning optical assembly for performing an assay. The optical assembly allows for robust detection of light emitted from a reaction mixture in a dynamically changing environment, such as detection of light from a reaction mixture that is being rotated about an axis at high rotational velocity.
1 . An automated sample analyzer comprising:
a) a rotation assembly operable to start and stop continuous rotation of a substrate, the substrate having a well disposed within a perimeter of the substrate, wherein the well is configured to hold a reaction mixture including a sample and reagent wherein the reaction mixture comprises a fluorescently labeled moiety, wherein the fluorescently labeled moiety comprises a bead and wherein the bead is magnetic;
b) an optical assembly having an illumination source and an illumination detector, wherein the optical assembly is operable to irradiate the reaction mixture with light emitted from the illumination source and detect emission light from the reaction mixture via the illumination detector, and
wherein the optical assembly is configured to generate a coincidence focal point comprising an illumination light path focal point and a detection light path focal point on a plane of rotation of the substrate; and
c) a processor operable to control movement of the rotation assembly, wherein the processor includes functionality to cause the rotation assembly to continually rotate the substrate and adjust a height of the plane of rotation of the substrate relative to the coincidence focal point.
2 . The automated sample analyzer of claim 1 , wherein the substrate is a disc and the well is disposed within a circumference of the disc.
3 . The automated sample analyzer of claim 1 , wherein the plane of rotation is perpendicular to an optical axis of light emitted from the illumination source.
4 . The automated sample analyzer of claim 1 , wherein the height of the plane of rotation is adjusted based on detected emission light.
5 . The automated sample analyzer of claim 1 , wherein the processor includes functionality to determine when the coincident focal point coincides with a bottom of the well.
6 . The automated sample analyzer of claim 1 , wherein the processor includes functionality to determine when the coincident focal point coincides with a location within the well.
7 . The automated sample analyzer of claim 1 , wherein the processor includes functionality to cause the rotation assembly to move the substrate a distance in a direction parallel to the plane of rotation or tilt the substrate to alter the plane of rotation.
8 . The automated sample analyzer of claim 1 , further comprising one or more imaging devices.
9 . The automated sample analyzer of claim 8 , wherein the one or more imaging devices is operably coupled to the processor and/or the optical assembly.
10 . The automated sample analyzer of claim 1 , wherein the processor includes functionality to quantitate an amount of an analyte within the reaction mixture based on the amount of detected emission light.
11 . The automated sample analyzer of claim 1 , wherein the optical assembly is configured such that an optical axis of the light emitted from the illumination source is substantially parallel to an optical axis of light detected by the illumination detector.
12 . The automated sample analyzer of claim 1 , wherein the processor includes functionality to continually collect and process sequential measurements of detected emission light at dynamic intervals during rotation of the substrate.
13 . The automated sample analyzer of claim 12 , wherein the processor includes functionality to correlate sequential measurements of detected emission light with the well.
14 . The automated sample analyzer of claim 1 , wherein the substrate has a plurality of wells, each containing a reaction mixture.
15 . The automated sample analyzer of claim 14 , wherein the processor includes functionality to quantitate an amount of an analyte within each reaction mixture based on detected emission light of each reaction mixture.
16 . An automated sample analyzer comprising:
a) a rotation assembly operable to start and stop continuous rotation of a substrate, the substrate having a well disposed within a perimeter of the substrate, wherein the well is configured to hold a reaction mixture including a sample and reagent further comprising a magnetic source configured to interact with the reaction mixture;
b) an optical assembly having an illumination source and an illumination detector, wherein the optical assembly is operable to irradiate the reaction mixture with light emitted from the illumination source and detect emission light from the reaction mixture via the illumination detector, and
wherein the optical assembly is configured to generate a common illumination light path focal point and detection light path focal point on a plane of rotation of the substrate; and
c) a processor operable to control movement of the rotation assembly, wherein the processor includes functionality to cause the rotation assembly to continually rotate the substrate and adjust a height of the plane of rotation of the substrate relative to the common focal points.
17 . An automated sample analyzer comprising:
a) a rotation assembly operable to start and stop continuous rotation of a substrate, the substrate having a well disposed within a perimeter of the substrate, wherein the well is configured to hold a reaction mixture including a sample and reagent;
b) an optical assembly having an illumination source and an illumination detector, wherein the optical assembly is operable to irradiate the reaction mixture with light emitted from the illumination source and detect emission light from the reaction mixture via the illumination detector, wherein the illumination source light path includes an objective lens, wherein the optical assembly is configured such that a back aperture of the lens is under filled and
wherein the optical assembly is configured to generate a common illumination light path focal point and detection light path focal point on a plane of rotation of the substrate; and
c) a processor operable to control movement of the rotation assembly, wherein the processor includes functionality to cause the rotation assembly to continually rotate the substrate and adjust a height of the plane of rotation of the substrate relative to the common focal point.