IP Library Granted Patent US 12,015,114
Granted Patent B2
US 12,015,114 · App. 18/311,834 · Granted Jun 18, 2024

Light emitting diodes with enhanced thermal sinking and associated methods of operation

Inventors: Kevin Tetz (Boise, ID); Charles M. Watkins (Eagle, ID)
Assignee: Micron Technology, Inc.
H01L33/64H01L33/44H01L33/50H01L33/507H01L33/52H01L33/644H01L25/0753H01L33/508H01L33/641H01L2924/0002H01L2933/0041H01L2933/005H01L2933/0075
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Quick Facts
Patent No.
US 12,015,114
App. No.
18/311,834
Granted
Jun 18, 2024
Kind
B2
Abstract

Solid state lighting devices and associated methods of thermal sinking are described below. In one embodiment, a light emitting diode (LED) device includes a heat sink, an LED die thermally coupled to the heat sink, and a phosphor spaced apart from the LED die. The LED device also includes a heat conduction path in direct contact with both the phosphor and the heat sink. The heat conduction path is configured to conduct heat from the phosphor to the heat sink.

Claims (30)

1. A solid state lighting (SSL) device, comprising:

a substrate;

an SSL die carried by the substrate, the SSL die including an emissions area;

a partially transparent layer of thermal insulator material encapsulating and in direct contact with the SSL die;

a monolithic layer of conduction material encapsulating the SSL die, the conduction material in direct contact with the substrate in a region laterally adjacent to the SSL die;

a converter material disposed over the monolithic layer of conduction material and positioned in line with the emissions area of the SSL die such that emissions from the SSL die are configured pass through the converter material.

2. The SSL device of claim 1 wherein the substrate has a thermal conductivity greater than about 1.0 W/(mK).

3. The SSL device of claim 1 wherein the conduction material has a thermal conductivity greater than about 1.0 W/(mK).

4. The SSL device of claim 1 wherein the conduction material is at least partially transparent.

5. The SSL device of claim 1 wherein the substrate includes at least one of silicon (Si), gallium nitride (GaN), aluminum nitride (AlN), copper (Cu), aluminum (Al), tungsten (W), stainless steel (Fe), diamond (C), glass (SiO 2 ), silicon carbide (SiC), and aluminum oxide (Al 2 O 3 ).

6. The SSL device of claim 1 wherein the converter material includes a plurality of conductive materials positioned therein.

7. The SSL device of claim 1 wherein the SSL die includes an N-type gallium nitride (GaN) material, an indium gallium nitride (InGaN) material, and a P-type GaN material on one another in series.

8. The SSL device of claim 1 wherein the converter material includes a phosphor.

9. The SSL device of claim 8 wherein the phosphor includes at least one of cerium(III)-doped yttrium aluminum garnet (“YAG”), neodymium-doped YAG, neodymium-chromium double-doped YAG, erbium-doped YAG, ytterbium-doped YAG, neodymium-cerium double-doped YAG, holmium-chromium-thulium triple-doped YAG, thulium-doped YAG, chromium(IV)-doped YAG, dysprosium-doped YAG, samarium-doped YAG, and terbium-doped YAG, CaS:Eu, CaAlSiN 3 :Eu, Sr 2 Si 5 N 8 :Eu, SrS:Eu, Ba 2 Si 5 N 8 :Eu, Sr 2 SiO 4 :Eu, SrSi 2 N 2 O 2 :Eu, SrGa 2 S 4 :Eu, SrAl 2 O 4 :Eu, Ba 2 SiO 4 :Eu, Sr 4 Al 14 O 25 :Eu, SrSiAl 2 O 3 N:Eu, BaMgAl 10 O 17 :Eu, Sr 2 P 2 O 7 :Eu, BaSO 4 :Eu, and SrB 4 O 7 :Eu.

10. The SSL device of claim 1 wherein the conductive material includes at least one of indium tin oxide (ITO), fluorine-doped tin oxide (FTO), and zinc oxide (ZnO).

11. A solid state lighting (SSL) device, comprising:

a substrate;

an SSL die carried by the substrate, the SSL die including an emissions area;

a monolithic layer of conduction material encapsulating the SSL die, the conduction material in direct contact with the substrate in a region laterally adjacent to the SSL die;

a partially transparent layer of thermal insulator material in direct contact with the SSL die and spacing the SSL die from the layer of conduction material;

a converter material disposed over the monolithic layer of conduction material and positioned in line with the emissions area of the SSL die such that emissions from the SSL die are configured pass through the converter material.

12. The SSL device of claim 11 wherein the substrate has a thermal conductivity greater than about 1.0 W/(mK).

13. The SSL device of claim 11 wherein the conduction material has a thermal conductivity greater than about 1.0 W/(mK).

14. The SSL device of claim 11 wherein the conduction material is at least partially transparent.

15. The SSL device of claim 11 wherein the substrate includes at least one of silicon (Si), gallium nitride (GaN), aluminum nitride (AlN), copper (Cu), aluminum (Al), tungsten (W), stainless steel (Fe), diamond (C), glass (SiO 2 ), silicon carbide (SiC), and aluminum oxide (Al 2 O 3 ).

16. The SSL device of claim 11 wherein the converter material includes a plurality of conductive materials positioned therein.

17. The SSL device of claim 11 wherein the SSL die includes an N-type gallium nitride (GaN) material, an indium gallium nitride (InGaN) material, and a P-type GaN material on one another in series.

18. The SSL device of claim 11 wherein the converter material includes a phosphor.

19. The SSL device of claim 18 wherein the phosphor includes at least one of cerium(III)-doped yttrium aluminum garnet (“YAG”), neodymium-doped YAG, neodymium-chromium double-doped YAG, erbium-doped YAG, ytterbium-doped YAG, neodymium-cerium double-doped YAG, holmium-chromium-thulium triple-doped YAG, thulium-doped YAG, chromium(IV)-doped YAG, dysprosium-doped YAG, samarium-doped YAG, and terbium-doped YAG, CaS:Eu, CaAlSiN 3 :Eu, Sr 2 Si 5 N 8 :Eu, SrS:Eu, Ba 2 Si 5 N 8 :Eu, Sr 2 SiO 4 :Eu, SrSi 2 N 2 O 2 :Eu, SrGa 2 S 4 :Eu, SrAl 2 O 4 :Eu, Ba 2 SiO 4 :Eu, Sr 4 Al 14 O 25 :Eu, SrSiAl 2 O 3 N:Eu, BaMgAl 10 O 17 :Eu, Sr 2 P 2 O 7 :Eu, BaSO 4 :Eu, and SrB 4 O 7 :Eu.

20. The SSL device of claim 11 wherein the conductive material includes at least one of indium tin oxide (ITO), fluorine-doped tin oxide (FTO), and zinc oxide (ZnO).

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 3, 2023
From: TETZ, KEVIN; WATKINS, CHARLES M.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 063524/0807 →
Continuity (7)
Continuation 17588576 · Jan 31, 2022
Continuation 16516214 · Jul 18, 2019
Division 15652632 · Jul 18, 2017
Division 14992787 · Jan 11, 2016
Division 13774502 · Feb 22, 2013
Division 12727943 · Mar 19, 2010
Related Publication 20230275202A1 · Aug 31, 2023