Method and device for measuring a microelectromechanical semiconductor component

1. A method for measuring a microelectromechanical semiconductor component comprising a reversibly deformable measuring element sensitive to mechanical stresses and is provided with electronic circuit elements as well as terminal pads for tapping measurement signals, wherein in the method

said measuring element of said semiconductor component, for the purpose of determining the distance/force and/or distance/pressure characteristic curve thereof, is increasingly deformed by mechanical action of a plunger which can in particular be advanced step by step,

after an advancing movement or after each step-by-step advancing movement of said plunger by a predetermined distance quantity, the current measurement signals are tapped via said terminal pads, and

said semiconductor component is qualified on the basis of the obtained measurement signals representing the distance/force and/or distance/pressure characteristic curve.

2. The method according to claim 1 , characterized in that a plurality of semiconductor components to be measured are configured on a substrate wafer, and that the measurement is carried out within the framework of a wafer test.

3. The method according to claim 1 , characterized in that the semiconductor component is accommodated in a housing when being tested.

4. The method according to claim 3 , characterized in that the measurement is carried out in a test device for testing the electronic circuit of the semiconductor component.

5. The method according to claim 4 , characterized in that as the plunger a test needle having a rounded point is selected.

6. A device for measuring a microelectromechanical semiconductor component which comprises a reversibly deformable measuring element sensitive to mechanical stresses and is provided with electronic circuit elements as well as terminal pads for tapping measurement signals, said device including

a plurality of electric test needles for electrically contacting said terminal pads of said semiconductor component,

a plunger adapted to be moved forward and backward for mechanically contacting said measuring element, and

an actuator for moving said plunger in particular step by step by a respective predetermined distance quantity to increasingly deform said measuring element.

7. The method according to claim 1 , characterized in that the measurement is carried out in a test device for testing the electronic circuit of the semiconductor component.

8. The method according to claim 7 , characterized in that as the plunger a test needle having a rounded point is selected.

9. The method according to claim 2 , characterized in that the measurement is carried out in a test device for testing the electronic circuit of the semiconductor component.

10. The method according to claim 9 , characterized in that as the plunger a test needle having a rounded point is selected.

11. The method according to claim 1 , characterized in that as the plunger a test needle having a rounded point is selected.

12. The method according to claim 2 , characterized in that as the plunger a test needle having a rounded point is selected.

13. The method according to claim 3 , characterized in that as the plunger a test needle having a rounded point is selected.