Method for growing crystals
A method for growing crystals using PVT or PVD or CVD, includes: providing: a chamber for crystal growth, a crucible in the chamber including at least one deposition section with a seed crystal and a base material for crystal growth, at least one temperature monitoring device, a gas supply device and at least one fluid inlet and outlet, and a pressure monitoring device; evacuating the chamber using a pumping device; flushing the chamber with inert gas; heating the chamber to a growth temperature of 2000 to 2400° C. using at least one heating device; decreasing pressure to 0.1 to 100 mbar; supplying a dopant (during a growth process); regulating process parameters in the growth process; increasing chamber pressure at the growth process end; cooling down the chamber; wherein the heating of the chamber from an ambient temperature to the growth temperature occurs within 10 to 10000 minutes.
1. A method for growing crystals by means of PVT or PVD or CVD or epitaxial sublimation, comprising the steps;
providing a chamber ( 11 ) for the crystal growth;
providing a crucible ( 1 ), which is arranged in the chamber ( 11 ), and which crucible ( 1 ) comprises at least one deposition section with a seed crystal ( 2 ) and a base material ( 3 ) for growing a crystal;
providing at least one temperature monitoring device ( 6 ),
providing a gas supply device ( 4 ) and at least one fluid inlet and outlet ( 17 ),
providing a pressure monitoring device ( 8 ),
evacuating the chamber ( 11 ) by means of a pumping device ( 9 )
flushing the chamber ( 11 ) with an inert gas,
heating the chamber ( 11 ) to a growth temperature of 2000 to 2400° C. by means of at least one heating device ( 5 );
decreasing the pressure to 0.1 to 100 mbar;
supplying a dopant;
regulating the process parameters in the growth process
increasing the pressure in the chamber ( 11 ) at the end of the growth process
cooling down the chamber ( 11 )
wherein the heating of the chamber ( 11 ) from an ambient temperature to the growth temperature occurs within 10 to 10000 minutes and
wherein a resistance measuring device is provided, wherein the resistance measuring device determines the Si and/or C content in the gas phase in the chamber ( 11 ) by a resistance measurement ( 18 ), which detects a change in a specific resistance due to the deposition of Si.
2. The method according to claim 1 , wherein an open loop and closed loop control device ( 7 ) is provided, which is connected to the at least one temperature monitoring device ( 6 ) and the at least one heating device ( 5 ) and regulates a heating power dependent on a temperature measured.
3. The method according to claim 2 , wherein the open loop and closed loop control device ( 7 ) is connected to the gas supply device ( 4 ) and pressure monitoring device ( 8 ) and regulates the pressure of the chamber ( 11 ) dependent on the temperature.
4. The method according to claim 1 , wherein the at least one heating device ( 5 ) comprises an RF coil ( 14 ) and/or a resistance heater ( 10 ).
5. The method according to claim 1 , wherein a spectroscopic measuring device ( 19 ) is further provided.
6. The method according to claim 2 , wherein the open loop and closed loop control device ( 7 ) is connected to the resistance measuring device and regulates the heating power and/or the pressure dependent on the Si and/or C content determined by the resistance measuring device.
7. The method according to claim 1 , wherein the cooling of the chamber ( 11 ) is carried out in a regulated manner with a cooling speed of 0.1 to 30° C./min.
8. The method according to claim 1 , wherein the cooling of the chamber ( 11 ) is carried out by means of a cooling fluid.
9. The method according to claim 2 , wherein the cooling of the chamber ( 11 ) is carried out by controlling the heating power by means of the open loop and closed loop control device ( 7 ).
10. The method according to claim 1 , wherein the chamber ( 11 ) is brought to a pressure of 700 to 900 mbar during flushing with the inert gas.
11. The method according to claim 1 , wherein the at least one temperature monitoring device ( 6 ) comprises a pyrometer and the dopant is nitrogen.
12. The method according to claim 5 , wherein the spectroscopic measuring device ( 19 ) is an atomic absorption spectrometry (AAS) measuring device or a mass spectrometry measuring device.
13. The method according to claim 10 , wherein the inert gas is argon.