Semiconductor device including aluminum concentration that varies as an oscillating function and method for manufacturing the same
View Patent ↗A semiconductor device includes a nucleation layer, a buffer layer, a first nitride-based semiconductor layer, a second nitride-based semiconductor layer, S/D electrodes, and a gate electrode. The nucleation layer includes a composition that includes a first element. The buffer layer includes a III-V compound which includes the first element. The buffer layer is disposed on and forms an interface with the nucleation layer. The buffer layer has a concentration of the first element oscillating within the buffer layer, such that the concentration of the first element varies as an oscillating function of a distance within a thickness of the buffer layer. Spacings among adjacent peaks of the oscillating function change from wide to narrow with respect to a first reference point within the buffer layer. The first and second nitride-based semiconductor layer, S/D electrodes, and a gate electrode are disposed on the buffer layer.
1 . A semiconductor device, comprising:
a substrate;
a nucleation layer comprising a composition that comprises a first element and disposed on and forming an interface with the substrate;
a buffer layer comprising a III-V compound which includes the first element, the buffer layer disposed on and forming an interface with the nucleation layer, wherein the buffer layer has a concentration of the first element oscillating within the buffer layer, such that the concentration of the first element varies as an oscillating function of a distance within a thickness of the buffer layer, wherein the oscillating function has a first crest, a second crest, and a third crest in sequence, the second crest is higher than the first crest and is lower than the third crest, and a horizontal distance between the first and second crests is substantial the same as a horizontal distance between the second and third crests;
a first nitride-based semiconductor layer disposed on and forming an interface with the buffer layer;
a second nitride-based semiconductor layer disposed on the first nitride-based semiconductor layer and having a bandgap greater than a bandgap of the first nitride-based semiconductor layer, so as to form a heterojunction therebetween with a two-dimensional electron gas (2DEG) region; and
two or more source/drain (S/D) electrodes and a gate electrode disposed over the second nitride-based semiconductor layer, wherein the gate electrode is between the S/D electrodes,
wherein the buffer layer has a bottom surface in contact with the nucleation layer, and the first crest is closer to the bottom surface of the buffer layer than the second crest.
2 . The semiconductor device of claim 1 , wherein the buffer layer has a bottom surface in contact with the nucleation layer, and the second crest is closer to the bottom surface of the buffer layer than the third crest.
3 . The semiconductor device of claim 1 , wherein the oscillating function has amplitude increasing gradually.
4 . The semiconductor device of claim 1 , wherein the oscillating function has constant wavelength.
5 . The semiconductor device of claim 1 , wherein the oscillating function has a plurality of troughs at same elevation.
6 . The semiconductor device of claim 1 , wherein the first element is aluminum.
7 . The semiconductor device of claim 1 , wherein the oscillating function is a continuous curve.
8 . The semiconductor device of claim 1 , wherein the oscillating function comprises at least one sinusoid curve.
9 . The semiconductor device of claim 1 , wherein the oscillating function comprises a plurality of waves, and a profile of at least one of the waves is symmetrical about its own vertical center line.
10 . The semiconductor device of claim 1 , wherein the buffer layer has a bottom surface in contact with the nucleation layer, and the concentration of the first element of the buffer layer at the bottom surface is less than the concentration of the first element of the buffer layer at the first crest.
11 . The semiconductor device of claim 1 , wherein the buffer layer has a resistivity that is positive correlation with the concentration of the first element.
12 . The semiconductor device of claim 1 , wherein the buffer layer has a resistivity that varies as an oscillating function.
13 . The semiconductor device of claim 1 , wherein the buffer layer comprises AlGaN.
14 . The semiconductor device of claim 1 , wherein the first nitride-based semiconductor layer comprises GaN and the second nitride-based semiconductor layer comprises AlGaN.
15 . A method for manufacturing a semiconductor device, comprising:
forming a nucleation layer comprising a composition that comprises a first element;
forming a buffer layer on the nucleation layer, wherein the buffer layer comprises a III-V compound which includes the first element, wherein the buffer layer has a concentration of the first element oscillating within the buffer layer, such that the concentration of the first element varies as an oscillating function of a distance within a thickness of the buffer layer, wherein the oscillating function has a first crest, a second crest, and a third crest in sequence, the second crest is higher than the first crest and is lower than the third crest, and a horizontal distance between the first and second crests is substantial the same as a horizontal distance between the second and third crests;
forming a first nitride-based semiconductor layer on the buffer layer;
forming a second nitride-based semiconductor layer on the first nitride-based semiconductor layer, wherein the second nitride-based semiconductor layer has a bandgap greater than a bandgap of the first nitride-based semiconductor layer, so as to form a heterojunction therebetween with a two-dimensional electron gas (2DEG) region; and
forming two or more source/drain (S/D) electrodes and a gate electrode over the second nitride-based semiconductor layer,
wherein the buffer layer is formed to have a bottom surface in contact with the nucleation layer, and the first crest is closer to the bottom surface of the buffer layer than the second crest.
16 . The method of claim 15 , wherein the buffer layer is formed to have a bottom surface in contact with the nucleation layer, and the second crest is closer to the bottom surface of the buffer layer than the third crest.
17 . The method of claim 15 , wherein the oscillating function has amplitude which increases gradually.
18 . The method of claim 15 , wherein the oscillating function has constant wavelength.