Displacement sensor, and displacement measurement system using displacement sensor
View Patent ↗A displacement sensor includes a first emission particles layer provided to be contactable with a measurement object, and in which first emission particles that emit light at a first wavelength by excitation energy are distributed over at least a one-dimensional extent, a second emission particles layer in which second emission particles that emit light at a second wavelength different from the first wavelength by the excitation energy are distributed over the above one-dimensional extent, and a spacer layer that separates the first emission particles layer and the second emission particles layer in a direction intersecting the above one-dimensional extent, and which includes an excitation energy absorbent that absorbs the excitation energy.
1 . A displacement sensor comprising:
a first emission particles layer provided to be contactable with a measurement object, and in which first emission particles emitting light at a first wavelength by excitation energy are distributed over at least a one-dimensional extent;
a second emission particles layer in which second emission particles emitting light at a second wavelength different from the first wavelength by the excitation energy are distributed over the one-dimensional extent; and
a spacer layer that separates the first emission particles layer and the second emission particles layer in a direction intersecting the one-dimensional extent, wherein the spacer layer includes an excitation energy absorbent that absorbs the excitation energy.
2 . The displacement sensor according to claim 1 , wherein an emission spectrum of one of the first emission particles and the second emission particles overlaps an absorption spectrum of another of the first emission particles and the second emission particles.
3 . The displacement sensor according to claim 1 , wherein at least one of a semiconductor nanoparticle and an organic dye is used as the first emission particles and the second emission particles.
4 . The displacement sensor according to claim 1 , wherein
the second emission particles are away from a contact surface of the displacement sensor farther than the first emission particles are, the contact surface being in contact with the measurement object, and
the second emission particles have a shorter emission peak wavelength than the first emission particles.
5 . A displacement sensor comprising:
a first emission particles layer provided to be contactable with a measurement object and in which first emission particles emitting light at a first wavelength by excitation energy are distributed over at least a one-dimensional extent;
a second emission particles layer in which second emission particles emitting light at a second wavelength different from the first wavelength by the excitation energy are distributed over the one-dimensional extent;
a first spacer layer that separates the first emission particles layer and the second emission particles layer in a direction intersecting the one-dimensional extent, wherein the first spacer layer includes an excitation energy absorbent that absorbs the excitation energy;
a third emission particles layer in which third emission particles emitting light at a third wavelength different from the first wavelength and the second wavelength by the excitation energy are distributed over the one-dimensional extent;
a fourth emission particles layer in which fourth emission particles emitting light at a fourth wavelength different from the first wavelength, the second wavelength, and the third wavelength by the excitation energy are distributed over the one-dimensional extent;
a second spacer layer that separates the third emission particles layer and the fourth emission particles layer in the direction intersecting the one-dimensional extent; and
an energy movement inhibition layer that separates the second emission particles layer and the third emission particles layer in the direction intersecting the one-dimensional extent,
wherein the first emission particles layer, the first spacer layer, the second emission particles layer, the energy movement inhibition layer, the third emission particles layer, the second spacer layer, and the fourth emission particles layer are sequentially laminated.
6 . The displacement sensor according to claim 5 , wherein an emission spectrum of one of the first emission particles and the second emission particles overlaps an absorption spectrum of another of the first emission particles and the second emission particles.
7 . The displacement sensor according to claim 5 , wherein at least one of a semiconductor nanoparticle and an organic dye is used as the first emission particles and the second emission particles.
8 . The displacement sensor according to claim 5 , wherein
the second emission particles are away from a contact surface of the displacement sensor farther than the first emission particles are, the contact surface being in contact with the measurement object, and
the second emission particles have a shorter emission peak wavelength than the first emission particles.
9 . A displacement measurement system using the displacement sensor according to claim 1 .
10 . A pressure measurement system using the displacement sensor according to claim 1 .
11 . A displacement measurement system comprising:
the displacement sensor according to claim 1 ;
an excitation energy source that causes the first emission particles and the second emission particles included in the displacement sensor to emit light; and
a light receiver that receives light emitted from the displacement sensor.