IP Library Granted Patent US 8,003,496
Granted Patent B2
US 8,003,496 · App. 12/541,334 · Granted Aug 23, 2011

Semiconductor device and method of mounting semiconductor die to heat spreader on temporary carrier and forming polymer layer and conductive layer over the die

Assignee: STATS ChipPAC, Ltd.
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Quick Facts
Patent No.
US 8,003,496
App. No.
12/541,334
Granted
Aug 23, 2011
Kind
B2
Abstract

A semiconductor device is made by forming a heat spreader over a temporary carrier. A semiconductor die is mounted to the heat spreader. A first polymer layer is formed over the semiconductor die and heat spreader. A first conductive layer is formed over the first polymer layer. The first conductive layer is connected to the heat spreader and contact pads on the semiconductor die. A second polymer layer is formed over the first conductive layer. A second conductive layer is formed over the second polymer layer. The second conductive layer is electrically connected to the first conductive layer. Bumps are formed through a solder masking layer on the second conductive layer. The temporary carrier is removed. The heat spreader dissipates heat from the semiconductor die and provides shielding from inter-device interference. The heat spreader is grounded through the first and second conductive layers.

Claims (68)

1. A method of making a semiconductor device, comprising:

providing a temporary carrier;

mounting a heat spreader over the temporary carrier;

mounting a semiconductor die directly to the heat spreader with a thermal interface material (TIM);

forming a first insulating layer over the semiconductor die and heat spreader;

forming a via in the first insulating layer;

forming a first conductive layer over the first insulating layer by depositing a conductive material in the via and over the first insulating layer during the same process step, the first conductive layer directly contacting both the heat spreader and contact pads on the semiconductor die, the heat spreader being continuous between the first conductive layer and the semiconductor die;

forming a second insulating layer over the first conductive layer;

forming a second conductive layer over the second insulating layer that is electrically connected to the first conductive layer; and

removing the temporary carrier.

2. The method of claim 1 , wherein the heat spreader is grounded through the first and second conductive layers.

3. The method of claim 1 , wherein the heat spreader provides shielding with respect to inter-device interference.

4. The method of claim 1 , wherein the first and

5. A method of making a semiconductor device, comprising:

providing a temporary carrier;

forming a heat spreader over the temporary carrier;

mounting a semiconductor die to the heat spreader;

forming a first insulating layer over the semiconductor die and heat spreader;

forming a first conductive layer over the first insulating layer, the first conductive layer being connected to the heat spreader and contact pads on the semiconductor die;

forming a second insulating layer over the first conductive layer;

forming a second conductive layer over the second insulating layer, the second conductive layer being electrically connected to the first conductive layer;

removing the temporary carrier; and

forming a solder masking layer over the second insulating layer with openings over the second conductive layer.

6. The method of claim 5 , further including forming bumps through the solder masking layer on the second conductive layer.

7. A method of making a semiconductor device, comprising:

providing a carrier;

forming a heat spreader over the carrier;

mounting a semiconductor die to the heat spreader;

forming a first insulating layer over the semiconductor die and heat spreader;

forming a via in the first insulating layer;

forming a first conductive layer over the first insulating layer by depositing a conductive material in the via and over the first insulating layer during the same process step, the first conductive layer directly contacting both the heat spreader and contact pads on the semiconductor die, the heat spreader being continuous between the first conductive layer and the semiconductor die; and

removing the carrier.

8. The method of claim 7 , further including:

forming a second insulating layer over the first conductive layer; and

forming a second conductive layer over the second insulating layer that is electrically connected to the first conductive layer.

9. The method of claim 7 , wherein the heat spreader is grounded through the first conductive layer.

10. The method of claim 7 , wherein the heat spreader provides shielding with respect to inter-device interference.

11. The method of claim 7 , further including forming adhesive tape over the carrier prior to forming the heat spreader.

12. The method of claim 7 , wherein the first insulating layer includes a polymer material.

13. A method of making a semiconductor device, comprising:

providing a carrier;

forming a heat spreader over the carrier;

mounting a semiconductor die to the heat spreader;

forming a first insulating layer over the semiconductor die and heat spreader;

forming a first conductive layer over the first insulating layer, the first conductive layer being connected to the heat spreader and contact pads on the semiconductor die;

removing the carrier;

forming a second insulating layer over the first conductive layer;

forming a second conductive layer over the second insulating layer, the second conductive layer being electrically connected to the first conductive layer; and

forming a solder masking layer over the second insulating layer with openings over the second conductive layer.

14. The method of claim 13 , further including forming bumps through the solder masking layer on the second conductive layer.

15. A method of making a semiconductor device, comprising:

providing a heat spreader;

mounting a backside of a semiconductor die to the heat spreader;

forming a first insulating layer over an active side of the semiconductor die and heat spreader;

forming a first conductive layer over the first insulating layer, the first conductive layer being connected to the heat spreader and contact pads on the semiconductor die; and

forming a solder masking layer over the first insulating layer with openings over the first conductive layer.

16. The method of claim 15 , further including forming bumps through the solder masking layer over the first conductive layer.

17. A semiconductor device, comprising:

a heat spreader;

a semiconductor die having a backside mounted to the heat spreader;

a first insulating layer formed over an active side of the semiconductor die and heat spreader; and

a first conductive layer formed over the first insulating layer and connected to the heat spreader and contact pads on the semiconductor die, the heat spreader being continuous between the first conductive layer and the semiconductor die.

18. The semiconductor device of claim 17 , further including:

a second insulating layer formed over the first conductive layer; and

a second conductive layer formed over the second insulating layer and electrically connected to the first conductive layer.

19. The semiconductor device of claim 18 , wherein the heat spreader is grounded through the first and second conductive layers.

20. The semiconductor device of claim 17 , wherein the heat spreader provides shielding with respect to inter-device interference.

21. The semiconductor device of claim 17 , wherein the first insulating layer includes a polymer material.

Assignments (6)
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE'S NAME PREVIOUSLY RECORDED AT REEL: 038378 FRAME: 0301. ASSIGNOR(S) HEREBY CONFIRMS THE CHANGE OF NAME. Recorded Aug 31, 2023
From: STATS CHIPPAC LTD.
To: STATS CHIPPAC PTE. LTD.
Reel/Frame 064913/0352 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 18, 2019
From: STATS CHIPPAC PTE. LTD.
To: JCET SEMICONDUCTOR (SHAOXING) CO., LTD.
Reel/Frame 051365/0680 →
RELEASE OF SECURITY INTEREST Recorded Dec 13, 2019
From: CITICORP INTERNATIONAL LIMITED, AS COMMON SECURITY AGENT
To: STATS CHIPPAC, INC.; STATS CHIPPAC PTE. LTD. FORMERLY KNOWN AS STATS CHIPPAC LTD.
Reel/Frame 051285/0318 →
CHANGE OF NAME Recorded Apr 7, 2016
From: STATS CHIPPAC LTD.
To: STATS CHIPPAC PTE. LTE.
Reel/Frame 038378/0301 →
SECURITY INTEREST Recorded Aug 6, 2015
From: STATS CHIPPAC, INC.; STATS CHIPPAC LTD.
To: CITICORP INTERNATIONAL LIMITED, AS COMMON SECURITY AGENT
Reel/Frame 036288/0748 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 14, 2009
From: OH, JIHOON; LEE, SINJAE; KIM, JINGWAN
To: STATS CHIPPAC, LTD.
Reel/Frame 023101/0150 →
Continuity (1)
Related Publication 20110037165A1 · Feb 17, 2011