IP Library › Granted Patent US 12,575,418
Granted Patent B2
US 12,575,418 · App. 18/119,327 · Granted Mar 10, 2026

Semiconductor packages having organic material layer between through-via structure and encapsulant that surrounds a portion of semiconductor chip

Inventors: Jingu Kim (Suwon-si, KR); Yieok Kwon (Suwon-si, KR); Sangkyu Lee (Suwon-si, KR); Taesung Jeong (Suwon-si, KR)
Assignee: Samsung Electronics Co., Ltd.
H01L23/562H01L23/295H01L23/3128H01L23/49811H01L23/49822H01L23/49894H01L24/16H01L24/48H01L2224/16227H01L2224/48145H01L2224/48227H10B80/00
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Quick Facts
Patent No.
US 12,575,418
App. No.
18/119,327
Granted
Mar 10, 2026
Kind
B2
Abstract

A semiconductor package includes a first redistribution structure including a first redistribution layer; a semiconductor chip on a first surface of the first redistribution structure and including a connection pad electrically connected to the first redistribution layer; an encapsulant that surrounds at least a portion of the semiconductor chip; a second redistribution structure on the encapsulant and including a second redistribution layer; a through-via structure that extends through the encapsulant and electrically connects the first redistribution layer to the second redistribution layer; an organic material layer between the through-via structure and the encapsulant and having an elongation rate greater than an elongation rate of the encapsulant; and a bump structure on a second surface of the first redistribution structure.

Claims (52)

1 . A semiconductor package, comprising:

a first redistribution structure including a first redistribution layer;

a semiconductor chip on a first surface of the first redistribution structure and including a connection pad electrically connected to the first redistribution layer;

an encapsulant that surrounds at least a portion of the semiconductor chip;

a second redistribution structure on the encapsulant and including a second redistribution layer;

a through-via structure that extends through the encapsulant and electrically connects the first redistribution layer to the second redistribution layer;

an organic material layer between the through-via structure and the encapsulant and having an elongation rate greater than an elongation rate of the encapsulant; and

a bump structure on a second surface of the first redistribution structure,

wherein the organic material layer includes a compound having a mercapto group or a phosphate compound,

wherein the mercapto group includes at least one of 2-mercapto-5-methoxy benzimidazole, 2-mercapto-1-methylimidazole, 2-mercapto-5-methoxy benzothiazole, or 3-mercaptopropyl(dimethoxy)methylsilane, and

wherein the phosphate compound includes triphenyl phosphate.

2 . The semiconductor package of claim 1 , wherein the encapsulant includes an insulating resin impregnated with an inorganic filler.

3 . The semiconductor package of claim 2 , wherein the encapsulant includes an Epoxy Molding Compound.

4 . The semiconductor package of claim 1 , wherein the elongation rate of the organic material layer is 3% or more.

5 . The semiconductor package of claim 4 , wherein the elongation rate of the organic material layer is in a range of 3% to 20%.

6 . The semiconductor package of claim 1 , wherein the organic material layer extends along an outer surface of the through-via structure, the outer surface of the through-via structure extending perpendicularly to the first surface of the first redistribution structure.

7 . The semiconductor package of claim 1 , wherein at least a portion of the organic material layer is in contact with the first surface of the first redistribution structure.

8 . The semiconductor package of claim 1 , wherein at least a portion of the organic material layer extends to a side surface of the encapsulant.

9 . The semiconductor package of claim 1 ,

wherein the first redistribution layer includes a first pad portion on the first surface of the first redistribution structure, and

wherein a first barrier layer is on the first pad portion.

10 . The semiconductor package of claim 9 , wherein the first barrier layer includes nickel (Ni), gold (Au), or alloys thereof.

11 . The semiconductor package of claim 9 , wherein the semiconductor chip further includes a connection bump in contact with the first barrier layer and the connection pad.

12 . The semiconductor package of claim 1 ,

wherein the second redistribution layer includes a second pad portion on the second redistribution structure, and

wherein a second barrier layer is on the second pad portion.

13 . The semiconductor package of claim 1 ,

wherein the first redistribution structure further includes a first redistribution via electrically connected to the first redistribution layer, and

wherein the first redistribution via is in direct contact with the connection pad.

14 . A semiconductor package, comprising:

a first redistribution structure including a first redistribution layer;

a semiconductor chip on the first redistribution structure and electrically connected to the first redistribution layer;

a second redistribution structure on the semiconductor chip and including a second redistribution layer;

through-via structures between the first redistribution structure and the second redistribution structure and electrically connecting the first redistribution layer to the second redistribution layer;

an organic material layer on the through-via structures and including an organic compound; and

an encapsulant in a space between the first redistribution structure and the second redistribution structure and on the organic material layer,

wherein the organic material layer includes a compound having a mercapto group or a phosphate compound,

wherein the mercapto group includes at least one of 2-mercapto-5-methoxy benzimidazole, 2-mercapto-1-methylimidazole, 2-mercapto-5-methoxy benzothiazole, or 3-mercaptopropyl(dimethoxy)methylsilane, and

wherein the phosphate compound includes triphenyl phosphate.

15 . The semiconductor package of claim 14 ,

wherein the through-via structures include a first through-via structure and a second through-via structure adjacent to each other, and

wherein the organic material layer includes a first portion on the first through-via structure and a second portion on the second through-via structure.

16 . The semiconductor package of claim 15 , wherein the organic material layer further includes a third portion extending along a first surface of the first redistribution structure and connecting the first portion to the second portion.

17 . A semiconductor package, comprising:

a first redistribution structure including a first redistribution layer;

a semiconductor chip on the first redistribution structure and electrically connected to the first redistribution layer;

a second redistribution structure on the semiconductor chip and including a second redistribution layer;

a through-via structure between the first redistribution structure and the second redistribution structure and electrically connecting the first redistribution layer to the second redistribution layer;

an organic material layer extending along a side surface of the through-via structure and including a compound having a mercapto group or a phosphate compound; and

an encapsulant in a space between the first redistribution structure and the second redistribution structure and in contact with the organic material layer,

wherein the mercapto group includes at least one of 2-mercapto-5-methoxy benzimidazole, 2-mercapto-1-methylimidazole, 2-mercapto-5-methoxy benzothiazole, or 3-mercaptopropyl(dimethoxy)methylsilane, and

wherein the phosphate compound includes triphenyl phosphate.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 9, 2023
From: KIM, JINGU; KWON, YIEOK; LEE, SANGKYU; JEONG, TAESUNG
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 062928/0309 →
Priority Claims (1)
KR 10-2022-0079465 · Jun 29, 2022 · national
Continuity (1)
Related Publication 20240006342A1 · Jan 4, 2024
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