IP Library Granted Patent US 8,841,156
Granted Patent B2
US 8,841,156 · App. 13/521,146 · Granted Sep 23, 2014

Method for the production of micro-electromechanical semiconductor component

Inventor: Bernd Burchard (Dortmund, DE)
Assignee: ELMOS Semiconductor AG
B81C1/00158B81B3/0021G01L9/0047B81C1/00626B81B2203/0127B81B2201/0235B81B2201/0264B81B3/0018B81C2201/019B81B3/0081
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Quick Facts
Patent No.
US 8,841,156
App. No.
13/521,146
Granted
Sep 23, 2014
Kind
B2
Abstract

The micro-electromechanical semiconductor component is provided with a first semiconductor substrate, which has an upper face, and a second semiconductor substrate, which has an upper face. Both semiconductor substrates are bonded resting on the upper faces thereof. A cavity is introduced into the upper face of at least one of the two semiconductor substrates. The cavity is defined by lateral walls and opposing top and bottom walls, which are formed by the two semiconductor substrates. The top or the bottom wall acts as a reversibly deformable membrane and an opening extending through the respective semiconductor substrate is arranged in the other of said two walls of the cavity.

Claims (9)

1. A method for producing a micro-electromechanical semiconductor component, comprising the following steps:

providing a first semiconductor substrate having an upper face;

providing a second semiconductor substrate having an upper face;

forming a cavity in the upper face of at least one of the first semiconductor substrate and the second semiconductor substrate;

bonding the first semiconductor substrate and the second semiconductor substrate resting on each other by their upper faces;

forming electrical components, electronic components, or both electrical components and electronic components in at least one of the two semiconductor substrates, on at least one of the two semiconductor substrates, or both in at least one of the two semiconductor substrates and on at least one of the two semiconductor substrates prior to etching said opening entering said cavity; and

etching, into one of the first semiconductor substrate and the second semiconductor substrate, an opening entering the cavity;

wherein the electrical components, the electronic components, or both the electrical components and the electronic components are formed after bonding the two semiconductor substrates and prior to etching the opening entering the cavity.

2. The method according to claim 1 , further comprising forming a region of the other of the first semiconductor substrate and the second semiconductor substrate opposite to the opening entering the cavity, as a reversibly deformable membrane by generating depressions that locally thin a material thickness of the region.

Assignments (4)
MERGER Recorded Jun 17, 2022
From: SILICON MICROSTRUCTURES, INC.
To: MEASUREMENT SPECIALTIES, INC.
Reel/Frame 060237/0556 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 20, 2021
From: ELMOS SEMICONDUCTOR SE
To: SILICON MICROSTRUCTURES, INC.
Reel/Frame 056296/0706 →
CHANGE OF NAME Recorded May 20, 2021
From: ELMOS SEMICONDUCTOR AG
To: ELMOS SEMICONDUCTOR SE
Reel/Frame 056312/0010 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 21, 2012
From: BURCHARD, BERND
To: ELMOS SEMICONDUCTOR AG
Reel/Frame 029337/0362 →
Priority Claims (1)
EP 10150405 · Jan 11, 2010 · regional
Continuity (1)
Related Publication 20130193529A1 · Aug 1, 2013