IP Library Patent Application 60264415
Patent Application Provisional
App. No. 60/264,415 · Confirmation No. 8875

Low defect density silicon substantially free of oxidation induced stacking faults

Provisional Application Expired
⬇ PDF
Code Description Pages PDF
2001-01-26 TRNA Transmittal of New Application 2 View
2001-01-26 ADS Application Data Sheet 2 View
2001-01-26 SPEC Specification 116 View
2001-01-26 DRW Drawings-only black and white line drawings 7 View
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Quick Facts
App. No.
60/264,415
Filed
2001-01-26