IP Library › Granted Patent US 12,464,875
Granted Patent B2
US 12,464,875 · App. 18/047,903 · Granted Nov 4, 2025

Highly efficient microdevices

Inventors: Gholamreza Chaji (Waterloo, CA); Ehsanollah Fathi (Waterloo, CA); Yunhan Li (Kitchener, CA); Hossein Zamani Siboni (Waterloo, CA)
Assignee: VueReal Inc.
H10H20/857H10H20/0137H10H20/8314
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Quick Facts
Patent No.
US 12,464,875
App. No.
18/047,903
Granted
Nov 4, 2025
Kind
B2
Abstract

Methods and structures are disclosed for highly efficient vertical devices. The vertical device comprising a plurality of planar active layers formed on a substrate, at least one of a top layer of the plurality of the layers is formed as a plurality of nano-pillars and a passivation layer formed on a space between the plurality of the nanopillars.

Claims (24)

1 . A vertical device comprising:

a plurality of planar active layers formed on a substrate, at least one layer of the plurality of planar active layers including one or more defects;

a plurality of nano-pillars on a top layer of the plurality of planar active layers that are spaced apart to define a repeating arrangement of nano-pillars, nano-pillars in the repeating arrangement of nano-pillars defined by a predetermined radius and separated by a predetermined distance;

a first passivation layer comprising a dielectric layer formed on the top layer of the plurality of planar active layers covering a space between the plurality of nano-pillars and at least a part of sidewalls of the plurality of nano-pillars, wherein the first passivation layer covers one or more gaps in the top layer of the plurality of planar active layers corresponding to the one or more defects; and

a gate electrode comprising a conductive layer formed on a part of the first passivation layer covering at least in part the space between the plurality of nano-pillars and the part of the sidewalls of the plurality of nano-pillars covered by the first passivation layer,

wherein the gate electrode is configured to bias the plurality of nano-pillars to control a charge accumulated on a surface of the plurality of nano-pillars or a current passing through the plurality of nano-pillars to the plurality of planar active layers such that the gate electrode, the first passivation layer, and the plurality of nano-pillars act as a vertical transistor in series with the plurality of planar active layers of the vertical device.

2 . The vertical device of claim 1 , further comprising:

a second passivation layer formed over the gate electrode; and

a device electrode formed over the second passivation layer to create a functional area for the vertical device, wherein the device electrode comprises one of: a filler layer or a reflector.

3 . The vertical device of claim 2 , further comprising:

an ohmic contact layer formed on a top surface of at least one nano-pillar of the plurality of nano-pillars to create one or more nano-contacts.

4 . The vertical device of claim 3 , wherein the device electrode comprises a separate electrode or a part of the one or more nano-contacts.

5 . The vertical device of claim 1 , wherein the plurality of nano-pillars is formed by etching down at least one planar layer formed on top of the plurality of planar active layers formed on the substrate.

6 . The vertical device of claim 1 , wherein the dielectric layer and the conductive layer are configured to spread to other areas of the vertical device.

7 . The vertical device of claim 1 , further comprising:

a filler layer formed on a top surface of the first passivation layer or formed on the top layer of the plurality of planar active layers instead of the first passivation layer, the filler layer including one of: a polymer, a solgel, and a dielectric.

8 . The vertical device of claim 7 , wherein the filler layer further includes a color conversion layer.

9 . A vertical device comprising:

a substrate;

a plurality of planar active layers formed on the substrate;

a plurality of nano-pillars comprising a doped layer coupled to the plurality of planar active layers, at least a portion of the doped layer being thinned to form the plurality of nano-pillars;

a passivation layer comprising a dielectric layer formed on a top layer of the plurality of planar active layers, the dielectric layer covering a space between the plurality of nano-pillars and a part of sidewalls of the plurality of nano-pillars; and

a gate electrode comprising a conductive layer formed at least on a part of the passivation layer covering the space between the plurality of nano-pillars and the part of the sidewalls of the plurality of nano-pillars,

wherein the gate electrode is configured to bias the plurality of nano-pillars to control a charge accumulated on a surface of the plurality of nano-pillars or a current passing through the plurality of nano-pillars to the plurality of planar active layers such that the gate electrode, the passivation layer, and the plurality of nano-pillars act as a vertical transistor in series with the plurality of planar active layers of the vertical device.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 20, 2022
From: CHAJI, GHOLAMREZA; FATHI, EHSANOLLAH; LI, YUNHAN; SIBONI, HOSSEIN ZAMANI
To: VUEREAL INC.
Reel/Frame 061481/0451 →
Continuity (4)
Division 16535866 · Aug 8, 2019
Provisional Application 62793017 · Jan 16, 2019
Provisional Application 62733434 · Sep 19, 2018
Related Publication 20230055752A1 · Feb 23, 2023
References Cited (49)
US 8080468B2 · Scherer · 2011 [cited by examiner]
US 8476637B2 · Kim et al. · 2013 [cited by applicant]
US 8664636B2 · Konsek et al. · 2014 [cited by applicant]
US 8946675B2 · Yu et al. · 2015 [cited by applicant]
US 9362448B2 · Choi et al. · 2016 [cited by applicant]
US 9385266B2 · Cha · 2016 [cited by applicant]
US 9490395B2 · Hwang et al. · 2016 [cited by applicant]
US 10283565B1 · Xu · 2019 [cited by applicant]
US 10388224B2 · Kim · 2019 [cited by applicant]
US 10431717B1 · Dasgupta · 2019 [cited by applicant]
US 10811528B2 · Ebrish · 2020 [cited by applicant]
US 20030111447A1 · Corkum · 2003 [cited by examiner]
US 20030235970A1 · Hsu et al. · 2003 [cited by applicant]
US 20040113155A1 · Lai · 2004 [cited by applicant]
US 20040144985A1 · Zhang et al. · 2004 [cited by applicant]
US 20070077670A1 · Kim · 2007 [cited by examiner]
US 20070126013A1 · Kim · 2007 [cited by examiner]
US 20080128727A1 · Erchak et al. · 2008 [cited by applicant]
US 20080142782A1 · Moon et al. · 2008 [cited by applicant]
US 20130341589A1 · Yu et al. · 2013 [cited by applicant]
US 20140173448A1 · Aly · 2014 [cited by applicant]
US 20140353593A1 · Smets · 2014 [cited by applicant]
US 20150053929A1 · Lee et al. · 2015 [cited by applicant]
US 20170005207A1 · Li · 2017 [cited by applicant]
US 20170352776A1 · Shur · 2017 [cited by applicant]
US 20180204977A1 · Dheeraj · 2018 [cited by applicant]
US 20180237649A1 · Pan · 2018 [cited by applicant]
US 20180269355A1 · Jain · 2018 [cited by applicant]
US 20180351035A1 · Chung · 2018 [cited by applicant]
US 20190006413A1 · Jacob · 2019 [cited by examiner]
US 20190123238A1 · Moosburger · 2019 [cited by applicant]
US 20190355868A1 · Fimland · 2019 [cited by applicant]
US 20190363234A1 · Varghese · 2019 [cited by applicant]
US 20200028027A1 · Daudin · 2020 [cited by applicant]
US 20200135982A1 · Choi · 2020 [cited by applicant]
US 20200152833A1 · Kaseya · 2020 [cited by applicant]
US 20200161504A1 · Fimland · 2020 [cited by applicant]
US 20200251629A1 · Kaseya · 2020 [cited by applicant]
US 20200274029A1 · Schneider, Jr. · 2020 [cited by applicant]
US 20200279974A1 · Noda · 2020 [cited by applicant]
CN 102185043A · 2011 [cited by applicant]
CN 103943733A · 2014 [cited by applicant]
CN 106067461A1 · 2016 [cited by applicant]
CN 108461593A · 2018 [cited by applicant]
KR 20110133137A · 2011 [cited by applicant]
TW 201712891A · 2017 [cited by applicant]
Ding et al., “Guided mode caused by silicon nanopillar array for light emission enhancement in color-converting LED,” Opt. Express 23, pp. 21477-21489 (2015). [cited by applicant]
Son et al., “Low voltage operation of GaN vertical nanowire MOSFET,” Solid-State Electronics 145: 1-7 (2018). [cited by applicant]
Zhi et al., “Fabrication and Luminescent Property of GaN Based Light-emitting Diodes with Array Nanorods Structure,” Chinese Journal of Luminescence, 2016,37(12): 1538-1544 DOI: 10.3788/fgxb20163712.1538 (with English A… [cited by applicant]