Terahertz scanning reflectometer
A terahertz scanning reflectometer is described herein. A high sensitivity terahertz scanning reflectometer is used to measure dynamic surface deformation and delamination characteristics in real-time. A number of crucial parameters can be extracted from the reflectance measurements such as dynamic deformation, propagation velocity, and final relaxation position. A terahertz reflectometer and spectrometer are used to determine the permeation kinetics and concentration profile of active ingredients in stratum corneum.
1. A terahertz scanning reflectometer for diagnosing a disease condition of a sample, comprising:
a continuous wave terahertz system configured to focus terahertz radiation at a surface of the sample; and
a motion controller configured to move a platform holding the sample,
wherein on a condition that the motion controller adjusts a location of a focal point inside the sample, a reflectance measurement is performed across a thickness of the sample using a detector configured to receive sample reflected beam, wherein a spectrum is generated at the focal point and compared against a healthy sample to diagnose the disease condition.
2. The terahertz scanning reflectometer of claim 1 , wherein the spectrum is used to generate a sample image at the focal point.
3. The terahertz scanning reflectometer of claim 1 , wherein the focal point is moved in multiple dimensions to generate at least one of surface or internal sample images.
4. A method for diagnosing a disease condition of a sample using terahertz scanning reflectometer, comprising:
directing a continuous wave terahertz radiation at a surface of the sample;
moving a platform holding the sample;
adjusting a location of a focal point inside the sample; and
making a reflectance measurement across a thickness of the sample using a detector configured to receive a sample reflected beam, wherein a spectrum is generated at the focal point and compared against a healthy sample to diagnose the disease condition.
5. The method of claim 4 , further comprising:
generating a sample image at the focal point using the spectrum.
6. The method of claim 4 , further comprising:
moving the focal point in multiple dimensions to generate at least one of surface or internal sample images.