IP Library › Granted Patent US 8,338,297
Granted Patent B2
US 8,338,297 · App. 13/466,349 · Granted Dec 25, 2012

Selective metal deposition over dielectric layers

Assignee: Micron Technology, Inc.
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Quick Facts
Patent No.
US 8,338,297
App. No.
13/466,349
Granted
Dec 25, 2012
Kind
B2
Abstract

Selective deposition of metal over dielectric layers in a manner that minimizes of eliminates keyhole formation is provided. According to one embodiment, a dielectric target layer is formed over a substrate layer, wherein the target layer may be configured as allow conformal metal deposition, and a dielectric second layer is formed over the target layer, wherein the second layer may be configured to allow bottom-up metal deposition. An opening may then be formed in the second layer and metal may be selectively deposited over substrate layer.

Claims (15)

1. A method of performing selective electroless plating comprising:

providing a substrate having a first dielectric layer thereover, the first dielectric layer having a non-catalytic surface;

forming a conductive layer directly on a portion of the first dielectric layer;

forming a hydrogen rich target layer over the conductive layer:

forming a second dielectric layer over the target layer;

forming an opening to form a contact on the conductive layer;

performing selective electroless plating of a thin film over the contact.

2. The method of claim 1 wherein the target layer is hydrogen rich dielectric.

3. The method of claim 1 wherein the target layer is chlorine rich dielectric.

4. The method of claim 1 wherein the second dielectric layer is oxide based.

5. The method of claim 1 wherein the second dielectric layer is hydrogen poor relative to the target layer.

6. The method of claim 1 further comprising performing a preclean prior to performing selective electroless plating.

7. The method of claim 1 wherein the thin film comprises one or more members of the group consisting of nickel, thallium, phosphorous, gold, silver, copper, cobalt, palladium, platinum, boron, rhodium, iron, tungsten, binary alloys of these metals and ternary alloys of these metals.

8. The method of claim 1 wherein the thin film comprises a ternary alloy of nickel, thallium and boron.

9. The method of claim 1 wherein the thin film comprises a ternary ally of nickel, phosphorous and copper.

Assignments (7)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050937/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 23, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047243/0001 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Jun 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 043079/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 2, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 038954/0001 →
SECURITY INTEREST Recorded May 12, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038669/0001 →
Continuity (3)
Continuation 13043680 · Mar 9, 2011
Division 11198208 · Aug 5, 2005
Related Publication 20120220126A1 · Aug 30, 2012